Abstract: The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.

Abstract: A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.

Abstract: The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.

Abstract: A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.

Abstract: The operation method of nanotweezers including the steps of: confirming the position of a nanoscale material by way of imaging the surface of a specimen by a scanning type probe microscope; moving the nanotweezers to the position over the nanoscale material; descending the nanotweezers which are in an opened state and then closing the nanotweezers so as to hold the nanoscale material; raising the nanotweezers that hold the nanoscale material and then moving the nanotweezers to an objective position; and descending the nanotweezers that hold the nanoscale material and then opening the nanotweezers, thus releasing the nanoscale material on the objective position which is on the surface of the specimen and is where a nanoscale construction is constructed.

Abstract: There are proposed tweezers with grounding wire for grabbing a minute object containing an infinitesimal substance, which can discharge static electricity in the human body when it is used to grab a minute object, and which thus prevents the action of static electricity on the minute object and/or infinitesimal substance therein. The tweezers with grounding wire is constructed by connecting the grounding wire 2 for discharging the static electricity when a human operates the tweezers 1 The tweezers with grounding wire is particularly useful for handling a minute object 8 containing infinitesimal substance 7 of which shape is unrecognizable with naked eyes or an optical microscope. Since static electricity in the human body or in the object handled is discharged through the grounding wire 2 from the tweezers 1, the minute object 8 and the infinitesimal substance 7 to be handled are not subject to the action of static electricity, and thus are kept free from destruction or damage of static electricity.

Abstract: The operation method of nanotweezers including the steps of: confirming the position of a nanoscale material by way of imaging the surface of a specimen by a scanning type probe microscope; moving the nanotweezers to the position over the nanoscale material; descending the nanotweezers which are in an opened state and then closing the nanotweezers so as to hold the nanoscale material; raising the nanotweezers that hold the nanoscale material and then moving the nanotweezers to an objective position; and descending the nanotweezers that hold the nanoscale material and then opening the nanotweezers, thus releasing the nanoscale material on the objective position which is on the surface of the specimen and is where a nanoscale construction is constructed.