Patents by Inventor Scott T. Brittain

Scott T. Brittain has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110277930
    Abstract: A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and for irradiating a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
    Type: Application
    Filed: February 18, 2011
    Publication date: November 17, 2011
    Applicant: President and Fellows of Harvard College
    Inventors: Olivier J.A. Schueller, David C. Duffy, John A. Rogers, Scott T. Brittain, George M. Whitesides
  • Patent number: 7919172
    Abstract: A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and for irradiating a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
    Type: Grant
    Filed: April 14, 2004
    Date of Patent: April 5, 2011
    Assignee: President and Fellows of Harvard College
    Inventors: Olivier J. A. Schueller, David C. Duffy, John A. Rogers, Scott T. Brittain, George M. Whitesides
  • Patent number: 6747285
    Abstract: A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and for irradiating a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
    Type: Grant
    Filed: November 1, 2001
    Date of Patent: June 8, 2004
    Assignee: President and Fellows of Harvard College
    Inventors: Olivier J. A. Schueller, David C. Duffy, John A. Rogers, Scott T. Brittain, George M. Whitesides
  • Patent number: 6719868
    Abstract: A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and to irradiate a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
    Type: Grant
    Filed: October 22, 1999
    Date of Patent: April 13, 2004
    Assignee: President and Fellows of Harvard College
    Inventors: Olivier J. A. Schueller, David C. Duffy, John A. Rogers, Scott T. Brittain, George M. Whitesides
  • Publication number: 20030020915
    Abstract: A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and for irradiating a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
    Type: Application
    Filed: November 1, 2001
    Publication date: January 30, 2003
    Inventors: Olivier J. A. Schueller, David C. Duffy, John A. Rogers, Scott T. Brittain, George M. Whitesides