Abstract: A layout-legalizing system modifies a portion of a circuit layout that is selected by a user to generate a modified portion that satisfies a set of technology constraints and a set of design constraints. The system receives as input the set of technology constraints which a semiconductor manufacturing foundry requires the circuit layout to satisfy for manufacturability purposes. The system also receives a set of design constraints from the user which restricts how objects in the portion of the circuit layout can be modified to satisfy the set of technology constraints. The system can further receive a selection input from the user which identifies the portion of the circuit layout which is to be legalized. The system then modifies the identified portion of the circuit layout to obtain a modified portion which satisfies the set of design constraints and at least a subset of the set of technology constraints.

Abstract: A layout-legalizing system modifies a portion of a circuit layout that is selected by a user to generate a modified portion that satisfies a set of technology constraints and a set of design constraints. The system receives as input the set of technology constraints which a semiconductor manufacturing foundry requires the circuit layout to satisfy for manufacturability purposes. The system also receives a set of design constraints from the user which restricts how objects in the portion of the circuit layout can be modified to satisfy the set of technology constraints. The system can further receive a selection input from the user which identifies the portion of the circuit layout which is to be legalized. The system then modifies the identified portion of the circuit layout to obtain a modified portion which satisfies the set of design constraints and at least a subset of the set of technology constraints.

Abstract: One embodiment of the present invention provides a system for estimating parasitic capacitance for an integrated circuit. During operation, the system reads a technology file, which describes the composition of a vertical cross-section of the integrated circuit. Next, the system reads a design file, which specifies the layout of the integrated circuit. The system then identifies a set of dielectric configurations based on information contained in the technology file. It then computes Green's function for each of these configurations. Next, the system estimates a parasitic capacitance using information contained in the design file and using the set of Green's functions.

Abstract: One embodiment of the present invention provides a system that estimates the equivalent capacitances for a set of conductors within an electrical structure. During operation, the system constructs a Gaussian surface that encloses a first conductor, but does not contain any other conductor. The system then computes the equivalent capacitance by constructing a sequence of locations within the electric structure, wherein the first location in the sequence is on the Gaussian surface, and the last location in the sequence is on a second conductor in the set of conductors. Specifically, if a location in the sequence of locations is on the surface of a neighboring conductor that is not in the set of conductors, the system can select the next location in the sequence of locations on a neighboring Gaussian surface that encloses the neighboring conductor, but does not contain any other conductor.