Patents by Inventor Sergei V. Kalinin
Sergei V. Kalinin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8448502Abstract: Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation).Type: GrantFiled: June 2, 2010Date of Patent: May 28, 2013Assignee: UT Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Publication number: 20120125783Abstract: A method and system for probing mobile ion diffusivity and electrochemical reactivity on a nanometer length scale of a free electrochemically active surface includes a control module that biases the surface of the material. An electrical excitation signal is applied to the material and induces the movement of mobile ions. An SPM probe in contact with the surface of the material detects the displacement of mobile ions at the surface of the material. A detector measures an electromechanical strain response at the surface of the material based on the movement and reactions of the mobile ions. The use of an SPM tip to detect local deformations allows highly reproducible measurements in an ambient environment without visible changes in surface structure. The measurements illustrate effective spatial resolution comparable with defect spacing and well below characteristic grain sizes of the material.Type: ApplicationFiled: November 8, 2011Publication date: May 24, 2012Inventors: Sergei V. Kalinin, Nina Balke, Amit Kumar, Nancy J. Dudney, Stephen Jesse
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Publication number: 20110041223Abstract: An approach for the thermomechanical characterization of phase transitions in polymeric materials (polyethyleneterephthalate) by band excitation acoustic force microscopy is developed. This methodology allows the independent measurement of resonance frequency, Q factor, and oscillation amplitude of a tip-surface contact area as a function of tip temperature, from which the thermal evolution of tip-surface spring constant and mechanical dissipation can be extracted. A heating protocol maintained a constant tip-surface contact area and constant contact force, thereby allowing for reproducible measurements and quantitative extraction of material properties including temperature dependence of indentation-based elastic and loss moduli.Type: ApplicationFiled: August 17, 2010Publication date: February 17, 2011Applicant: UT Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin, Maxim P. Nikiforov
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Publication number: 20110004967Abstract: Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation).Type: ApplicationFiled: June 2, 2010Publication date: January 6, 2011Applicant: UT-Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Patent number: 7775086Abstract: Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation).Type: GrantFiled: September 1, 2006Date of Patent: August 17, 2010Assignee: UT-Battelle, LLCInventors: Stephen Jesse, Sergei V. Kalinin
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Patent number: 7759713Abstract: A tunneling element includes a thin film layer of ferroelectric material and a pair of dissimilar electrically-conductive layers disposed on opposite sides of the ferroelectric layer. Because of the dissimilarity in composition or construction between the electrically-conductive layers, the electron transport behavior of the electrically-conductive layers is polarization dependent when the tunneling element is below the Curie temperature of the layer of ferroelectric material. The element can be used as a basis of compact 1R type non-volatile random access memory (RAM). The advantages include extremely simple architecture, ultimate scalability and fast access times generic for all ferroelectric memories.Type: GrantFiled: March 6, 2006Date of Patent: July 20, 2010Assignee: UT-Battelle, LLCInventors: Sergei V. Kalinin, Hans M. Christen, Arthur P. Baddorf, Vincent Meunier, Ho Nyung Lee
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Publication number: 20100011471Abstract: Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation).Type: ApplicationFiled: September 1, 2006Publication date: January 14, 2010Inventors: Stephen Jesse, Sergei V. Kalinin
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Patent number: 7292768Abstract: A method for switching the direction of polarization in a relatively small domain in a thin-film ferroelectric material whose direction of polarization is oriented normal to the surface of the material involves a step of moving an electrically-chargeable tip into contact with the surface of the ferroelectric material so that the direction of polarization in a region adjacent the tip becomes oriented in a preselected direction relative to the surface of the ferroelectric material. The tip is then pressed against the surface of the ferroelectric material so that the direction of polarization of the ferroelectric material within the area of the ferroelectric material in contact with the tip is reversed under the combined effect of the compressive influence of the tip and electric bias.Type: GrantFiled: April 24, 2006Date of Patent: November 6, 2007Assignee: UT-Battelle, LLCInventors: Sergei V. Kalinin, Arthur P. Baddorf, Ho Nyung Lee, Junsoo Shin, Alexei L. Gruverman, Edgar Karapetian, Mark Kachanov
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Patent number: 7093509Abstract: Scanning probe techniques based on the measurement of impedance spectroscopy using a conductive an SPM tip is provided and applied to the study of local transport properties, especially at a grain boundary. The contributions of the grain boundaries and tip-surface interaction can be distinguished based on the analysis of the equivalent circuit. The technique is applicable for both the spatially resolved study of transport mechanisms of polycrystalline semiconductors and the tip-surface contact quality. A piezoresponse force microscopy technique yields quantitative information about local non-linear dielectric properties and higher order electromechanical coupled of ferroelectrics.Type: GrantFiled: March 18, 2005Date of Patent: August 22, 2006Assignee: The Trustees of the University of PennsylvaniaInventors: Rui Shao, Sergei V. Kalinin, Dawn A. Bonnell
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Patent number: 7078896Abstract: A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.Type: GrantFiled: March 4, 2005Date of Patent: July 18, 2006Assignee: The Trustees Of The University of PennsylvaniaInventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez
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Patent number: 6982174Abstract: A ferroelectric substrate (10) is patterned using local electric fields from an apparatus (14) to produce nanometer sized domains with controlled surface charge (12), that allow site selective metalization (22) and subsequent reaction with functional molecules (18), resulting in nanometer-scale molecular devices.Type: GrantFiled: August 15, 2001Date of Patent: January 3, 2006Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Rodolfo Antonio Alvarez, Sergei V. Kalinin
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Patent number: 6873163Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.Type: GrantFiled: January 18, 2002Date of Patent: March 29, 2005Assignee: The Trustees of the University of PennsylvaniaInventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez
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Patent number: 6720553Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.Type: GrantFiled: January 17, 2003Date of Patent: April 13, 2004Assignee: Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Alan T. Johnson, Sergei V. Kalinin, Marcus Freitag
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Publication number: 20040029297Abstract: A ferroelectric substrate (10) is patterned using local electric fields from an apparatus (14) to produce nanometer sized domains with controlled surface charge (12), that allow site selective metalization (22) and subsequent reaction with functional molecules (18), resulting in nanometer-scale molecular devices.Type: ApplicationFiled: September 3, 2003Publication date: February 12, 2004Inventors: Dawn A. Bonnell, Rodolfo Antonio Alvarez, Sergei V. Kalinin
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Publication number: 20030132376Abstract: The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.Type: ApplicationFiled: January 17, 2003Publication date: July 17, 2003Applicant: The Trustees of the University of PennsylvaniaInventors: Dawn Bonnell, Alan T. Johnson, Sergei V. Kalinin, Marcus Freitag
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Publication number: 20030067308Abstract: A scanning probe detects phase changes of a cantilevered tip proximate to a sample, the oscillations of the cantilevered tip are induced by a lateral bias applied to the sample to quantify the local impedance of the interface normal to the surface of the sample. An ac voltage having a frequency is applied to the sample. The sample is placed at a fixed distance from the cantilevered tip and a phase angle of the cantilevered tip is measured. The position of the cantilevered tip is changed relative to the sample and another phase angle is measured. A phase shift of the deflection of the cantilevered tip is determined based on the phase angles. The impedance of the grain boundary, specifically interface capacitance and resistance, is calculated based on the phase shift and the frequency of the ac voltage. Magnetic properties are measured by applying a dc bias to the tip that cancels electrostatic forces, thereby providing direct measurement of magnetic forces.Type: ApplicationFiled: January 18, 2002Publication date: April 10, 2003Inventors: Dawn A. Bonnell, Sergei V. Kalinin, Rodolfo Antonio Alvarez