Patents by Inventor Shao-Ching Liao
Shao-Ching Liao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11620500Abstract: A synapse system is provided which includes three transistors and a resistance-switching element arranged between two neurons. The resistance-switching element has a resistance value and it is arranged between two neurons. A first transistor is connected between the resistance-switching element and one of the neurons. A second transistor and a third transistor are arranged between the two neurons, and are connected in series which interconnects with the gate of the first transistor. A first input signal is transmitted from one of the neurons to the other neuron through the first transistor. A second input signal is transmitted from one of the neurons to the other neuron through the second transistor and the third transistor. The resistance value of the resistance-switching element is changed based on the time difference between the first input signal and the second input signal.Type: GrantFiled: January 11, 2018Date of Patent: April 4, 2023Assignee: WINBOND ELECTRONICS CORP.Inventors: Frederick Chen, Ping-Kun Wang, Shao-Ching Liao, Chih-Cheng Fu, Ming-Che Lin, Yu-Ting Chen, Seow-Fong (Dennis) Lim
-
Patent number: 11538525Abstract: Provided is a resetting method of a resistive random access memory (RRAM) including the following steps. A first resetting operation and a first verifying operation on the at least one resistive memory cell are performed. Whether to perform a second resetting operation according to a verifying result of the first verifying operation is determined. A second verifying operation is performed after the second resetting operation is determined to be performed and is finished. To determine whether to perform a healing resetting operation according to a verifying result of the second verifying operation, which comprises: performing the healing resetting operation when a verifying current of the second verifying operation is greater than a predetermined current, wherein a resetting voltage of the healing resetting operation is greater than a resetting voltage of the second resetting operation.Type: GrantFiled: October 6, 2021Date of Patent: December 27, 2022Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Patent number: 11520526Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: GrantFiled: June 2, 2021Date of Patent: December 6, 2022Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim
-
Publication number: 20220028454Abstract: Provided is a resetting method of a resistive random access memory (RRAM) including the following steps. A first resetting operation and a first verifying operation on the at least one resistive memory cell are performed. Whether to perform a second resetting operation according to a verifying result of the first verifying operation is determined. A second verifying operation is performed after the second resetting operation is determined to be performed and is finished. To determine whether to perform a healing resetting operation according to a verifying result of the second verifying operation, which comprises: performing the healing resetting operation when a verifying current of the second verifying operation is greater than a predetermined current, wherein a resetting voltage of the healing resetting operation is greater than a resetting voltage of the second resetting operation.Type: ApplicationFiled: October 6, 2021Publication date: January 27, 2022Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Patent number: 11176996Abstract: Provided is a resistive random access memory (RRAM) including at least one memory cell. The at least one memory cell includes a top electrode, a bottom electrode, a data storage layer, an oxygen gettering layer, a first barrier layer, and an oxygen supplying layer. The data storage layer is disposed between the top electrode and the bottom electrode. The oxygen gettering layer is disposed between the data storage layer and the top electrode. The first barrier layer is disposed between the oxygen gettering layer and the data storage layer. The oxygen supplying layer is disposed between the oxygen gettering layer and the top electrode and/or between the oxygen gettering layer and the first barrier layer.Type: GrantFiled: May 13, 2020Date of Patent: November 16, 2021Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Patent number: 11152566Abstract: A resistive random access memory including first and second electrodes, a resistance variable layer, first and second metal layers and a resistance stabilizing layer is provided. The second electrode is disposed on the first electrode. The resistance variable layer is disposed between the first and second electrodes. The first metal layer is disposed between the resistance variable layer and the second electrode. The second metal layer is disposed between the first metal layer and the second electrode. The resistance stabilizing layer is disposed between the first and second metal layers. The oxygen content of the resistance variable layer is higher than that of the first metal layer, the oxygen content of the first metal layer is higher than that of the resistance stabilizing layer, the oxygen content of the resistance stabilizing layer is higher than that of the second metal layer.Type: GrantFiled: December 10, 2019Date of Patent: October 19, 2021Assignee: Winbond Electronics Corp.Inventors: Po-Yen Hsu, Bo-Lun Wu, Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Publication number: 20210286562Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: ApplicationFiled: June 2, 2021Publication date: September 16, 2021Inventors: Ping-Kun WANG, Shao-Ching LIAO, Chien-Min WU, Chia Hua HO, Frederick CHEN, He-Hsuan CHAO, Seow-Fong LIM
-
Patent number: 11055021Abstract: A resistive memory including a storage array, a storage circuit, a control circuit, a voltage generation circuit and an access circuit is provided. The storage array includes a plurality of blocks. Each block includes a plurality of memory cells. The storage circuit stores a plurality of count values. Each of the count values indicates the number of times that a corresponding block performs a write operation. The control circuit generates a control signal according to the count values when an external command is a write command. The voltage generation circuit provides an operation voltage group according to the control signal. The access circuit accesses the storage array according to the operation voltage group.Type: GrantFiled: March 14, 2019Date of Patent: July 6, 2021Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim
-
Publication number: 20210175418Abstract: A resistive random access memory including first and second electrodes, a resistance variable layer, first and second metal layers and a resistance stabilizing layer is provided. The second electrode is disposed on the first electrode. The resistance variable layer is disposed between the first and second electrodes. The first metal layer is disposed between the resistance variable layer and the second electrode. The second metal layer is disposed between the first metal layer and the second electrode. The resistance stabilizing layer is disposed between the first and second metal layers. The oxygen content of the resistance variable layer is higher than that of the first metal layer, the oxygen content of the first metal layer is higher than that of the resistance stabilizing layer, the oxygen content of the resistance stabilizing layer is higher than that of the second metal layer.Type: ApplicationFiled: December 10, 2019Publication date: June 10, 2021Applicant: Winbond Electronics Corp.Inventors: Po-Yen Hsu, Bo-Lun Wu, Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Patent number: 10916307Abstract: A resistive memory apparatus and an operating method thereof are provided. In the method, a set operation having a first enhanced bias is performed on at least one memory cell in a resistive memory array of the resistive memory apparatus, in which the first enhanced bias is larger than a bias used in a normal execution of the set operation. A heat process is performed on the memory cell. A set operation having a second enhanced bias is performed on the memory cell, in which the second enhanced bias is larger than or equal to the first enhanced bias.Type: GrantFiled: December 23, 2019Date of Patent: February 9, 2021Assignee: Winbond Electronics Corp.Inventors: Shao-Ching Liao, Ping-Kun Wang
-
Publication number: 20210012839Abstract: Provided is a resistive random access memory (RRAM) including at least one memory cell. The at least one memory cell includes a top electrode, a bottom electrode, a data storage layer, an oxygen gettering layer, a first barrier layer, and an oxygen supplying layer. The data storage layer is disposed between the top electrode and the bottom electrode. The oxygen gettering layer is disposed between the data storage layer and the top electrode. The first barrier layer is disposed between the oxygen gettering layer and the data storage layer. The oxygen supplying layer is disposed between the oxygen gettering layer and the top electrode and/or between the oxygen gettering layer and the first barrier layer.Type: ApplicationFiled: May 13, 2020Publication date: January 14, 2021Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
-
Patent number: 10839899Abstract: A power on reset method for a resistive memory storage device is provided and includes performing a forming procedure on a memory cell of the resistive memory storage device. The forming procedure includes applying at least one forming voltage and at least one reset voltage to the memory cell. The forming procedure further includes a thermal step. The step of applying at least one reset voltage to the memory cell may be preformed before or after the thermal step. After one forming voltage is applied, if the memory cell passes verification, the next forming voltage is not applied to the memory cell. After the thermal step, if the memory cell passes verification, the next forming voltage is not applied to the memory cell. In addition, after one reset voltage is applied, if the memory cell passes verification, the next reset voltage is not applied to the memory cell.Type: GrantFiled: November 6, 2018Date of Patent: November 17, 2020Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Shao-Ching Liao, Yu-Ting Chen, Ming-Che Lin, Chien-Min Wu, Chia-Hua Ho
-
Publication number: 20200350013Abstract: A resistive memory apparatus and an operating method thereof are provided. In the method, a set operation having a first enhanced bias is performed on at least one memory cell in a resistive memory array of the resistive memory apparatus, in which the first enhanced bias is larger than a bias used in a normal execution of the set operation. A heat process is performed on the memory cell. A set operation having a second enhanced bias is performed on the memory cell, in which the second enhanced bias is larger than or equal to the first enhanced bias.Type: ApplicationFiled: December 23, 2019Publication date: November 5, 2020Applicant: Winbond Electronics Corp.Inventors: Shao-Ching Liao, Ping-Kun Wang
-
Patent number: 10770167Abstract: A memory storage apparatus and a forming method of a resistive memory device thereof are provided. A test forming voltage is applied to a redundant resistive memory device and a corresponding test current is read. A forming voltage applied to a main memory cell block is determined according to the test forming voltage, the test current, a forming current-voltage characteristic data and a target forming current.Type: GrantFiled: February 20, 2019Date of Patent: September 8, 2020Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Chien-Min Wu, He-Hsuan Chao, Chih-Cheng Fu, Shao-Ching Liao
-
Publication number: 20200265914Abstract: A memory storage apparatus and a forming method of a resistive memory device thereof are provided. A test forming voltage is applied to a redundant resistive memory device and a corresponding test current is read. A forming voltage applied to a main memory cell block is determined according to the test forming voltage, the test current, a forming current-voltage characteristic data and a target forming current.Type: ApplicationFiled: February 20, 2019Publication date: August 20, 2020Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Chien-Min Wu, He-Hsuan Chao, Chih-Cheng Fu, Shao-Ching Liao
-
Patent number: 10658036Abstract: A forming method of a resistive memory device is provided. The forming method includes: conducting a forming procedure to apply a forming voltage to the resistive memory device such that the resistive memory device changes from a high resistive state to a low resistive state and measuring a first current of the resistive memory device; performing a thermal step on the resistive memory device and measuring a second current of the resistive memory device; and comparing the second current to the first current and determining to apply a first voltage signal or a second voltage signal to the resistive memory device or to finish the forming procedure according to a comparison result of the first current and the second current. In addition, a memory storage apparatus including a resistive memory device is also provided.Type: GrantFiled: July 26, 2018Date of Patent: May 19, 2020Assignee: Winbond Electronics Corp.Inventors: Shao-Ching Liao, Ping-Kun Wang, Ming-Che Lin, Min-Chih Wei, Chia-Hua Ho, Chien-Min Wu
-
Patent number: 10636486Abstract: A resistive memory including a first storage circuit, a verification circuit, a second storage circuit and a control circuit is provided. The first storage circuit includes various cell groups. Each of the cell groups includes at least one memory cell. The verification circuit is coupled to the first storage circuit to verify whether a specific operation performed on at least one of the memory cells was successful. The second storage circuit includes various flag bits. Each of the flag bits corresponds to a cell group. In a reset period, the control circuit is configured to perform a first reset operation or a second reset operation on a first memory cell of a specific cell group among the cell groups according to a specific flag bit corresponding to the specific cell group.Type: GrantFiled: March 26, 2019Date of Patent: April 28, 2020Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, He-Hsuan Chao, Chen-Lung Huang, Chi-Ching Liu, Chien-Min Wu
-
Patent number: 10593877Abstract: A resistive random access memory is provided. The resistive random access memory includes a bottom electrode over a substrate, a top electrode, a resistance-switching layer, an oxygen exchange layer, and a sidewall protective layer. The top electrode is disposed over the bottom electrode. The resistance-switching layer is disposed between the bottom electrode and the top electrode. The oxygen exchange layer is disposed between the resistance-switching layer and the top electrode. The sidewall protective layer containing metal or semiconductor is disposed at sidewalls of the resistance-switching layer, and the sidewalls of the resistance-switching layer is doped with the metal or semiconductor from the sidewall protective layer.Type: GrantFiled: April 10, 2018Date of Patent: March 17, 2020Assignee: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Shao-Ching Liao, Po-Yen Hsu, Yi-Hsiu Chen, Ting-Ying Shen, Bo-Lun Wu, Meng-Hung Lin, Chia-Hua Ho, Ming-Che Lin
-
Publication number: 20190369920Abstract: A resistive memory including a storage array, a storage circuit, a control circuit, a voltage generation circuit and an access circuit is provided. The storage array includes a plurality of blocks. Each block includes a plurality of memory cells. The storage circuit stores a plurality of count values. Each of the count values indicates the number of times that a corresponding block performs a write operation. The control circuit generates a control signal according to the count values when an external command is a write command. The voltage generation circuit provides an operation voltage group according to the control signal. The access circuit accesses the storage array according to the operation voltage group.Type: ApplicationFiled: March 14, 2019Publication date: December 5, 2019Inventors: Ping-Kun WANG, Shao-Ching LIAO, Chien-Min WU, Chia Hua HO, Frederick CHEN, He-Hsuan CHAO, Seow-Fong LIM
-
Patent number: 10490739Abstract: A method of forming a one-time-programmable resistive random access memory bit includes forming a resistive switching layer on a bottom electrode layer. The method also includes forming a top electrode layer on the resistive switching layer. The method also includes applying a forming voltage to the resistive switching layer, such that the electric potential of the top electrode layer is lower than that of the bottom electrode layer. The method also includes performing a bake process on the resistive switching layer. The vacancies in the resistive switching layer are randomly distributed.Type: GrantFiled: January 10, 2018Date of Patent: November 26, 2019Assignee: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Chih-Cheng Fu, Chien-Min Wu, Shao-Ching Liao