Patents by Inventor Shang-Chi Wu
Shang-Chi Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11996163Abstract: A circuit includes a memory cell column coupled to a bit line pair and a write circuit that alternately biases a first end of the bit lines toward power supply and reference voltage levels in a write operation. Each of first and second switching circuits at second ends of the bit lines includes first and second logic circuits, each including an input terminal coupled to a corresponding bit line, and first and second switching devices, each including a gate coupled to the corresponding logic circuit. The first logic circuit and switching device couple the corresponding bit line to a power supply node simultaneously with the write circuit biasing the corresponding bit line toward the power supply voltage level, and the second logic circuit and switching device couple the corresponding bit line to a reference node simultaneously with the write circuit biasing the corresponding bit line toward the reference voltage level.Type: GrantFiled: January 12, 2023Date of Patent: May 28, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shang-Chi Wu, Yangsyu Lin, Chiting Cheng, Jonathan Tsung-Yung Chang, Mahmut Sinangil
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Patent number: 11982866Abstract: An optical element driving mechanism is provided and includes a fixed assembly, a movable assembly, a driving assembly and a stopping assembly. The fixed assembly has a main axis. The movable assembly is configured to connect an optical element, and the movable assembly is movable relative to the fixed assembly. The driving assembly is configured to drive the movable assembly to move relative to the fixed assembly. The stopping assembly is configured to limit the movement of the movable assembly relative to the fixed assembly within a range of motion.Type: GrantFiled: December 15, 2022Date of Patent: May 14, 2024Assignee: TDK TAIWAN CORP.Inventors: Chao-Chang Hu, Liang-Ting Ho, Chen-Er Hsu, Yi-Liang Chan, Fu-Lai Tseng, Fu-Yuan Wu, Chen-Chi Kuo, Ying-Jen Wang, Wei-Han Hsia, Yi-Hsin Tseng, Wen-Chang Lin, Chun-Chia Liao, Shou-Jen Liu, Chao-Chun Chang, Yi-Chieh Lin, Shang-Yu Hsu, Yu-Huai Liao, Shih-Wei Hung, Sin-Hong Lin, Kun-Shih Lin, Yu-Cheng Lin, Wen-Yen Huang, Wei-Jhe Shen, Chih-Shiang Wu, Sin-Jhong Song, Che-Hsiang Chiu, Sheng-Chang Lin
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Patent number: 11971365Abstract: A wafer processing system and a rework method thereof are provided. An image capture device captures an image of a wafer to generate a captured image. A control device detects a defect pattern in the captured image, calculates a target removal thickness according to distribution of contrast values of the defect pattern, and controls a processing device to perform processing on the wafer according to the target removal thickness.Type: GrantFiled: January 6, 2022Date of Patent: April 30, 2024Assignee: GlobalWafers Co., Ltd.Inventors: Shang-Chi Wang, Cheng-Jui Yang, Miao-Pei Chen, Han-Zong Wu
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Publication number: 20240120018Abstract: A memory device, a failure bits detector, and a failure bits detection method thereof are provided. The failure bits detector includes a current generator, a current mirror, and a comparator. The current generator generates a first current according to a reference code. The current mirror mirrors the first current to generate a second current at a second end of the current mirror. The comparator compares a first voltage at a first input end with a second voltage at a second input end to generate a detection result.Type: ApplicationFiled: October 5, 2022Publication date: April 11, 2024Applicant: MACRONIX International Co., Ltd.Inventors: Chung-Han Wu, Che-Wei Liang, Chih-He Chiang, Shang-Chi Yang
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Patent number: 11942420Abstract: A semiconductor device includes a first gate structure extending along a first lateral direction. The semiconductor device includes a first interconnect structure, disposed above the first gate structure, that extends along a second lateral direction perpendicular to the first lateral direction. The first interconnect structure includes a first portion and a second portion electrically isolated from each other by a first dielectric structure. The semiconductor device includes a second interconnect structure, disposed between the first gate structure and the first interconnect structure, that electrically couples the first gate structure to the first portion of the first interconnect structure. The second interconnect structure includes a recessed portion that is substantially aligned with the first gate structure and the dielectric structure along a vertical direction.Type: GrantFiled: June 8, 2022Date of Patent: March 26, 2024Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Guo-Huei Wu, Hui-Zhong Zhuang, Chih-Liang Chen, Cheng-Chi Chuang, Shang-Wen Chang, Yi-Hsun Chiu
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Patent number: 11937932Abstract: An acute kidney injury predicting system and a method thereof are proposed. A processor reads the data to be tested, the detection data, the machine learning algorithm and the risk probability comparison table from a main memory. The processor trains the detection data according to the machine learning algorithm to generate an acute kidney injury prediction model, and inputs the data to be tested into the acute kidney injury prediction model to generate an acute kidney injury characteristic risk probability and a data sequence table. The data sequence table lists the data to be tested in sequence according to a proportion of each of the data to be tested in the acute kidney injury characteristics. The processor selects one of the medical treatment data from the risk probability comparison table according to the acute kidney injury characteristic risk probability.Type: GrantFiled: July 8, 2022Date of Patent: March 26, 2024Assignees: TAICHUNG VETERANS GENERAL HOSPITAL, TUNGHAI UNIVERSITYInventors: Chieh-Liang Wu, Chun-Te Huang, Cheng-Hsu Chen, Tsai-Jung Wang, Kai-Chih Pai, Chun-Ming Lai, Min-Shian Wang, Ruey-Kai Sheu, Lun-Chi Chen, Yan-Nan Lin, Chien-Lun Liao, Ta-Chun Hung, Chien-Chung Huang, Chia-Tien Hsu, Shang-Feng Tsai
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Publication number: 20240066635Abstract: A laser machining device includes a pulsed laser generator, an accommodation chamber, a bandwidth broadening unit and a pulse compression unit. The pulsed laser generator is configured to emit a pulsed laser. The accommodation chamber has a gas inlet. The bandwidth broadening unit is disposed in the accommodation chamber, and is configured to broaden a frequency bandwidth of the pulsed laser to obtain a broad bandwidth pulsed laser. The pulse compression unit is disposed in the accommodation chamber. The bandwidth broadening unit and the pulse compression unit are arranged in order along a laser propagation path, and the pulse compression unit is configured to compress a pulse duration of the broad bandwidth pulsed laser.Type: ApplicationFiled: October 5, 2022Publication date: February 29, 2024Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Yi-Chi LEE, Bo-Han CHEN, Chih-Hsuan LU, Ping-Han WU, Zih-Yi LI, Shang-Yu HSU
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Publication number: 20230154507Abstract: A circuit includes a memory cell column coupled to a bit line pair and a write circuit that alternately biases a first end of the bit lines toward power supply and reference voltage levels in a write operation. Each of first and second switching circuits at second ends of the bit lines includes first and second logic circuits, each including an input terminal coupled to a corresponding bit line, and first and second switching devices, each including a gate coupled to the corresponding logic circuit. The first logic circuit and switching device couple the corresponding bit line to a power supply node simultaneously with the write circuit biasing the corresponding bit line toward the power supply voltage level, and the second logic circuit and switching device couple the corresponding bit line to a reference node simultaneously with the write circuit biasing the corresponding bit line toward the reference voltage level.Type: ApplicationFiled: January 12, 2023Publication date: May 18, 2023Inventors: Shang-Chi WU, Yangsyu LIN, Chiting CHENG, Jonathan Tsung-Yung CHANG, Mahmut SINANGIL
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Patent number: 11562779Abstract: A memory circuit includes a reference node configured to carry a reference voltage having a reference voltage level, a power supply node configured to carry a power supply voltage having a power supply voltage level, a bit line coupled with a plurality of memory cells, a write circuit configured to charge the bit line by driving a voltage level on the bit line toward the power supply voltage level with a first current, and a switching circuit coupled between the power supply node and the bit line. The switching circuit is configured to receive the voltage level on the bit line, and responsive to a difference between the voltage level received on the bit line and the power supply voltage level being less than or equal to a threshold value, drive the voltage level on the bit line toward the power supply voltage level with a second current.Type: GrantFiled: December 2, 2020Date of Patent: January 24, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shang-Chi Wu, Yangsyu Lin, Chiting Cheng, Jonathan Tsung-Yung Chang, Mahmut Sinangil
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Publication number: 20220328097Abstract: A write assist circuit is provided. The write assist circuit includes a transistor switch coupled between a bit line voltage node of a cell array and a ground node. An invertor is operative to receive a boost signal responsive to a write enable signal. An output of the invertor is coupled to a gate of the transistor switch. The write assist circuit further includes a capacitor having a first end coupled to the bit line voltage node and a second end coupled to the gate node. The capacitor is operative to drive a bit line voltage of the bit line voltage node to a negative value from the ground voltage in response to the boost signal.Type: ApplicationFiled: June 27, 2022Publication date: October 13, 2022Inventors: Wei-jer Hsieh, Chiting Cheng, Yangsyu Lin, Shang-Chi Wu
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Patent number: 11373702Abstract: A write assist circuit is provided. The write assist circuit includes a transistor switch coupled between a bit line voltage node of a cell array and a ground node. An invertor is operative to receive a boost signal responsive to a write enable signal. An output of the invertor is coupled to a gate of the transistor switch. The write assist circuit further includes a capacitor having a first end coupled to the bit line voltage node and a second end coupled to the gate node. The capacitor is operative to drive a bit line voltage of the bit line voltage node to a negative value from the ground voltage in response to the boost signal.Type: GrantFiled: October 24, 2019Date of Patent: June 28, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Wei-Jer Hsieh, Chiting Cheng, Yangsyu Lin, Shang-Chi Wu
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Patent number: 11264066Abstract: The present disclosure describes various exemplary memory storage devices that can be programmed to write electronic data into one or more memory cells in a write mode of operation and/or to read the electronic data from the one or more memory cells in a read mode of operation. The various exemplary memory storage devices can select various control lines to read the electronic data from the one or more memory cells onto data lines and/or to write the electronic data from these data lines into the one or more memory cells. In some situations, these data lines are charged, also referred to as pre-charged, to a first logical value, such as a logical one, before the various exemplary memory storage devices write the electronic data into the one or more memory cells. During this pre-charging of these data lines, the various exemplary memory storage devices electrically isolate these data lines from specialized circuitry within these exemplary memory storage devices.Type: GrantFiled: August 21, 2020Date of Patent: March 1, 2022Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Shang-Chi Wu, Cheng Hung Lee, Chien-Kuo Su, Chiting Cheng, Yu-Hao Hsu, Yangsyu Lin
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Publication number: 20210090621Abstract: A memory circuit includes a reference node configured to carry a reference voltage having a reference voltage level, a power supply node configured to carry a power supply voltage having a power supply voltage level, a bit line coupled with a plurality of memory cells, a write circuit configured to charge the bit line by driving a voltage level on the bit line toward the power supply voltage level with a first current, and a switching circuit coupled between the power supply node and the bit line. The switching circuit is configured to receive the voltage level on the bit line, and responsive to a difference between the voltage level received on the bit line and the power supply voltage level being less than or equal to a threshold value, drive the voltage level on the bit line toward the power supply voltage level with a second current.Type: ApplicationFiled: December 2, 2020Publication date: March 25, 2021Inventors: Shang-Chi WU, Yangsyu LIN, Chiting CHENG, Jonathan Tsung-Yung CHANG, Mahmut SINANGIL
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Patent number: 10872659Abstract: A memory system includes a first array (of memory cells) and a second array (of write assist circuits) arranged into columns each including a bit line and a bit_bar line coupled to corresponding memory cells of the first array and a corresponding at least one write assist circuit of the second array, each write assist circuit including: latch and memory-adapted third and fourth NMOS transistors. The latch includes: memory-adapted first PMOS and first NMOS transistors connected in series between a power-supply voltage and a first node selectively connectable to a ground voltage; and memory-adapted second PMOS transistor and second NMOS transistors connected in series between the power-supply voltage and a second node selectively connectable to ground voltage. The third NMOS transistor is connected in series between the first node and ground voltage; and the fourth NMOS transistor connected in series between the second node and ground voltage.Type: GrantFiled: February 3, 2020Date of Patent: December 22, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Yangsyu Lin, Chiting Cheng, Jonathan Tsung-Yung Chang, Shang-Chi Wu
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Patent number: 10867646Abstract: A circuit includes a voltage node, a plurality of memory cells, a bit line coupled with the plurality of memory cells, and a switching circuit coupled between the voltage node and the bit line. The switching circuit is configured to couple the voltage node with the bit line responsive to a voltage level on the bit line.Type: GrantFiled: March 28, 2018Date of Patent: December 15, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shang-Chi Wu, Chiting Cheng, Jonathan Tsung-Yung Chang, Yangsyu Lin, Mahmut Sinangil
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Publication number: 20200388308Abstract: The present disclosure describes various exemplary memory storage devices that can be programmed to write electronic data into one or more memory cells in a write mode of operation and/or to read the electronic data from the one or more memory cells in a read mode of operation. The various exemplary memory storage devices can select various control lines to read the electronic data from the one or more memory cells onto data lines and/or to write the electronic data from these data lines into the one or more memory cells. In some situations, these data lines are charged, also referred to as pre-charged, to a first logical value, such as a logical one, before the various exemplary memory storage devices write the electronic data into the one or more memory cells. During this pre-charging of these data lines, the various exemplary memory storage devices electrically isolate these data lines from specialized circuitry within these exemplary memory storage devices.Type: ApplicationFiled: August 21, 2020Publication date: December 10, 2020Inventors: Shang-Chi WU, Cheng Hung LEE, Chien-Kuo SU, Chiting CHENG, Yu-Hao HSU, Yangsyu LIN
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Patent number: 10762934Abstract: The present disclosure describes various exemplary memory storage devices that can be programmed to write electronic data into one or more memory cells in a write mode of operation and/or to read the electronic data from the one or more memory cells in a read mode of operation. The various exemplary memory storage devices can select various control lines to read the electronic data from the one or more memory cells onto data lines and/or to write the electronic data from these data lines into the one or more memory cells. In some situations, these data lines are charged, also referred to as pre-charged, to a first logical value, such as a logical one, before the various exemplary memory storage devices write the electronic data into the one or more memory cells. During this pre-charging of these data lines, the various exemplary memory storage devices electrically isolate these data lines from specialized circuitry within these exemplary memory storage devices.Type: GrantFiled: January 31, 2019Date of Patent: September 1, 2020Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Shang-Chi Wu, Cheng Hung Lee, Chien-Kuo Su, Chiting Cheng, Yu-Hao Hsu, Yangsyu Lin
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Publication number: 20200176053Abstract: A memory system includes a first array (of memory cells) and a second array (of write assist circuits) arranged into columns each including a bit line and a bit_bar line coupled to corresponding memory cells of the first array and a corresponding at least one write assist circuit of the second array, each write assist circuit including: latch and memory-adapted third and fourth NMOS transistors. The latch includes: memory-adapted first PMOS and first NMOS transistors connected in series between a power-supply voltage and a first node selectively connectable to a ground voltage; and memory-adapted second PMOS transistor and second NMOS transistors connected in series between the power-supply voltage and a second node selectively connectable to ground voltage. The third NMOS transistor is connected in series between the first node and ground voltage; and the fourth NMOS transistor connected in series between the second node and ground voltage.Type: ApplicationFiled: February 3, 2020Publication date: June 4, 2020Inventors: Yangsyu LIN, Chiting CHENG, Jonathan Tsung-Yung CHANG, Shang-Chi WU
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Publication number: 20200135269Abstract: A write assist circuit is provided. The write assist circuit includes a transistor switch coupled between a bit line voltage node of a cell array and a ground node. An invertor is operative to receive a boost signal responsive to a write enable signal. An output of the invertor is coupled to a gate of the transistor switch. The write assist circuit further includes a capacitor having a first end coupled to the bit line voltage node and a second end coupled to the gate node. The capacitor is operative to drive a bit line voltage of the bit line voltage node to a negative value from the ground voltage in response to the boost signal.Type: ApplicationFiled: October 24, 2019Publication date: April 30, 2020Inventors: Wei-jer Hsieh, Chiting Cheng, Yangsyu Lin, Shang-Chi Wu
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Patent number: 10553275Abstract: A write assist circuit includes: a memory-adapted latch and memory-adapted third and fourth NMOS transistors. The latch includes: a memory-adapted first PMOS transistor and a memory-adapted first NMOS transistor connected in series between a power-supply voltage and a first node, the first node being selectively connectable to a ground voltage; and a memory-adapted second PMOS transistor and a memory-adapted second NMOS transistor connected in series between the power-supply voltage and the second node, the second node being selectively connectable to the ground voltage. The third NMOS transistor is connected in series between the first node and the ground voltage; and the fourth NMOS transistor connected in series between the second node and the ground voltage. A gate electrode of each of the third and fourth transistors is connected to a latch-enable signal-line thereby for controlling the memory-adapted latch.Type: GrantFiled: April 10, 2018Date of Patent: February 4, 2020Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Yangsyu Lin, Chiting Cheng, Jonathan Tsung-Yung Chang, Shang-Chi Wu