Patents by Inventor Sen Wei
Sen Wei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240155932Abstract: A perovskite solar cell and a method for manufacturing the same are provided. The method includes: sputtering a compact layer onto a light transmitting electrode, in which the compact layer has a thickness ranging from 20 nm to 120 nm, and a material of the compact layer is titanium dioxide; sputtering a roughened layer onto the compact layer, in which the roughened layer has a thickness ranging from 20 nm to 30 nm, and a material of the roughened layer is titanium dioxide; disposing a perovskite layer onto the roughened layer; disposing a hole transporting layer onto the perovskite layer; and disposing a back electrode onto the hole transporting layer.Type: ApplicationFiled: November 1, 2023Publication date: May 9, 2024Inventors: TZU-CHIEN WEI, TZU-SEN SU, HAN-TU LIN, SHIANG LAN
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Publication number: 20240155854Abstract: A composite electrode structure and a method for manufacturing the same are provided. The composite electrode structure is used as a back electrode of a perovskite solar cell. The composite electrode structure includes a first conductive layer and a second conductive layer. The first conductive layer is used to connect with an electron transporting layer or a hole transporting layer. A material of the first conductive layer is a first light transmitting conductive oxide. The second conductive layer is disposed on the first conductive layer. A material of the second conductive layer is a second light transmitting conductive oxide or a conductive metal.Type: ApplicationFiled: November 1, 2023Publication date: May 9, 2024Inventors: TZU-CHIEN WEI, TZU-SEN SU, HAN-TU LIN, SHIANG LAN
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Patent number: 11976643Abstract: A piston limiting structure, including: a cylinder, a piston, and a flange provided with a limiting piece, the cylinder has a piston hole perpendicular to an axial direction of the cylinder and penetrating through the cylinder, and a projection of the piston hole in a penetrating direction is circular. The piston is disposed in the piston hole in a form-fit manner and is slid in the piston hole in a reciprocating manner. A side wall of the piston is provided with a thrust groove, a bottom surface of the thrust groove forms a thrust surface on the side wall of the piston, and the thrust groove does not penetrate through two ends of the side wall of the piston along an axial length of the piston. The limiting piece abuts against the thrust surface.Type: GrantFiled: September 20, 2019Date of Patent: May 7, 2024Assignee: GREE ELECTRIC APPLIANCES, INC. OF ZHUHAIInventors: Jia Xu, Yusheng Hu, Huijun Wei, Sen Yang, Zhongcheng Du, Zhi Li, Liping Ren, Shebing Liang, Rongting Zhang, Zhengliang Shi, Ning Ding, Yibo Liu, Shuang Guo, Liping Liao
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Patent number: 11976554Abstract: The present invention provides a bottom-hole impact-rotation stepping combined unloading rock-breaking efficient drilling system, including a housing, a drive assembly, a universal joint, a transmission shaft, a rotational impact assembly, and a drill bit; the transmission shaft is connected with the housing; the rotational impact assembly includes a rotational transmission assembly for conveying a rotational power to the drill bit and an impact assembly for providing a high frequency axial impact power to the drill bit; when the rotational transmission assembly rotates along with the transmission shaft, the impact assembly applies a high frequency impact force along a drilling axial direction to the rotational transmission assembly; an annular drill bit is disposed at an outer end of a drill bit body of the drill bit; a central drill bit is slidably disposed on an inner ring end surface of the annular drill bit; an inwardly-recessed cylindrical region is formed between a head end of the annular drill bit andType: GrantFiled: April 1, 2021Date of Patent: May 7, 2024Assignee: CHINA UNIVERSITY OF PETROLEUM (EAST CHINA)Inventors: Yongwang Liu, Sen Wei, Zhichuan Guan, Deyong Zou
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Patent number: 11971031Abstract: The present disclosure provides a pump body assembly, a heat exchange apparatus, a fluid machine and an operating method thereof. The pump body assembly includes a piston, a shaft, a piston sheath, and a cylinder. The shaft drives the piston to rotate and reciprocate within the piston sheath while rotating. The piston sheath is located in the cylinder, and a compression chamber is defined between an outer circumferential wall of the piston and an inner wall of the cylinder. A pressure relief recess is defined in the outer circumferential wall of the piston or the inner wall of the cylinder at a position corresponding to the compression chamber.Type: GrantFiled: August 24, 2020Date of Patent: April 30, 2024Assignee: GREE ELECTRIC APPLIANCES, INC. OF ZHUHAIInventors: Mingzhu Dong, Yusheng Hu, Huijun Wei, Jia Xu, Zhongcheng Du, Liping Ren, Sen Yang, Zhi Li, Peilin Zhang, Shebing Liang, Zhengliang Shi, Rongting Zhang, Ning Ding
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Patent number: 11943221Abstract: Aspects of the invention include systems and methods configured to prevent masquerading service attacks. A non-limiting example computer-implemented method includes sending, from a first server in a cloud environment, a communication request comprising an application programming interface (API) key and a first server identifier to an identity and access management (IAM) server of the cloud environment. The API key can be uniquely assigned by the IAM server to a first component of the first server. The first server receives a credential that includes a token for the first component and sends the credential to a second server. The second server sends the credential, a second server identifier, and an identifier for a second component of the second server to the IAM server. The second server receives an acknowledgment from the IAM server and sends the acknowledgment to the first server.Type: GrantFiled: August 25, 2021Date of Patent: March 26, 2024Assignee: International Business Machines CorporationInventors: Sen Wang, Mei Liu, Si Bo Niu, Wen Yi Gao, Zong Xiong Z X Wang, Guoxiang Zhang, Xiao Yi Tian, Xian Wei Zhang
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Publication number: 20240084646Abstract: The present invention provides a bottom-hole impact-rotation stepping combined unloading rock-breaking efficient drilling system, including a housing, a drive assembly, a universal joint, a transmission shaft, a rotational impact assembly, and a drill bit; the transmission shaft is connected with the housing; the rotational impact assembly includes a rotational transmission assembly for conveying a rotational power to the drill bit and an impact assembly for providing a high frequency axial impact power to the drill bit; when the rotational transmission assembly rotates along with the transmission shaft, the impact assembly applies a high frequency impact force along a drilling axial direction to the rotational transmission assembly; an annular drill bit is disposed at an outer end of a drill bit body of the drill bit; a central drill bit is slidably disposed on an inner ring end surface of the annular drill bit; an inwardly-recessed cylindrical region is formed between a head end of the annular drill bit andType: ApplicationFiled: April 1, 2021Publication date: March 14, 2024Inventors: Yongwang LIU, Sen WEI, Zhichuan GUAN, Deyong ZOU
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Patent number: 9696377Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: July 29, 2015Date of Patent: July 4, 2017Assignee: SYNTEST TECHNOLOGIES, INC.Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Patent number: 9638797Abstract: A monitoring device comprising a plurality of emitters and a plurality of receivers is provided. The emitters are capable of being driven to emit waves with directivity. The receivers are correspondingly disposed with respect to the emitters for receiving the waves. The transmitting paths of the waves define a monitoring area. The monitoring device is able to determine the moving trend and the location of the first object in the monitoring area when the specific waves are reflected to and received by the corresponding receivers.Type: GrantFiled: November 3, 2015Date of Patent: May 2, 2017Assignee: SYNCMOLD ENTERPRISE CORP.Inventors: Shih-Fu Chen, Shu-Wei Yang, Ta-Sen Wei, Peng-Ta Liu
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Publication number: 20160291152Abstract: A monitoring device comprising a plurality of emitters and a plurality of receivers is provided. The emitters are capable of being driven to emit waves with directivity. The receivers are correspondingly disposed with respect to the emitters for receiving the waves. The transmitting paths of the waves define a monitoring area. The monitoring device is able to determine the moving trend and the location of the first object in the monitoring area when the specific waves are reflected to and received by the corresponding receivers.Type: ApplicationFiled: November 3, 2015Publication date: October 6, 2016Inventors: Shih-Fu CHEN, Shu-Wei YANG, Ta-Sen WEI, Peng-Ta LIU
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Patent number: 8384533Abstract: A hostless automobile reverse radar warning system installed to an automobile includes a reverse signal light power module for supplying an electric power required by the system, a plurality of distance sensing modules installed to an external periphery of the automobile for performing a distance detection to detect external environment conditions of the automobile, producing a distance detection result, and generating a warning signal based on the distance detection result, and a warning module for receiving the warning signal and producing a sound to alert a driver based on the warning signal.Type: GrantFiled: April 20, 2010Date of Patent: February 26, 2013Assignee: Whetron Electronics Co., Ltd.Inventors: Meng Chien Wang, Sen Wei, Shih-Feng Chiang
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Publication number: 20110254674Abstract: A hostless automobile reverse radar warning system installed to an automobile includes a reverse signal light power module for supplying an electric power required by the system, a plurality of distance sensing modules installed to an external periphery of the automobile for performing a distance detection to detect external environment conditions of the automobile, producing a distance detection result, and generating a warning signal based on the distance detection result, and a warning module for receiving the warning signal and producing a sound to alert a driver based on the warning signal.Type: ApplicationFiled: April 20, 2010Publication date: October 20, 2011Inventors: Meng Chien Wang, Sen Wei, Shih-Feng Chiang
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Patent number: 7721173Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: May 20, 2009Date of Patent: May 18, 2010Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Publication number: 20090235132Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: ApplicationFiled: May 20, 2009Publication date: September 17, 2009Applicant: SYNTEST TECHNOLOGIES, INC.Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Publication number: 20090196979Abstract: An inkjet printing process for a circuit board includes the following procedures. Firstly, a substrate and a conductive layer disposed on the substrate are provided. Afterward, a roughening treatment is performed on the conductive layer so that the roughness of the conductive layer is between 0.1 ?m and 5 ?m. Then, a patterned mask layer is printed on the conductive layer for covering an area of the conductive layer prepared for forming a circuit pattern.Type: ApplicationFiled: September 11, 2008Publication date: August 6, 2009Applicant: SUBTRON TECHNOLOGY CO. LTD.Inventors: Shih-Lian Cheng, Hung-Sen Wei
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Patent number: 7552373Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: January 10, 2003Date of Patent: June 23, 2009Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Patent number: 7191373Abstract: A method and apparatus for inserting design-for-debug (DFD) circuitries in an integrated circuit to debug or diagnose DFT modules, including scan cores, memory BIST (built-in self-test) cores, logic BIST cores, and functional cores. The invention further comprises using a DFD controller for executing a plurality of DFD commands to debug or diagnosis the DFT modules embedded with the DFD circuitries. When used alone or combined together, these DFD commands will detect or locate physical failures in the DFT modules in the integrated circuit on an evaluation board or system using a low-cost DFT debugger. A computer-aided design (CAD) method is further developed to synthesize the DFD controller and DFD circuitries according to the IEEE 1149.1 Boundary-scan Std. The DFD controller supports, but is not limited to, the following DFD commands: RUN_SCAN, RUN_MBIST, RUN_LBIST, DBG_SCAN, DBG_MBIST, DBG_LBIST, DBG_FUNCTION, SELECT, SHIFT, SHIFT_CHAIN, CAPTURE, RESET, BREAK, RUN, STEP, and STOP.Type: GrantFiled: February 27, 2002Date of Patent: March 13, 2007Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng (L.-T.) Wang, Ming-Tung Chang, Shyh-Horng Lin, Hao-Jan Chao, Jaehee Lee, Hsin-Po Wang, Xiaoqing Wen, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Sen-Wei Tsai, Chi-Chan Hsu
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Publication number: 20030154433Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: ApplicationFiled: January 10, 2003Publication date: August 14, 2003Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Publication number: 20020138801Abstract: A method and apparatus for inserting design-for-debug (DFD) circuitries in an integrated circuit to debug or diagnose DFT modules, including scan cores, memory BIST (built-in self-test) cores, logic BIST cores, and functional cores. The invention further comprises using a DFD controller for executing a plurality of DFD commands to debug or diagnosis the DFT modules embedded with the DFD circuitries. When used alone or combined together, these DFD commands will detect or locate physical failures in the DFT modules in the integrated circuit on an evaluation board or system using a low-cost DFT debugger. A computer-aided design (CAD) method is further developed to synthesize the DFD controller and DFD circuitries according to the IEEE 1149.1 Boundary-scan Std. The DFD controller supports, but is not limited to, the following DFD commands: RUN_SCAN, RUN_MBIST, RUN_LBIST, DBG_SCAN, DBG_MBIST, DBG_LBIST, DBG_FUNCTION, SELECT, SHIFT, SHIFT_CHAIN, CAPTURE, RESET, BREAK, RUN, STEP, and STOP.Type: ApplicationFiled: February 27, 2002Publication date: September 26, 2002Inventors: Laung-Terng Wang, Ming-Tung Chang, Shyh-Horng Lin, Hao-Jan Chao, Jaehee Lee, Hsin-Po Wang, Xiaoqing Wen, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Sen-Wei Tsai, Chi-Chan Hsu