Patents by Inventor Shigeru Sonobe

Shigeru Sonobe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4253765
    Abstract: In a multi-wavelength spectrophotometer using a self-scanning detector, the range of wavelengths to be scanned by the detector is divided into plural subranges. These wavelength subranges are subjected to the wavelength scanning with different integration times respectively. The detector output at the scanning of each wavelength subrange is stored in a memory. Thereafter, the stored data is read out in a form of a continuous wavelength range.
    Type: Grant
    Filed: February 22, 1979
    Date of Patent: March 3, 1981
    Assignee: Hitachi, Ltd.
    Inventors: Iwao Kato, Shigeru Sonobe
  • Patent number: 4030828
    Abstract: There is provided a multi-functional spectrophotometer allowing various measurements in which a stigmatic concave grating is employed for selecting the wavelength of the measuring light. A number of miniature type detectors are employed for detecting the diffracted light from the concave grating. Cells containing samples to be measured can be positioned either adjacent to inlet slits at the side of a light source or behind exit slits. These positions of the cells can be easily changed over one with the other. In the former position, absorbances (concentrations) of sample components for a plurality of predetermined light wavelengths can be simultaneously measured. In the later position, not only the absorbance characteristic curve of the sample can be determined, but also the absorbance, fluorescence and turbidity of the sample for a give wavelength can be measured.
    Type: Grant
    Filed: March 23, 1976
    Date of Patent: June 21, 1977
    Assignee: Hitachi, Ltd.
    Inventors: Shigeru Sonobe, Makoto Watanabe, Iwao Kato, Tomoyoshi Sato