Abstract: A PUF apparatus comprises: a PUF cell array in which a plurality of PUF cells are arranged each including a FeFET pair whose gates are commonly connected to a corresponding word line among a plurality of word lines, and whose drains and sources are connected to a corresponding bit line pair and a corresponding source line pair among a plurality of bit line pairs and a plurality of source line pairs running in a direction crossing the plurality of word lines; and a read-write-back block which is activated according to a read enable signal, and senses and amplifies a voltage difference occurring in a corresponding bit line pair among the plurality of bit line pairs according to the difference in driving strength due to a deviation in a manufacturing process of the FeFET pair in the PUF cell selected by a selected word line among the plurality of word lines.

Abstract: A nonvolatile memory device according to the embodiment includes: a first inverter; and a second inverter cross-coupled to the first inverter, wherein the second inverter includes a pull-up transistor, a pull-down transistor, and a ferroelectric field effect transistor having gate nodes connected to each other, and a restore transistor having one electrode connected to the ferroelectric field effect transistor, and the second inverter stores data in a nonvolatile manner.

Abstract: A flip-flop includes an input logic circuit, a first latch, a second latch, and an output multiplexer; where the input logic circuit outputs a clock bar signal based on an input data bit and a clock signal, where the first latch and the second latch operate based on the input data bit, the clock signal, and a clock bar signal, where the output multiplexer operates based on outputs from nodes of the first and second nodes and outputs an output data bit, and where the input logic circuit has a uniform value in a period where there is no change of a value of the output data bit.

Abstract: A ferroelectric random access memory device comprises: a memory cell array including a plurality of memory cells each having one ferroelectric transistor (FeFET) connected between a read line of a plurality of read lines and a source line of a plurality of source lines and one transistor connected between a bit line of a plurality of bit lines and a gate of the FeFET and having a gate connected to a corresponding word line of a plurality of word lines; and a read/write control unit, when address information for a memory cell to be written is applied with a write command and data, selecting a word line and a read line corresponding to a row address and applying a write voltage having a positive voltage level, and applying a ground voltage to the selected read line, and applying the write voltage to a bit line corresponding to a memory cell.

Abstract: A PUF apparatus comprises: a PUF cell array in which a plurality of PUF cells are arranged each including a FeFET pair whose gates are commonly connected to a corresponding word line among a plurality of word lines, and whose drains and sources are connected to a corresponding bit line pair and a corresponding source line pair among a plurality of bit line pairs and a plurality of source line pairs running in a direction crossing the plurality of word lines; and a read-write-back block which is activated according to a read enable signal, and senses and amplifies a voltage difference occurring in a corresponding bit line pair among the plurality of bit line pairs according to the difference in driving strength due to a deviation in a manufacturing process of the FeFET pair in the PUF cell selected by a selected word line among the plurality of word lines.

Abstract: Exemplary embodiments provide a sensing amplifier based flip-flop applying a nonvolatile memory device which is applicable to a mobile device which has a small hardware area, uses a small control signal, does not include a separate write circuit, has low writing power consumption, a short reading time and small power consumption, and requires a low power operation.

Abstract: A nonvolatile memory device according to the embodiment includes: a first inverter; and a second inverter cross-coupled to the first inverter, wherein the second inverter includes a pull-up transistor, a pull-down transistor, and a ferroelectric field effect transistor having gate nodes connected to each other, and a restore transistor having one electrode connected to the ferroelectric field effect transistor, and the second inverter stores data in a nonvolatile manner.

Abstract: A ferroelectric random access memory device comprises: a memory cell array including a plurality of memory cells each having one ferroelectric transistor (FeFET) connected between a read line of a plurality of read lines and a source line of a plurality of source lines and one transistor connected between a bit line of a plurality of bit lines and a gate of the FeFET and having a gate connected to a corresponding word line of a plurality of word lines; and a read/write control unit, when address information for a memory cell to be written is applied with a write command and data, selecting a word line and a read line corresponding to a row address and applying a write voltage having a positive voltage level, and applying a ground voltage to the selected read line, and applying the write voltage to a bit line corresponding to a memory cell.