Abstract: Crystals of the compound represented by formula (1), a method for the production thereof, and a method for producing an antibody-drug conjugate using the crystals.

Abstract: Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part for preparing a specimen on a slide glass and staining the specimen, a keeping part for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.

Abstract: Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part for preparing a specimen on a slide glass and staining the specimen, a keeping part for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.

Abstract: Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part for preparing a specimen on a slide glass and staining the specimen, a keeping part for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.

Abstract: Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part for preparing a specimen on a slide glass and staining the specimen, a keeping part for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.

Abstract: Provided is a specimen preparation apparatus capable of supplying a specimen from the specimen preparation apparatus to a specimen analyzer without burdening an operator. This specimen preparation apparatus comprises a stained specimen preparation part for preparing a specimen on a slide glass and staining the specimen, a keeping part for storing the stained specimen slide glass prepared in the stained specimen preparation part and a control part for deciding whether to supply the stained specimen slide glass to the keeping part or to the external apparatus.

Abstract: In a power amplifier, a voltage amplifier stage amplifies voltage of an input signal on the basis of a feedback voltage from a feedback circuit and provides an output signal. A power amplifier stage amplifies power of the output signal from the voltage amplifier stage and provides an output signal. The output signal from the power amplifier stage is supplied to a load and also to the feedback circuit and a voltage divider. The voltage divider divides the output signal from the power amplifier stage to output a divided voltage. A constant voltage circuit regulates a supplied DC voltage to a constant voltage with a voltage at an internal reference point being swung due to the divided voltage from the voltage divider, and then supplies a regulated DC voltage to the voltage amplifier stage.

Abstract: A method and apparatus for nondestructively detecting a flaw such as a hairline crack or defect within a conductive object to be inspected. Surface flaws can be distinguished from deep flaws. The pulse duration of the pulse voltage induced in the secondary coil of a sensor is measured at two separate time instances. At one time instance, the pulse duration is affected by variations in the distance between the sensor and the object but is not affected by the flaw. At the other time instance the pulse duration is affected by said variations and also by the flaw. The effect of said variations is cancelled, using these two measured pulse durations. Only a signal correctly indicating the flaw is extracted to detect the presence of the flaw.