Abstract: There is provided a test apparatus that is capable of applying, to a device under test, a current that rises within a short period. A test apparatus for testing a device under test, includes a current source that supplies the device under test with a current, a dummy load that has an electrical characteristic corresponding to an electrical characteristic of the device under test, and a switching section that switches whether the current source is connected to the dummy load or the device under test. Here, after connecting the current source to the dummy load, the switching section disconnects the current source from the dummy load and connects the current source to the device under test when a voltage applied to the dummy load reaches a voltage within a predetermined range.

Abstract: To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path leading from the power supply section to the device under test; a first semiconductor switch that is provided in the path leading from the inductive load section to the device under test and is connected in parallel with the device under test; and a control section that turns the first semiconductor switch ON when supply of the power supply voltage to the device under test is stopped.

Abstract: Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test.

Abstract: There is provided a test apparatus that is capable of applying, to a device under test, a current that rises within a short period. A test apparatus for testing a device under test, includes a current source that supplies the device under test with a current, a dummy load that has an electrical characteristic corresponding to an electrical characteristic of the device under test, and a switching section that switches whether the current source is connected to the dummy load or the device under test. Here, after connecting the current source to the dummy load, the switching section disconnects the current source from the dummy load and connects the current source to the device under test when a voltage applied to the dummy load reaches a voltage within a predetermined range.

Abstract: To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path leading from the power supply section to the device under test; a first semiconductor switch that is provided in the path leading from the inductive load section to the device under test and is connected in parallel with the device under test; and a control section that turns the first semiconductor switch ON when supply of the power supply voltage to the device under test is stopped.

Abstract: Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test.

Abstract: A signal output device that outputs an output signal according to an input signal expressing a logical value that includes a high-voltage side switching circuit between a first terminal and a second terminal in accordance with a first control signal. The device includes a low-voltage side switching circuit between a first and second terminal for outputting a low-voltage side reference voltage in accordance with a second control signal and a control section. The high-voltage and low-voltage side switching circuits include a plurality of switching devices serially connected between the first terminal and the second terminal and each of which is opened in accordance with a provided control voltage. The control circuit opens the plurality of switching devices substantially in synchronization with each other, where a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first terminal and the second terminal.

Abstract: A test apparatus for a device under test (DUT) that includes a signal output device that outputs a signal according to a test signal and a detecting section that detects a signal output from the DUT that outputs a detection result. The signal output device includes an output port, a high-voltage side switching circuit between a first terminal and a second terminal, a low-voltage side switching circuit between a first terminal and a second terminal, and a control section that outputs the first and second control signals. Each of the high-voltage and the low-voltage side switching circuits include a plurality of switching devices serially connected between the first and second terminals. The plurality of switching devices are opened substantially in synchronization with each other, such that a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first and second terminals.

Abstract: A signal output device that outputs an output signal according to an input signal expressing a logical value that includes a high-voltage side switching circuit between a first terminal and a second terminal in accordance with a first control signal. The device includes a low-voltage side switching circuit between a first and second terminal for outputting a low-voltage side reference voltage in accordance with a second control signal and a control section. The high-voltage and low-voltage side switching circuits include a plurality of switching devices serially connected between the first terminal and the second terminal and each of which is opened in accordance with a provided control voltage. The control circuit opens the plurality of switching devices substantially in synchronization with each other, where a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first terminal and the second terminal.

Abstract: A test apparatus for a device under test (DUT) that includes a signal output device that outputs a signal according to a test signal and a detecting section that detects a signal output from the DUT that outputs a detection result. The signal output device includes an output port, a high-voltage side switching circuit between a first terminal and a second terminal, a low-voltage side switching circuit between a first terminal and a second terminal, and a control section that outputs the first and second control signals. Each of the high-voltage and the low-voltage side switching circuits include a plurality of switching devices serially connected between the first and second terminals. The plurality of switching devices are opened substantially in synchronization with each other, such that a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first and second terminals.

Abstract: A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test.

Abstract: A signal whose voltage level fluctuates with respect to a high voltage is measured with favorable accuracy.

Abstract: A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided.

Abstract: There is provided a switching circuit that opens or short-circuits between a first terminal and a second terminal in accordance with a control signal. The switching circuit includes a plurality of switching devices that is serially connected between the first terminal and the second terminal and each of which is opened or short-circuited in accordance with a provided control voltage, and a plurality of control circuits that is provided one-to-one corresponding to the plurality of switching devices, each of which provides a control voltage according to the control signal to the corresponding switching device, and that opens and short-circuits the plurality of switching devices in synchronization with each other.

Abstract: Change in power supply voltage supplied to a device under test is controlled.

Abstract: A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test.

Abstract: A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided.

Abstract: A signal whose voltage level fluctuates with respect to a high voltage is measured with favorable accuracy.

Abstract: Change in power supply voltage supplied to a device under test is controlled.