Patents by Inventor Scott Rumbaugh

Scott Rumbaugh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thermal optical chuck
    Patent number: 7176705
    Abstract: An accessible optical path to a lower surface of a heatable device under test is provided by a thermal optical chuck comprising a transparent resistor deposited on transparent plate arranged to supporting the device in a probe station.
    Type: Grant
    Filed: May 6, 2005
    Date of Patent: February 13, 2007
    Assignee: Cascade Microtech, Inc.
    Inventor: Scott Rumbaugh
  • Probe for combined signals
    Publication number: 20060214677
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: May 25, 2006
    Publication date: September 28, 2006
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Patent number: 7075320
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: March 9, 2005
    Date of Patent: July 11, 2006
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Patent number: 7046023
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: August 26, 2004
    Date of Patent: May 16, 2006
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Thermal optical chuck
    Publication number: 20050270056
    Abstract: An accessible optical path to a lower surface of a heatable device under test is provided by a thermal optical chuck comprising a transparent resistor deposited on transparent plate arranged to supporting the device in a probe station.
    Type: Application
    Filed: May 6, 2005
    Publication date: December 8, 2005
    Inventor: Scott Rumbaugh
  • Probe for combined signals
    Publication number: 20050151548
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: March 9, 2005
    Publication date: July 14, 2005
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Publication number: 20050024069
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: August 26, 2004
    Publication date: February 3, 2005
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Patent number: 6806724
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: October 19, 2004
    Assignee: Cascaded Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Publication number: 20040095156
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: November 12, 2003
    Publication date: May 20, 2004
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • PROBE FOR COMBINED SIGNALS
    Publication number: 20040090238
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
    Type: Application
    Filed: November 13, 2002
    Publication date: May 13, 2004
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews
  • Probe for combined signals
    Patent number: 6724205
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: November 13, 2002
    Date of Patent: April 20, 2004
    Assignee: Cascade Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews