Patents by Inventor Sharad Malik

Sharad Malik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7418369
    Abstract: Disclosed is a complete SAT solver, Chaff, which is one to two orders of magnitude faster than existing SAT solvers. Using the Davis-Putnam (DP) backtrack search strategy, Chaff employs efficient Boolean Constraint Propagation (BCP), termed two literal watching, and a low overhead decision making strategy, termed Variable State Independent Decaying Sum (VSIDS). During BCP, Chaff watches two literals not assigned to zero. The literals can be specifically ordered or randomly selected. VSIDS ranks variables, the highest-ranking literal having the highest counter value, where counter value is incremented by one for each occurrence of a literal in a clause. Periodically, the counters are divided by a constant to favor literals included in recently created conflict clauses. VSIDS can also be used to select watched literals, the literal least likely to be set (i.e., lowest VSIDS rank, or lowest VSIDS rank combined with last decision level) being selected to watch.
    Type: Grant
    Filed: September 9, 2002
    Date of Patent: August 26, 2008
    Assignee: The Trustees of Princeton University
    Inventors: Matthew Moskewicz, Conor Madigan, Sharad Malik
  • Patent number: 6961916
    Abstract: The present invention, generally speaking, provides a placement method for the physical design of integrated circuits in which natural topological feature clusters (topo-clusters) are discovered and exploited during the placement process. Topo-clusters may be formed based on various criteria including, for example, functional similarity, proximity (in terms of number of nets), and genus. Genus refers to a representation of a netlist in terms of a number of planar netlists—netlists in which no crossing of nets occurs. Topo-clusters drive initial placement, with all of the gates of a topo-cluster being placed initially in a single bin of the placement layout or within a group of positionally-related bins. The portion of a topo-cluster placed within a given bin is called a quanto-cluster. An iterative placement refinement process then follows, using a technique referred to herein as Geometrically-Bounded FM (GBFM), and in particular Dual GBFM.
    Type: Grant
    Filed: May 1, 2002
    Date of Patent: November 1, 2005
    Assignee: Synopsys, Inc.
    Inventors: Majid Sarrafzadeh, Lawrence Pileggi, Sharad Malik, Feroze Peshotan Taraporevala, Abhijeet Chakraborty, Gary K. Yeap, Salil R. Raje, Lilly Shieh, Douglas B. Boyle, Dennis Yamamoto
  • Publication number: 20050149301
    Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design, abstracting said test model by retiming and latch removal; and applying validation technique on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model. The validation technique may comprise of model checking, invariant checking or guided simulation using test sequences generated from the abstracted test model.
    Type: Application
    Filed: February 10, 2005
    Publication date: July 7, 2005
    Inventors: Aarti Gupta, Pranav Ashar, Sharad Malik
  • Patent number: 6874135
    Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design. The test model is abstracted by retiming and latch removal. Finally, a validation technique is applied on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model.
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: March 29, 2005
    Assignee: NEC Corporation
    Inventors: Aarti Gupta, Pranav Ashar, Sharad Malik
  • Patent number: 6651234
    Abstract: A method for Boolean Satisfiability (SAT). The method comprises using a variable decision heuristic in a SAT algorithm and pruning the search space of SAT using said decision heuristic. The decision heuristic is based on partitioning a conjunctive normal form (CNF) of a Boolean formula corresponding to the SAT and the partitioning is induced by a separator set. An image computaion method that uses the disclosed method for solving the SAT.
    Type: Grant
    Filed: November 1, 2001
    Date of Patent: November 18, 2003
    Assignee: NEC Corporation
    Inventors: Aarti Gupta, Zijiang Yang, Pranav Ashar, Sharad Malik
  • Publication number: 20030182638
    Abstract: A method for derivation and abstraction of test models for validation of industrial designs using guided simulation is described. The method employs automatic abstractions for the test model which reduce its complexity while preserving the class of errors that can be detected by a transition tour. A method for design validation comprising generating a state-based test model of the design, abstracting said test model by retiming and latch removal; and applying validation technique on the abstracted test model. First, the number of internal (non-peripheral) latches in a design is minimized via retiming using a method of Maximal Peripheral Retiming (MPR). According to the MPR method, internal latches are retimed to the periphery of the circuit. Subsequently, all latches that can be retimed to the periphery are automatically abstracted in the test model. The validation technique may comprise of model checking, invariant checking or guided simulation using test sequences generated from the abstracted test model.
    Type: Application
    Filed: September 24, 1999
    Publication date: September 25, 2003
    Inventors: AARTI GUPTA, PRANAV ASHAR, SHARAD MALIK
  • Publication number: 20030084411
    Abstract: Disclosed is a complete SAT solver, Chaff, which is one to two orders of magnitude faster than existing SAT solvers. Using the Davis-Putnam (DP) backtrack search strategy, Chaff employs efficient Boolean Constraint Propagation (BCP), termed two literal watching, and a low overhead decision making strategy, termed Variable State Independent Decaying Sum (VSIDS). During BCP, Chaff watches two literals not assigned to zero. The literals can be specifically ordered or randomly selected. VSIDS ranks variables, the highest-ranking literal having the highest counter value, where counter value is incremented by one for each occurrence of a literal in a clause. Periodically, the counters are divided by a constant to favor literals included in recently created conflict clauses. VSIDS can also be used to select watched literals, the literal least likely to be set (i.e., lowest VSIDS rank, or lowest VSIDS rank combined with last decision level) being selected to watch.
    Type: Application
    Filed: September 9, 2002
    Publication date: May 1, 2003
    Inventors: Matthew Moskewicz, Conor Madigan, Sharad Malik
  • Publication number: 20020178424
    Abstract: A method for Boolean Satisfiability (SAT). The method comprises using a variable decision heuristic in a SAT algorithm and pruning the search space of SAT using said decision heuristic. The decision heuristic is based on partitioning a conjunctive normal form (CNF) of a Boolean formula corresponding to the SAT and the partitioning is induced by a separator set. An image computaion method that uses the disclosed method for solving the SAT.
    Type: Application
    Filed: November 1, 2001
    Publication date: November 28, 2002
    Applicant: NEC USA, INC.
    Inventors: Aarti Gupta, Zijiang Yang, Pranav Ashar, Sharad Malik
  • Publication number: 20020138816
    Abstract: The present invention, generally speaking, provides a placement method for the physical design of integrated circuits in which natural topological feature clusters (topo-clusters) are discovered and exploited during the placement process. Topo-clusters may be formed based on various criteria including, for example, functional similarity, proximity (in terms of number of nets), and genus. Genus refers to a representation of a netlist in terms of a number of planar netlists—netlists in which no crossing of nets occurs. Topo-clusters drive initial placement, with all of the gates of a topo-cluster being placed initially in a single bin of the placement layout or within a group of positionally-related bins. The portion of a topo-cluster placed within a given bin is called a quanto-cluster. An iterative placement refinement process then follows, using a technique referred to herein as Geometrically-Bounded FM (GBFM), and in particular Dual GBFM.
    Type: Application
    Filed: May 1, 2002
    Publication date: September 26, 2002
    Inventors: Majid Sarrafzadeh, Lawrence Pileggi, Sharad Malik, Feroze Peshotan Taraporevala, Abhijeet Chakraborty, Gary K. Yeap, Salil R. Raje, Lilly Shieh, Douglas B. Boyle, Dennis Yamamoto
  • Patent number: 6449756
    Abstract: A timing graph representing timing information of an integrated circuit design may change after modifications are made to the integrated circuit design. The modifications change timing parameters for edges in the timing graph. The measure of these changes may be computed at a computed measure compared to a threshold. In the event the measure exceeds the threshold, the edges in the timing graph that need to change in response to the modifications are updated. Otherwise, the current edges in the timing graph are continued to be used. The threshold is set in accordance with the accuracy and efficiency requirements of an electronic design automation tool.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: September 10, 2002
    Assignee: Monterey Design Systems
    Inventors: Sharad Malik, Lawrence Pileggi, Eric McCaughrin, Abhijeet Chakraborty, Douglas B. Boyle
  • Patent number: 6442743
    Abstract: The disclosure describes a placement method for the physical design of integrated circuits in which natural topological feature clusters are discovered and exploited during the placement process is disclosed. Topo-clusters drive initial placement, with all of the gates of a topo-cluster being placed initially in a single bin of the placement layout or within a group of positionally-related bins. An iterative placement refinement process is done using a technique referred to as Dual Geometrically-Bounded FM (GBFM). GBFM is applied on a local basis to windows encompassing a number of bins. From iteration to iteration, windows may shift position and vary in size. When a region bounded by a window meets a specified cost threshold in terms of a specified cost function, that region stops participating. Following the foregoing global placement process the circuit is then ready for detailed placement in which cells are assigned to placement rows.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: August 27, 2002
    Assignee: Monterey Design Systems
    Inventors: Majid Sarrafzadeh, Lawrence Pileggi, Sharad Malik, Feroze Peshotan Taraporevala, Abhijeet Chakraborty, Gary K. Yeap, Salil R. Raje, Lilly Shieh, Douglas B. Boyle, Dennis Yamamoto
  • Patent number: 6367051
    Abstract: A design tool for integrated circuits includes a placement tool which concurrently places logic gates and interconnect. In one embodiment, the logic gates are placed into bins and virtual buffers are inserted between logic gates mapped to different bins. Placement and interconnect wire lengths and densities are successively improved leading to removal of some buffers and actualization of the virtual buffers.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: April 2, 2002
    Assignee: Monterey Design Systems, Inc.
    Inventors: Lawrence Pileggi, Sharad Malik, Emre Tuncer, Abhijeet Chakraborty, Satyamurthy Pullela, Altan Odabasioglu, Douglas B. Boyle
  • Patent number: 6286128
    Abstract: A method for design optimization using logical and physical information is provided. In one embodiment, a method for design optimization using logical and physical information, includes receiving a behavioral description of an integrated circuit or a portion of an integrated circuit, optimizing placement of circuit elements in accordance with a first cost function, and optimizing logic of the circuit elements in accordance with a second cost function, in which the optimizing placement of the circuit elements and the optimizing logic of the circuit elements are performed concurrently. The method can further include optimizing routing in accordance with a third cost function, in which the optimizing routing, the optimizing placement of the circuit elements, and the optimizing logic of the circuit elements are performed concurrently.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: September 4, 2001
    Assignee: Monterey Design Systems, Inc.
    Inventors: Lawrence Pileggi, Majid Sarrafzadeh, Sharad Malik, Abhijeet Chakraborty, Archie Li, Robert Eugene Shortt, Christopher Dunn, David Gluss, Dennis Yamamoto, Dinesh Gaitonde, Douglas B. Boyle, Emre Tuncer, Eric McCaughrin, Feroze Peshotan Taraporevala, Gary K. Yeap, James S. Koford, Joseph T. Rahmeh, Lilly Shieh, Salil R. Raje, Sam Jung Kim, Satamurthy Pullela, Yau-Tsun Steven Li, Tong Gao
  • Patent number: 6247164
    Abstract: Disclosed is a configurable hardware system and method for implementing instance-specific (per-formula) SAT-solver circuits. A template design is provided for producing these circuits on a per-formula basis. The typical hardware requirements for implementing the invention makes the design amenable to current or next-generation FPGA implementation. Hardware simulations indicate that for many difficult SAT problems, the system according to the invention can offer one to three orders of magnitude speedup over prior art software implementations.
    Type: Grant
    Filed: August 28, 1997
    Date of Patent: June 12, 2001
    Assignees: NEC USA, Inc., Princeton University
    Inventors: Pranav Ashar, Sharad Malik, Margaret Martonosi, Peixin Zhong
  • Patent number: 6192508
    Abstract: This invention recognizes the ability of logic optimization to help placement relieve congestion. Different types of logic optimizations are used to help placement relieve congestion. In one type of optimization, the speed of parts of the circuit is improved by selecting faster cells. In another type of optimization, the topology of the circuit is changed such that placement can now move cells, which could not have been moved before, to reduce congestion and thus enable routing. A distinguishing feature of this methodology is that it not only uses the placement information for interconnection delay/area estimates during logic optimization, but also uses logic optimization to aid the physical placement steps by providing support to placement so that the congestion of the circuit is improved. The aim is to avoid getting into a situation where the placed circuit cannot be routed.
    Type: Grant
    Filed: June 12, 1998
    Date of Patent: February 20, 2001
    Assignee: Monterey Design Systems
    Inventors: Sharad Malik, Lawrence Pileggi, Abhijeet Chakraborty, Gary K. Yeap, Douglas B. Boyle
  • Patent number: 6038392
    Abstract: A Boolean SAT solver uses reconfigurable hardware to solve a specific input problem. Each of the plurality of ordered variables has a corresponding one of a plurality of state machines. Each state machine has an implication circuit for its respective variable, and operates in parallel according to an identical state machine. One state machine implements the Davis-Putnam method in hardware and provides improved performance over software by virtue of the parallel checking of direct and transitive implications. Another state machine implements a novel non-chronological backtracking method that takes advantage of the parallel implication checking and avoids the need to maintain or to traverse a GRASP type implication graph in the event of backtracking. The novel non-chronological backtracking provides for setting a blocking variable as a leaf variable and for changing only the value of the leaf variable, but possibly changing both the value and identity of a backtracking variable.
    Type: Grant
    Filed: May 27, 1998
    Date of Patent: March 14, 2000
    Assignee: NEC USA, Inc.
    Inventors: Pranav Ashar, Sharad Malik, Margaret Martonosi, Peixin Zhong
  • Patent number: 6035109
    Abstract: The Complete-1-Distinguishability (C-1-D) property is used for simplifying FSM verification. This property eliminates the need for a traversal of the product machine for the implementation machine and the specification machine. Instead, a much simpler check suffices. This check consists of first obtaining a 1-equivalence mapping between the states of the two machines, and then checking that it is a bisimulation relation. The C-1-D property can be used directly on specifications for which it naturally holds. This property can be enforced on arbitrary FSMs by exposing some of the latch outputs as pseudo-primary outputs during synthesis and verification. In this sense, the synthesis/verification methodology provides another point in the tradeoff curve between constraints-on-synthesis versus complexity-of-verification.
    Type: Grant
    Filed: April 22, 1997
    Date of Patent: March 7, 2000
    Assignee: NEC USA, Inc.
    Inventors: Pranav N Ashar, Aarti Gupta, Sharad Malik
  • Patent number: 5937183
    Abstract: In compiled code simulation, a circuit to be simulated is converted or compiled into an executable so that running the executable produces the same output response as the circuit itself. In a binary decision diagram (BDD)-based compiled code simulator, the simulation executable for the circuit is derived from a BDD-based characteristic function representation of the circuit rather than by the heretofore used translation of Boolean operations in the original circuit into machine instructions.
    Type: Grant
    Filed: November 5, 1996
    Date of Patent: August 10, 1999
    Assignee: NEC USA, Inc.
    Inventors: Pranav N. Ashar, Sharad Malik
  • Patent number: 5841673
    Abstract: A delay network of logic circuit delay data composed of a first set of vertices containing first to fourth vertices, and a first set of weighted directional edges containing a first directional edge extending from the first vertex to the fourth vertex, a second directional edge extending from the second vertex to the third vertex, a third directional edge extending from the first vertex to the third vertex, and a fourth directional edge extending from the second vertex to the fourth vertex, is converted into a delay network composed of a second set of vertices containing the first to fourth vertices and an added fifth vertex, and a second set of weighted directional edges containing a fifth directional edge extending from the first vertex to the fifth vertex, a sixth directional edge extending from the second vertex to the fifth vertex, a seventh directional edge extending from the fifth vertex to the third vertex, and an eighth directional edge extending from the fifth vertex to the fourth vertex.
    Type: Grant
    Filed: January 30, 1996
    Date of Patent: November 24, 1998
    Assignee: NEC Corporation
    Inventors: Noriya Kobayashi, Sharad Malik
  • Patent number: 5522063
    Abstract: In partial scan testing of integrated circuits, for an arbitrary graph of an integrated circuit, a Boolean function is derived whose satisfying assignments directly correspond to feedback vertex sets of the graph. The Boolean function is then used for determining the minimum cost feedback vertex set. Boolean function representation using Binary Decision Diagrams (BDI)) in logic synthesis is used to solve the problem of representing the Boolean function efficiently, even for large graphs. The determined minimum cost feedback vertex set is used to select those memory elements in the integrated circuit comprising the scan chain.
    Type: Grant
    Filed: September 27, 1993
    Date of Patent: May 28, 1996
    Assignee: NEC USA, Inc.
    Inventors: Pranav N. Ashar, Sharad Malik