Abstract: A read path for a memory is provided that includes an integrated sense mixing and redundancy shift stage coupled between a sense amplifier and a data latch. The data latch is integrated with a level shifter.

Abstract: A memory is provided that includes a current mirror that controls the amount of current conducted by a head-switch transistor for a memory power supply rail during a core-power-lowering write assist period.

Abstract: A memory is provided with a logic gate that processes a first version and a second version of a memory clock signal to assert a clock signal for the clocking of latches in a second array of columns for the memory. The first version clocks the latches in a first array of columns for the memory. But the second version does not clock any latches in the first array of columns.

Abstract: A read path for a memory is provided that includes an integrated sense mixing and redundancy shift stage coupled between a sense amplifier and a data latch. The data latch is integrated with a level shifter.

Abstract: A memory is provided that includes a current mirror that controls the amount of current conducted by a head-switch transistor for a memory power supply rail during a core-power-lowering write assist period.

Abstract: A memory is provided with a plurality of cores that power up according to a power-up order from a first core to a final core. As the core power supply voltage for a current core powers up according to the power-up order, it triggers the power-up of a succeeding core in the power-up order responsive to the core power supply voltage exceeding the threshold voltage of a control transistor in the succeeding core.

Abstract: A read path for a memory is provided that includes an integrated sense mixing and redundancy shift stage coupled between a sense amplifier and a data latch. The data latch is integrated with a level shifter.

Abstract: A read path for a memory is provided that includes an integrated sense mixing and redundancy shift stage coupled between a sense amplifier and a data latch. The data latch is integrated with a level shifter.

Abstract: A memory is provided with a plurality of cores that power up according to a power-up order from a first core to a final core. As the core power supply voltage for a current core powers up according to the power-up order, it triggers the power-up of a succeeding core in the power-up order responsive to the core power supply voltage exceeding the threshold voltage of a control transistor in the succeeding core.

Abstract: A memory is provided that includes a current mirror that controls the amount of current conducted by a head-switch transistor for a memory power supply rail during a core-power-lowering write assist period.

Abstract: A memory is provided that includes a negative bit line boost circuit for boosting a discharged bit line to a negative voltage during a negative bit line boost period for a write operation to a selected column in the memory. The memory also includes a core voltage control circuit configured to float a core power supply voltage for the selected column during the negative bit line boost period.

Abstract: A memory is provided with a logic gate that processes a first version and a second version of a memory clock signal to assert a clock signal for the clocking of latches in a second array of columns for the memory. The first version clocks the latches in a first array of columns for the memory. But the second version does not clock any latches in the first array of columns.

Abstract: A memory is provided that includes a current mirror that controls the amount of current conducted by a head-switch transistor for a memory power supply rail during a core-power-lowering write assist period.

Abstract: Certain aspects of the present disclosure provide methods and apparatus for generating a negative boost voltage for memory write operations. One example memory circuit generally includes at least one memory bank, a write circuit coupled to the at least one memory bank, and a boost generation circuit coupled to the write circuit. The boost generation circuit generally includes a first node coupled to a reference potential node of the write circuit; a second node; a first capacitive element having a first terminal coupled to the first node of the boost generation circuit; a first switch configured to selectively couple the first node to a reference potential node for the memory circuit; and a second switch configured to selectively couple a second terminal of the first capacitive element to the second node of the boost generation circuit.

Abstract: Certain aspects of the present disclosure provide methods and apparatus for generating a negative boost voltage for memory write operations. One example memory circuit generally includes at least one memory bank, a write circuit coupled to the at least one memory bank, and a boost generation circuit coupled to the write circuit. The boost generation circuit generally includes a first node coupled to a reference potential node of the write circuit; a second node; a first capacitive element having a first terminal coupled to the first node of the boost generation circuit; a first switch configured to selectively couple the first node to a reference potential node for the memory circuit; and a second switch configured to selectively couple a second terminal of the first capacitive element to the second node of the boost generation circuit.

Abstract: Systems, methods, and apparatus for writing data into a static random access memory (SRAM) are provided. A write driver circuit includes a bitcell array, a bitline coupled to the bitcell array, and a first driving circuit configured to drive the bitline via a write driver node for writing data into a bitcell for a write operation. The write driver circuit also includes a pre-charging circuit configured to control or to operate with the write driver circuit to drive the write driver node to a high voltage level or a low voltage level for the write operation, and pre-charge the write driver node to the high voltage level, and float the write driver node for a bit-masking operation.