Abstract: An optical fiber inspection apparatus including a memory configured to store a pair of images of ends of optical fibers, a display, and a processor coupled to the memory and the display, wherein the processor controls the display to display the pair of images simultaneously.

Abstract: An adapter frame is configured to receive a non-native test instrument module and is further configured for coupling within a test head of automatic semiconductor device test equipment. The adapter frame includes interfaces for operatively connecting the test instrument module to the test head using the existing slots of the test head. Interfaces may include mechanical interfaces, such as liquid cooling interfaces and other suitable interfaces. Additional software and/or hardware components may be included on the adapter frame to integrate the non-native test instrument module into the existing test equipment.

Abstract: An adapter frame is configured to receive a non-native test instrument module and is further configured for coupling within a test head of automatic semiconductor device test equipment. The adapter frame includes interfaces for operatively connecting the test instrument module to the test head using the existing slots of the test head. Interfaces may include mechanical interfaces, such as liquid cooling interfaces and other suitable interfaces. Additional software and/or hardware components may be included on the adapter frame to integrate the non-native test instrument module into the existing test equipment.

Abstract: An apparatus and method for deskewing single-ended signals from different driver circuits of an automatic test system provides enough of a reduction in skew to allow differential signals to cross at or near their 50%-points. In accordance with this technique, first and second driver circuits are respectively coupled to first and second inputs of a measurement circuit through pathways having known and preferably equal propagation delays. The first and second driver circuits each generate an edge that propagates toward the DUT, and reflects back when it reaches a respective unmatched load at the location of the DUT. In response to the edge and its reflection, the first and second inputs of the measurement circuit each see a first voltage step and a second voltage step. The interval between the first and second voltage steps is then measured for each input of the measurement circuit.

Abstract: An apparatus and method for deskewing single-ended signals from different driver circuits of an automatic test system provides enough of a reduction in skew to allow differential signals to cross at or near their 50%-points. In accordance with this technique, first and second driver circuits are respectively coupled to first and second inputs of a measurement circuit through pathways having known and preferably equal propagation delays. The first and second driver circuits each generate an edge that propagates toward the DUT, and reflects back when it reaches a respective unmatched load at the location of the DUT. In response to the edge and its reflection, the first and second inputs of the measurement circuit each see a first voltage step and a second voltage step. The interval between the first and second voltage steps is then measured for each input of the measurement circuit.