Abstract: A photostimulable plate reading device. The device includes: at least one photostimulable plate carrying image data and having two opposite surfaces; an illuminator for homogeneously illuminating a first one of the two opposite surfaces of the at least one photostimulable plate with light emitted in a first wavelength range, the illumination causing the at least one photostimulable plate both to emit light in a second wavelength range by photostimulated luminescence and to scatter light in the first wavelength range; a filter for preventing the light scattered in the first wavelength range from passing and for allowing the light emitted in the second wavelength range to pass, the filter facing a second one of the two opposite surfaces of the at least one photostimulable plate; and a detector composed of a two dimensional array of pixels for detecting the light allowed to pass and for obtaining image data therefrom.

Abstract: A photostimulable plate reading device. The device includes: at least one photostimulable plate carrying image data and having two opposite surfaces; an illuminator for homogeneously illuminating a first one of the two opposite surfaces of the at least one photostimulable plate with light emitted in a first wavelength range, the illumination causing the at least one photostimulable plate both to emit light in a second wavelength range by photostimulated luminescence and to scatter light in the first wavelength range; a filter for preventing the light scattered in the first wavelength range from passing and for allowing the light emitted in the second wavelength range to pass, the filter facing a second one of the two opposite surfaces of the at least one photostimulable plate; and a detector composed of a two dimensional array of pixels for detecting the light allowed to pass and for obtaining image data therefrom.

Abstract: A method for recovering an initial linear state of polarization, of an optical beam after the beam has passed through an optical fiber and whose polarization state was disrupted, attaining power which is directly proportional to the power of the beam before it has passed through the optical fiber. The method comprises: splitting the beam into two beams, a first beam with a first polarization state and a second beam with a second polarization state, the second polarization state being orthogonal to the first polarization state; changing the polarization state of the first beam; and combining the first and second beams in half of their intensities into at least one linearly polarized beam. This way a linearly polarized output beam with power that is directly proportional to the power of the beam prior to its passing through the optical fiber is achieved.

Abstract: A method for recovering an initial linear state of polarization, of an optical beam after the beam has passed through an optical fiber and whose polarization state was disrupted, attaining power which is directly proportional to the power of the beam before it has passed through the optical fiber. The method comprises: splitting the beam into two beams, a first beam with a first polarization state and a second beam with a second polarization state, the second polarization state being orthogonal to the first polarization state; changing the polarization state of the first beam; and combining the first and second beams in half of their intensities into at least one linearly polarized beam. This way a linearly polarized output beam with power that is directly proportional to the power of the beam prior to its passing through the optical fiber is achieved.

Abstract: To overcome limitations of current optical inspection methods of integrated circuit boards, a new method of inspection is provided. A portion of the board being tested is illuminated at an oblique angle with a beam of coherent or collimated light. Furthermore three methods of detecting faults on integrated circuit board are presented, each which increases the utility of optical inspection of integrated circuit boards. The three methods are: 1) the use of diffraction of light to detect certain types of soldering faults: 2) the use of shadows to identify the presence or absence of components on an integrated circuit board: and 3) the direct illumination of components and parts of components. In addition, an innovative device for the illumination of integrated circuit boards is provided.