Patents by Inventor Seung-Bum Han

Seung-Bum Han has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11986248
    Abstract: According to an embodiment of the inventive concept, a method for matching an actual surgical image and a 3D-based virtual surgical simulation environment, which is performed by an apparatus, includes setting POI information during surgery at each of surgery steps in a pre-stored surgical image obtained by performing surgery the same as the actual surgical image, matching the POI information with a virtual pneumoperitoneum model of a patient, which is used for the 3D-based virtual surgical simulation environment, the virtual pneumoperitoneum model being displayed on a UI, recognizing a real-time surgery step of the actual surgical image and determining a location of the POI information for the respective recognized surgery step, and obtaining and displaying image information, which is captured by moving a location of an endoscope inserted into the virtual pneumoperitoneum model to the same location as the determined location of the POI information, through the UI.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: May 21, 2024
    Assignee: HUTOM CO., LTD.
    Inventors: Min Kook Choi, Seung Bum Hong, Nak Jun Sung, Ye Jin Han, Sung Jae Kim
  • Patent number: 11481893
    Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.
    Type: Grant
    Filed: April 9, 2021
    Date of Patent: October 25, 2022
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Bum Han, Filip Lukasz Piekniewski, Dae Sung Koo, Woo Young Lim, Jin Man Kang, Ki Won Park
  • Publication number: 20210295490
    Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.
    Type: Application
    Filed: April 9, 2021
    Publication date: September 23, 2021
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Bum HAN, Filip Lukasz PIEKNIEWSKI, Dae Sung KOO, Woo Young LIM, Jin Man KANG, Ki Won PARK
  • Patent number: 10997714
    Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.
    Type: Grant
    Filed: February 13, 2018
    Date of Patent: May 4, 2021
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Bum Han, Filip Lukasz Piekniewski, Dae Sung Koo, Woo Young Lim, Jin Man Kang, Ki Won Park
  • Publication number: 20190362482
    Abstract: An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.
    Type: Application
    Filed: February 13, 2018
    Publication date: November 28, 2019
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Bum HAN, Filip Lukasz PIEKNIEWSKI, Dae Sung KOO, Woo Young LIM, Jin Man KANG, Ki Won PARK
  • Publication number: 20130039563
    Abstract: A method of generating an inspection program that does not have a gerber file is shown. To generate the inspection program, a first image information is acquired by scanning a bare board, a second image information is acquired by scanning a solder-pasted board that solder is pasted on a pad area of the bare board, and by analyzing the first image information and the second image information an inspection program is generated. The first image information and the second image information may include at least one of a two-dimensional image information and a three-dimensional image information. The step for generating an inspection program calculates a difference between the first image information and the second image information, after extracting a position and a size of an area in which the difference occurs, then generates the inspection program by using the extracted information.
    Type: Application
    Filed: February 1, 2011
    Publication date: February 14, 2013
    Applicant: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung-Bum Han, Hee-Tae Kim