Patents by Inventor Seng Kuan Yeow

Seng Kuan Yeow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10374734
    Abstract: Devices and methods to design and use network interfaces compliant with time-synchronization protocols via a multi-tier architecture are provided. This architecture allows for independent development between circuitry related to the time-synchronization protocols and circuitry responsible for channel access, reducing redundancies in the design process.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: August 6, 2019
    Assignee: ALTERA CORPORATION
    Inventors: Sita Rama Chandrasekhar Mallela, Seng Kuan Yeow
  • Patent number: 10346331
    Abstract: One embodiment relates to a data detection and event capture circuit. Data comparator logic receives a monitored data word from a parallel data bus and generates a plurality of pattern detected signals. Any pattern detection logic receives the plurality of pattern detected signals and generates a plurality of any pattern detected signals. Sequence detection logic receives the plurality of pattern detected signals and generates a plurality of sequence detected signals. Another embodiment relates to a method of data detection and event capture. Another embodiment relates to an integrated circuit having a first data detection and event capture circuit in a receiver circuit and a second data detection and event capture circuit in a transmitter circuit. Other embodiments and features are also disclosed.
    Type: Grant
    Filed: June 27, 2016
    Date of Patent: July 9, 2019
    Assignee: Altera Corporation
    Inventors: Si Xing Saw, Seng Kuan Yeow, Kang Syn Ting
  • Publication number: 20170371818
    Abstract: One embodiment relates to a data detection and event capture circuit. Data comparator logic receives a monitored data word from a parallel data bus and generates a plurality of pattern detected signals. Any pattern detection logic receives the plurality of pattern detected signals and generates a plurality of any pattern detected signals. Sequence detection logic receives the plurality of pattern detected signals and generates a plurality of sequence detected signals. Another embodiment relates to a method of data detection and event capture. Another embodiment relates to an integrated circuit having a first data detection and event capture circuit in a receiver circuit and a second data detection and event capture circuit in a transmitter circuit. Other embodiments and features are also disclosed.
    Type: Application
    Filed: June 27, 2016
    Publication date: December 28, 2017
    Applicant: ALTERA CORPORATION
    Inventors: Si Xing SAW, Seng Kuan YEOW, Kang Syn TING
  • Patent number: 9268888
    Abstract: An integrated circuit may include multiple circuit blocks, each with an associated latency value. As an example, transceiver circuitry in an integrated circuit may receive different data packets and circuit blocks in the transceiver circuitry may have different latency values depending on the data packets received. The integrated circuit may further include latency computation circuitry that receives the different latency values from the multiple circuit blocks. The latency computation circuitry may accordingly output a total latency value for the multiple circuit blocks in the integrated circuit based on the received latency values.
    Type: Grant
    Filed: May 7, 2013
    Date of Patent: February 23, 2016
    Assignee: Altera Corporation
    Inventors: Han Hua Leong, Si Xing Saw, Seng Kuan Yeow
  • Patent number: 8407541
    Abstract: Integrated circuits with dynamic pin routing capabilities are provided. An integrated circuit may include circuitry under test and a dynamic signal routing controller. The dynamic signal routing controller may include multiplexers, a test register, and a signal select register. The circuitry under test may be connected to internal test lines that receive static test signals and dynamic test signals. The internal test lines that receive static test signals may be selectively routed to the test register (e.g., test registers store static test signals) while the internal test lines that receive dynamic test signals may be selectively routed to test pins (e.g., dynamic test signals are driven through the test pins). Each multiplexer may have a given input that is connected to the test register and additional inputs that are connected to the test pins. The signal select register stores control bits that configure the routing performed by each multiplexer.
    Type: Grant
    Filed: June 18, 2010
    Date of Patent: March 26, 2013
    Assignee: Altera Corporation
    Inventors: Seong Hong Teh, Seng Kuan Yeow, Shen Shen Lee