Patents by Inventor Scott Lesher

Scott Lesher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
    Publication number: 20230266751
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Application
    Filed: May 2, 2023
    Publication date: August 24, 2023
    Inventor: Scott Lesher
  • Method and system for performing quality control on a diagnostic analyzer
    Patent number: 11675341
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Grant
    Filed: August 13, 2020
    Date of Patent: June 13, 2023
    Assignee: SYSMEX CORPORATION
    Inventor: Scott Lesher
  • METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
    Publication number: 20200371507
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Application
    Filed: August 13, 2020
    Publication date: November 26, 2020
    Inventor: Scott Lesher
  • Method and system for performing quality control on a diagnostic analyzer
    Patent number: 10775777
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: September 15, 2020
    Assignee: SYSMEX CORPORATION
    Inventor: Scott Lesher
  • METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
    Publication number: 20190146466
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Application
    Filed: January 15, 2019
    Publication date: May 16, 2019
    Applicant: Sysmex Corporation
    Inventor: Scott Lesher
  • Method and system for performing quality control on a diagnostic analyzer
    Patent number: 10197993
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: February 5, 2019
    Assignee: SYSMEX CORPORATION
    Inventor: Scott Lesher
  • METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
    Publication number: 20170285624
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Application
    Filed: March 31, 2016
    Publication date: October 5, 2017
    Inventor: Scott Lesher