Abstract: Portable devices for capturing images of a surface of a building material and associated methods are disclosed. In some embodiments, the portable device includes (i) a housing, (ii) an image sensor positioned in the housing and configured to capture images of the surface at multiple time points when the housing is moved along a trajectory on the surface; (iii) a lighting component configured to illuminate the surface; (iv) an encoder configured to measure a distance travelled by the housing; and (v) a controller communicably coupled to the image sensor and the encoder. The controller instructs the image sensor to capture the images of the surface at least partially based on the measured distance travelled by the housing.

Abstract: What is disclosed is a novel system and method for characterizing a model-based spectral reflectance sensing device. In accordance with the teachings hereof, measurements of training samples taken with a previously manufactured ‘fleet master’ sensing device are adapted, in a manner more fully disclosed herein, based upon knowledge of the wavelengths of the illuminators used for both the subject and fleet master sensors, as well as spectral reflectance response of the training samples as measured by a reference spectrophotometer device. Utilizing the adapted measurements of the fleet master device, a reconstruction matrix can be quickly constructed for the subject sensor. The present system and method provides reasonably good accuracy using pre-existing measurement data. This results in manufacturing cost savings on a per-sensor basis.

Abstract: What is disclosed is a novel system and method for quickly characterizing a reflectance sensing device without measuring the full set of characterization color patch training samples currently used in manufacturing and characterizing individual sensors. In accordance with the teachings hereof, measurements of training samples taken with a previously manufactured ‘fleet master’ sensing device are adapted, in a manner more fully disclosed herein, based upon knowledge of the wavelengths of the illuminators used for both the subject and fleet master sensors, as well as spectral reflectance response of the training samples as measured by a reference spectrophotometer device. Utilizing the adapted measurements of the fleet master device, a reconstruction matrix can be quickly constructed for the subject sensor. The present system and method provides reasonably good accuracy using pre-existing measurement data. This results in manufacturing cost savings on a per-sensor basis.