Abstract: An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.

Abstract: An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.

Abstract: An I/O driver includes a pull-down module and pull-up module. The pull-down module has one or more NMOS transistors serially coupled between ground and an output node. The pull-up module has one or more PMOS transistors serially coupled between a first voltage and the output node. The gates of the PMOS and NMOS transistors are controlled by a set of differential biases for selectively pulling the output node to the first voltage or ground. The differential biases are separately set for each of the transistors so that a voltage difference across each of the transistors does not exceed a predetermined value, thereby preventing the same from damage.