Abstract: An imager captures light reflecting off an object of interest and generates two or more images of the object. A controller identifies one or more non-interpretation regions in one of the captured images and uses the non-interpretation regions to reduce a number of artifacts in a final image.

Abstract: An optical imaging system and method for achieving a large depth of field without decreasing the relative aperture of an imaging lens. The imaging system has a light source for sequentially illuminating an object to be imaged with light of different ones of a plurality of wavelengths, and an imaging lens that has a focal length that varies with the wavelength of the light that illuminates the object. For each wavelength of light by which the object is illuminated, the imaging lens will image a different object plane onto an image receiving unit, and the image receiving unit will capture one well-focused, high resolution image of the object.

Abstract: Bubble stability within an optical switch is enhanced by controlling the expansion or movement of a bubble from a liquid-containing trench into available adjacent spacing. Typically, the adjacent spacing is formed between an optical waveguide substrate and a heater substrate, where the heater substrate includes a microheater for forming the bubble. The bubble enhancement is provided by intentionally altering surface features along at least one of the substrates.

Abstract: An optical switching apparatus and a method of efficiently switching optical signals are disclosed. Optical insertion loss may be reduced in a planar lightwave circuit by determining an optimal spacing between perturbations including using passive perturbations, having a three dimensional refractive index distribution, in an array of waveguides, or by adjusting parameters of existing perturbations e.g. their spacing. The perturbation and each waveguide have different three dimensional refractive index distributions. The perturbation may be positioned anywhere in the array of waveguides. The perturbation may be a trench, a region of refractive index different from that in each waveguide, a broken waveguide core, or a modification of the topography of the array of waveguides. In one embodiment, the perturbation is a periodic or quasiperiodic perturbation.

Abstract: Bubble stability within an optical switch is enhanced by controlling the expansion or movement of a bubble from a liquid-containing trench into available adjacent spacing. Typically, the adjacent spacing is formed between an optical waveguide substrate and a heater substrate, where the heater substrate includes a microheater for forming the bubble. The bubble enhancement is provided by intentionally altering surface features along at least one of the substrates.

Abstract: An optical switching apparatus and a method of efficiently switching optical signals are disclosed. Optical insertion loss may be reduced in a planar lightwave circuit by determining an optimal spacing between perturbations including using passive perturbations, having a three dimensional refractive index distribution, in an array of waveguides, or by adjusting parameters of existing perturbations e.g. their spacing. The perturbation and each waveguide have different three dimensional refractive index distributions. The perturbation may be positioned anywhere in the array of waveguides. The perturbation may be a trench, a region of refractive index different from that in each waveguide, a broken waveguide core, or a modification of the topography of the array of waveguides. In one embodiment, the perturbation is a periodic or quasiperiodic perturbation.

Abstract: An improved optical switch allows for the testing, calibration and monitoring of optical switch points in an optical switching matrix. A test column and a test row of additional switch elements and optical paths enable the improved optical switch to provide testing, calibration and monitoring of each optical switch point in the optical switch matrix using a test input source and a test output receiver. The improved optical switch may also be used to test for the presence of light at any input and to inject a test signal into the matrix in order to test for the presence and quality of light at any output.

Abstract: An apparatus for measuring the thickness of a film on a production line or the like. The apparatus includes a moveable member in contact with the film. The moveable member rotates about a fixed member and includes a transparent region. The apparatus also includes an optical probe attached to the fixed member. The optical probe has an optical fiber for coupling a light signal to the film through the transparent region of the moveable member and for returning light reflected from the film to a receiver for determining the thickness of the film. The optical probe may also include a lens assembly for imaging the light signal onto the film and imaging the reflected light signals back into the optical probe. The optical probe may also include a partially reflecting reference reflector for simplifying the analysis of multi-layer films.

Abstract: An apparatus and method for measuring the thickness of a film having top and bottom surfaces. The apparatus includes low coherence light source that generates a probe light signal. The film is positioned against a roller having a partially reflecting surface that is positioned at a fixed distance from the film. The probe light signal is applied to the film and is then reflected back through the film by the partially reflecting surface. The light leaving the film is collected to form the input to a receiver that determines the time delay between light reflected from the top and bottom surfaces of the film. The receiver output may also be used to determine the thickness of the various layers in a multi-layer film.

Abstract: An apparatus and method for measuring the thickness of a film having top and bottom surfaces. The apparatus includes a first coupler for generating a first probe light signal and a second probe light signal from a low coherence light source. The first probe light signal is directed toward the top surface of the film at a first angle of incidence and the light leaving the top surface of the film is collected. Similarly, the second probe light signal is directed toward the top surface of the film at a second angle of incidence different from said first angle of incidence and the light leaving the top surface of the film is also collected. The collected light is combined to form a collected light signal which is input to a receiver that determines the time delay between light reflected from the top and bottom surfaces of the film.

Abstract: An apparatus and method for measuring the thickness of a film having top and bottom surfaces. The apparatus includes low coherence light source that generates a probe light signal. The film is positioned between first and second reference reflectors, the first reference reflector being partially reflecting. The probe light signal is applied to the film after passing through the first reference reflector. Part of the portion of the probe light signal leaving the film is reflected back toward the first reference reflector by the second reference reflector. The light exiting through the first reference reflector is collected to form the input to a receiver that determines the time delay between light reflected from the top and bottom surfaces of the film as well as the change in optical path length between said first and second reflectors resulting from the introduction of said film between said first and second reflectors.

Abstract: An apparatus and method for measuring the thickness of a film. The film is illuminated with a low coherence light signal that is preferably generated from a source including two or more LEDs. The light reflected from the surfaces of the film is collected and coupled to an interferometer. The slope of the Fourier transform of the output of the signal from the interferometer is measured to provide a determination of the thickness of the film. In the preferred embodiment of the present invention, the interferometer output is sampled at fewer than two points per cycle of the low coherence light signal.