Abstract: The present invention relates to a two-phase scanning method and apparatus for obtaining information necessary to analyze physical properties of materials using a scanning probe microscope. The scanning operation of the present invention is divided into two phases. First, in order to obtain information on a surface of a sample, a first scan is provided while the probe moves along the sample surface. Based upon results of the first scan, an imaginary line is defined on an average plane of the sample surface. Then, an imaginary plane, one side of which intersects the imaginary line and makes a predetermined angle with reference to the average plane, is defined over an area of interest on the sample surface. The probe is then positioned at a predetermined height on the imaginary inclined plane, and a second scan is provided during downward movement of the probe along the imaginary inclined plane.

Abstract: Disclosed herein is a fine friction and wear testing apparatus. The fine friction and wear testing apparatus includes a working table to whose upper surface a plate specimen is secured. First drive means horizontally reciprocates the working table. A support arm is situated over the working table and securely holds a roundly tipped specimen to be projected downwardly. First sensing means senses the horizontal displacement of the plate specimen. Second drive means operates the support arm to exert a load on the plate specimen through the roundly tipped specimen. Second sensing means senses the displacement of the roundly tipped specimen. A control unit operates the first and second drive means in accordance with set values and calculates the displacements sensed by the first and second sensing means. A display shows the friction and wear characteristics of the specimens to users in real time.