Abstract: A flight management system for a plurality of aerial vehicles includes a management apparatus and an operation terminal. The management apparatus includes processing circuitry to manage operation authorizations to operate the plurality of aerial vehicles. The operation terminal includes an operation interface and processing circuitry. The operation interface is operable by an operator. The processing circuit is connected to the operation interface. Based on an authorization grant request signal obtained based on a flight state of each aerial vehicle of the plurality of aerial vehicles, the processing circuit of the management apparatus transmits an authorization grant command to grant the operation terminal an operation authorization, among the operation authorizations, that is to operate a particular aerial vehicle among the plurality of aerial vehicles.

Abstract: Provided is a chimeric target factor receptor capable of activating an antigen-presenting cell such as a dendritic cell in a target-factor-specific manner. The chimeric target factor receptor contains a target factor-binding domain, a transmembrane domain, and an intracellular domain containing a TLR intracellular domain.

Abstract: A radio-frequency module includes a mounting substrate and first and second power amplifiers. The first and second power amplifiers are each mounted on one main surface of the mounting substrate. The first power amplifier includes a first input terminal and a first outer periphery. The first outer periphery includes a first edge section. The second power amplifier includes a second input terminal and a second outer periphery. The second outer periphery includes a second edge section. The second edge section opposes the first edge section in a first direction. The first input terminal is disposed in the first edge section of the first power amplifier. The second input terminal is disposed in the second edge section of the second power amplifier. The first and second input terminals do not overlap each other in the first direction.

Abstract: Provided are a combination drug for treating a malignant tumor, a pharmaceutical composition for treating a malignant tumor, and a pharmaceutical composition for malignant tumor treatment that have an exceptional antitumor effect. A malignant tumor can be treated by a combination drug containing a first medicine that includes an oncolytic virus belonging to the herpes simplex viruses type 1 as an active ingredient, and a second medicine that includes an interferon gene stimulating factor agonist as an active ingredient.

Abstract: A vehicle control system includes: a power unit including an electric rotary machine; an electric coolant pump configured to circulate a coolant that cools the electric rotary machine; and a control unit configured to operate the electric coolant pump based on a condition that a temperature of the electric rotary machine is equal to or higher than a predetermined operation threshold temperature, and a condition that an output of the electric rotary machine is equal to or higher than a predetermined operation threshold output.

Abstract: A vehicle control system includes: a power unit including an electric rotary machine; an electric coolant pump configured to circulate a coolant that cools the electric rotary machine; and a control unit configured to operate the electric coolant pump based on a condition that a temperature of the electric rotary machine is equal to or higher than a predetermined operation threshold temperature, and a condition that an output of the electric rotary machine is equal to or higher than a predetermined operation threshold output.

Abstract: [Problems to be solved] To provide a test-use individual substrate capable of improving testing accuracy and connecting reliability. [Means for solving the Problems] A test-use individual substrate 30 which is used for testing a semiconductor wafer, comprises a main body portion 31, thin portions 321, 322 extending from the main body portion 31 and being relatively thinner than the main body portion, and bumps 33 provided on the thin portions 321, 322.

Abstract: A wafer tray which holds a semiconductor wafer includes a wafer set plate on which the semiconductor wafer is set, a tray body which supports the wafer set plate to be able to finely move, and a vibration actuator which imparts vibration to the wafer set plate.

Abstract: A fixing apparatus for fixing a probe card to a holder includes a screw fixed to the holder and binding the probe card onto the holder in a vertical direction, a first bearing member intervening between a head of the screw and the probe card and allowing expansion and contraction of the probe card with respect to the screw in a horizontal direction, and a second bearing member intervening between the probe card and the holder and allowing expansion and contraction of the probe card with respect to the holder in the horizontal direction.

Abstract: A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board having interconnect patterns electrically connected to the probe needles via bonding wires; and a base member and stiffener for reinforcing the probe card. The mount base and the circuit board are noncontact.

Abstract: [Problems to be solved] To provide a test-use individual substrate capable of improving testing accuracy and connecting reliability. [Means for solving the Problems] A test-use individual substrate 30 which is used for testing a semiconductor wafer, comprises a main body portion 31, thin portions 321, 322 extending from the main body portion 31 and being relatively thinner than the main body portion, and bumps 33 provided on the thin portions 321, 322. [Selected Drawing] FIG.

Abstract: A fixing apparatus for fixing a probe card to a holder includes a screw fixed to the holder and binding the probe card onto the holder in a vertical direction, a first bearing member intervening between a head of the screw and the probe card and allowing expansion and contraction of the probe card with respect to the screw in a horizontal direction, and a second bearing member intervening between the probe card and the holder and allowing expansion and contraction of the probe card with respect to the holder in the horizontal direction.

Abstract: A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board having interconnect patterns electrically connected to the probe needles via bonding wires; and a base member and stiffener for reinforcing the probe card. The mount base and the circuit board are noncontact.

Abstract: A connector assembly, for electrically connecting electrical cables 7 to a test head 4, comprises a plurality of types of cable side connectors 8 respectively attached to one end of the electrical cable 7; and a intermediate connector 6 to which the plurality of types of cable side connectors 8 are connected in a detachable manner, and the intermediate connector 6 having a first engagement part 501 having a shape with which all types of cable side connectors 8 can be engaged and an output terminal 602 able to be engaged with a test head side connector 41 electrically connected to a pin electronics board of the test head 4.

Abstract: An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66; a device side connector 541 attached to the other end of the electrical cable 54; and a intermediate connector 53 electrically connecting a test head side connector 41 provided on the test head 4 and the device side connector 541 and the intermediate connector 53 having a connector body 531 provided at a bottommost part of the interface apparatus 5; an engagement hole 532 provided at the connector body 531 and having the device side connector 541 detachably connected to it; and an output terminal 537 provided at the connector body 531 and having the test head side connector 41 detachably connected to it.

Abstract: A calibration board mounted on a socket when calibrating an electronic device test apparatus for testing an IC by bringing ball contacts of the IC into electrical contact with contact terminals of the socket includes calibration terminals for electrically contacting the contact terminals; and a board comprising an insulating member and provided with the calibration terminals, wherein the calibration terminals have spherical members sticking out from the board toward the contact terminals so as to correspond to the shapes of the contact terminals.

Abstract: A system for mating and demating a plurality of connectors mounted on a socket board with and from a plurality of corresponding connectors mounted on a motherboard includes: an adapter that is arranged above a surface opposite to the socket board surface on which the connectors are arranged and is movable in a direction in which the connectors are mated and demated; pressing means which contacts the surface of the socket board on which the semiconductor components are placed to press the socket board to the motherboard by lowering the adapter; and pulling means each of which engages with an engaging hole formed in the socket board and pulls the socket board in the direction in which the socket board is separated from the motherboard by lifting the adapter.

Abstract: A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement includes: a signal terminal having an width smaller than the distance between the probe pins provided on both sides of one probe pin in the arrangement direction; two ground terminals to which a ground potential is applied, which are provided on both sides of the signal terminal in the arrangement direction and which have each width larger than that of the signal terminal in the arrangement direction; and a signal line electrically connecting the signal terminal to a signal input terminal of the external measurement apparatus.

Abstract: A folding-type portable information device 120 provided with an image capturing function including a first housing 104 and a second housing 106 rotatably connected via a connecting unit 108, an image capturing unit 110 being provided in the second housing 106 or in the connecting unit 108, and an image display unit 112 for displaying an image captured by the image capturing unit 110 being provided in the first housing 104, wherein an image capturing direction control unit 130, 132, 134, 136, 138, or 140 for varying the image capturing direction of the image capturing unit 110 according to the folding angle between the first housing 104 and the second housing 106 is provided.

Abstract: An infrared gas analyzer includes: a sample cell through which a sample gas containing a measurement component that absorbs an infrared light flows; one or a plurality of light sources that emits the infrared light; and a detector that detects a concentration of the measurement component contained in the sample gas by utilizing a change in the infrared light being absorbed by the measurement component when the sample gas passes through the sample cell.