Patents by Inventor Shigeto Takeda

Shigeto Takeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10139219
    Abstract: An optical distance measuring apparatus includes: a scanning element scanning a coherent irradiation light from a light source and sending it to an object under measurement; a photo detector receiving the irradiation light modulated by being passed through the object under measurement in accordance with the scanning, and performing photoelectric conversion on the irradiation light; and a measuring unit obtaining phase information of the object under measurement based on a signal photoelectrically converted by the photo detector and a signal to be a reference for the scanning by the scanning element, and obtaining a measurement value regarding the object under measurement based on the phase information.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: November 27, 2018
    Assignee: ASTRODESIGN, INC.
    Inventors: Toshiharu Takesue, Shigeto Takeda, Nobuyuki Nishizawa, Tatsuho Arima, Shigeaki Suzuki
  • Publication number: 20170176177
    Abstract: An optical distance measuring apparatus includes: a scanning element scanning a coherent irradiation light from a light source and sending it to an object under measurement; a photo detector receiving the irradiation light modulated by being passed through the object under measurement in accordance with the scanning, and performing photoelectric conversion on the irradiation light; and a measuring unit obtaining phase information of the object under measurement based on a signal photoelectrically converted by the photo detector and a signal to be a reference for the scanning by the scanning element, and obtaining a measurement value regarding the object under measurement based on the phase information.
    Type: Application
    Filed: December 9, 2016
    Publication date: June 22, 2017
    Applicant: ASTRODESIGN, Inc.
    Inventors: Toshiharu TAKESUE, Shigeto TAKEDA, Nobuyuki NISHIZAWA, Tatsuho ARIMA, Shigeaki SUZUKI
  • Patent number: 9316536
    Abstract: A spatial frequency reproducing apparatus includes a light source, a first means for modulating a light emitted from the light source into two lights having different frequencies and separately irradiated adjacently, a second means for two-dimensionally scanning the two lights, a third means for irradiating an object under measurement with the two lights, a fourth means for receiving and converting into an electrical signal at least two or more divided lights from the object under measurement with a boundary line being interposed therebetween in a direction substantially perpendicular to the direction separating the two lights, a fifth means for amplifying respective photoelectrically converted electrical signals while varying a degree of amplification according to frequencies thereof and generating a difference signal or a summation signal of the amplified signals, and a sixth means for obtaining a phase difference or an intensity difference of these signals to obtain a measurement value.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: April 19, 2016
    Assignee: ASTRODESIGN, INC.
    Inventors: Toshiharu Takesue, Shigeto Takeda, Nobuyuki Nishizawa, Tatsuho Arima, Shigeaki Suzuki
  • Patent number: 9194818
    Abstract: A distance measurement system includes: an irradiating means for irradiating two coherent electromagnetic waves having frequencies different from each other to an object under measurement in a partially displacing manner while having a same area; an electromagnetic wave detecting means for detecting electromagnetic waves from at least two or more areas on the object under measurement with a boundary line being interposed therebetween to extend in a direction substantially perpendicular to the displacement direction; a signal generating means for generating a difference signal or a summation signal of respective outputs of the electromagnetic waves detected in the electromagnetic wave detecting means at symmetrical positions with respect to the boundary line; and a measuring means for obtaining a phase difference or intensity difference of the difference signal or summation signal to obtain measurement values.
    Type: Grant
    Filed: April 17, 2013
    Date of Patent: November 24, 2015
    Assignee: ASTRODESIGN, INC.
    Inventors: Toshiharu Takesue, Shigeto Takeda, Shigeaki Suzuki
  • Publication number: 20140374575
    Abstract: A spatial frequency reproducing apparatus includes a light source, a first means for modulating a light emitted from the light source into two lights having different frequencies and separately irradiated adjacently, a second means for two-dimensionally scanning the two lights, a third means for irradiating an object under measurement with the two lights, a fourth means for receiving and converting into an electrical signal at least two or more divided lights from the object under measurement with a boundary line being interposed therebetween in a direction substantially perpendicular to the direction separating the two lights, a fifth means for amplifying respective photoelectrically converted electrical signals while varying a degree of amplification according to frequencies thereof and generating a difference signal or a summation signal of the amplified signals, and a sixth means for obtaining a phase difference or an intensity difference of these signals to obtain a measurement value.
    Type: Application
    Filed: March 11, 2014
    Publication date: December 25, 2014
    Applicant: ASTRODESIGN, Inc.
    Inventors: Toshiharu TAKESUE, Shigeto TAKEDA, Nobuyuki NISHIZAWA, Tatsuho ARIMA, Shigeaki SUZUKI
  • Publication number: 20130280798
    Abstract: A distance measurement system includes: an irradiating means for irradiating two coherent electromagnetic waves having frequencies different from each other to an object under measurement in a partially displacing manner while having a same area; an electromagnetic wave detecting means for detecting electromagnetic waves from at least two or more areas on the object under measurement with a boundary line being interposed therebetween to extend in a direction substantially perpendicular to the displacement direction; a signal generating means for generating a difference signal or a summation signal of respective outputs of the electromagnetic waves detected in the electromagnetic wave detecting means at symmetrical positions with respect to the boundary line; and a measuring means for obtaining a phase difference or intensity difference of the difference signal or summation signal to obtain measurement values.
    Type: Application
    Filed: April 17, 2013
    Publication date: October 24, 2013
    Inventors: Toshiharu TAKESUE, Shigeto TAKEDA, Shigeaki SUZUKI
  • Patent number: 6483714
    Abstract: A multilayered wiring board comprising a first stacked structure consisting essentially of a first insulating layer having a first parallel conductor array and a second insulating layer formed thereon, having a second parallel conductor array oriented orthogonal to the first parallel conductor array, the first and second parallel conductor arrays being electrically interconnected by a first through conductor array; and a second stacked structure consisting essentially of a third insulating layer having a third parallel conductor array crossing at an angle of 30 to 60 degrees to the first parallel conductor array and a fourth insulating layer formed on top of the third insulating layer, having a fourth parallel conductor array orthogonal to the third parallel conductor array, the third and fourth parallel conductor arrays being electrically interconnected by a second through conductor array, wherein the second stacked structure is overlaid on the first stacked structure by interposing therebetween an intermedi
    Type: Grant
    Filed: February 23, 2000
    Date of Patent: November 19, 2002
    Assignee: Kyocera Corporation
    Inventors: Masanao Kabumoto, Yoshihiro Nabe, Masaru Nomoto, Shigeto Takeda