Abstract: Disclosed are various embodiments for the planning of resources used in computing. Usage statistics regarding one or more virtual machine instances executing in a networked plurality of computing devices are obtained. The usage statistics are grouped, for example, based on one or more customer usage classifications, thereby producing one or more usage groups. A corresponding demand forecast is generated for each of the usage groups. A projected demand for one or more physical components of the networked computing devices is calculated according to the demand forecasts.

Abstract: Disclosed are various embodiments for the planning of resources used in computing. Usage statistics regarding one or more machine instances executing in a plurality of networked computing devices are obtained. The usage statistics are grouped based at least in part on one or more customer usage classifications, thereby producing one or more usage groups. A corresponding demand forecast is generated for each of the usage groups. A projected demand for one or more physical components of the networked computing devices is calculated according to the demand forecasts.

Abstract: One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.

Abstract: One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which includes nominal parameter values for a first interconnect layer, and parameter-variation values which represent variations in the nominal parameter values due to random process variations. Next, the system receives an interconnect template which describes the geometry of a portion of a second interconnect layer. The system then determines electrical property data for the interconnect template using the interconnect technology data. The electrical property data can include a nominal electrical property value, and sensitivity values which represent the sensitivities of the nominal electrical property value to variations in the nominal parameter values. Next, the system stores the electrical property data and the interconnect technology data in a storage.