Patents by Inventor Seisiro Sato

Seisiro Sato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning electron microscope
    Patent number: 4233510
    Abstract: Two marks of variable positions are displayed in superposition on the image of a specimen. The distance between two points on the specimen corresponding respectively to the marks is calculated on the basis of the magnification of the image of the specimen. The distance thus calculated is multiplied by a predetermined coefficient.
    Type: Grant
    Filed: December 5, 1978
    Date of Patent: November 11, 1980
    Assignee: Hitachi, Ltd.
    Inventor: Seisiro Sato