Patents by Inventor Shih-Shin Chen
Shih-Shin Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10557866Abstract: A probe seat of a vertical probe device includes a lower die, a middle die fixed on the lower die, at least one upper die fixed on the middle die, and at least one reinforcing die fixedly disposed in at least one through trough of the middle die. The lower die has lower probe holes located below the through trough, such that probes are be inserted through the lower probe holes respectively and inserted through the through trough. The at least one upper die has upper probe holes located above the through trough for the probes to be inserted therethrough. The at least one reinforcing die has middle probe holes for the probes to be inserted therethrough. As a result, the probe seat has improved rigidity to avoid bending.Type: GrantFiled: November 29, 2016Date of Patent: February 11, 2020Assignee: MPI CORPORATIONInventors: Tsung-Yi Chen, Shih-Shin Chen
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Patent number: 10393773Abstract: A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact pad against which the spring probe is abutted. At least one of the upper and lower dies has a stopping surface partially facing the probe accommodating hole and an extended portion inserting hole in alignment with the probe accommodating hole. At least one of the upper and lower non-spring sections has a cylinder portion abutted on the stopping surface and an extended portion inserted through the extended portion inserting hole.Type: GrantFiled: September 23, 2016Date of Patent: August 27, 2019Assignee: MPI CorporationInventors: Tsung-Yi Chen, Ting-Hsin Kuo, Yi-Lung Lee, Shih-Shin Chen, Horng-Chuan Sun, Horng-Kuang Fan
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Patent number: 10281488Abstract: A probe card includes a substrate module having an installation hole and a first stair-shaped structure provided on two stairs thereof with a first connection surface and a first transmission surface having a first contact pad, a probe module having a probe and a second stair-shaped structure provided on two stairs thereof with a second connection surface and a second transmission surface having a second contact pad electrically connected with the probe, and a pressing member. The probe module is disposed in the installation hole so that the first and second connection surfaces are connected and the first and second transmission surfaces are opposite. The pressing member is detachably pressed on the probe module to press the second connection surface against the first connection surface and make the first and second contact pads electrically connected.Type: GrantFiled: April 14, 2017Date of Patent: May 7, 2019Assignee: MPI CORPORATIONInventors: Shih-Shin Chen, Cheng-En Wu, Chia-Hsiang Yu
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Publication number: 20170315149Abstract: A probe card includes a substrate module having an installation hole and a first stair-shaped structure provided on two stairs thereof with a first connection surface and a first transmission surface having a first contact pad, a probe module having a probe and a second stair-shaped structure provided on two stairs thereof with a second connection surface and a second transmission surface having a second contact pad electrically connected with the probe, and a pressing member. The probe module is disposed in the installation hole so that the first and second connection surfaces are connected and the first and second transmission surfaces are opposite. The pressing member is detachably pressed on the probe module to press the second connection surface against the first connection surface and make the first and second contact pads electrically connected.Type: ApplicationFiled: April 14, 2017Publication date: November 2, 2017Inventors: SHIH-SHIN CHEN, CHENG-EN WU, CHIA-HSIANG YU
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Publication number: 20170153271Abstract: A probe seat of a vertical probe device includes a lower die, a middle die fixed on the lower die, at least one upper die fixed on the middle die, and at least one reinforcing die fixedly disposed in at least one through trough of the middle die. The lower die has lower probe holes located below the through trough, such that probes are be inserted through the lower probe holes respectively and inserted through the through trough. The at least one upper die has upper probe holes located above the through trough for the probes to be inserted therethrough. The at least one reinforcing die has middle probe holes for the probes to be inserted therethrough. As a result, the probe seat has improved rigidity to avoid bending.Type: ApplicationFiled: November 29, 2016Publication date: June 1, 2017Inventors: Tsung-Yi CHEN, Shih-Shin CHEN
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Publication number: 20170082656Abstract: A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact pad against which the spring probe is abutted. At least one of the upper and lower dies has a stopping surface partially facing the probe accommodating hole and an extended portion inserting hole in alignment with the probe accommodating hole. At least one of the upper and lower non-spring sections has a cylinder portion abutted on the stopping surface and an extended portion inserted through the extended portion inserting hole.Type: ApplicationFiled: September 23, 2016Publication date: March 23, 2017Inventors: Tsung-Yi CHEN, Ting-Hsin KUO, Yi-Lung LEE, Shih-Shin CHEN, Horng-Chuan SUN, Horng-Kuang FAN
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Patent number: 9470750Abstract: An alignment adjusting mechanism for a probe card includes a frame, a substrate and positioning screws. The frame has an opening, an inner periphery wall surrounding around the opening, and an outer periphery wall corresponding to the inner periphery wall. The substrate is disposed in the opening and supported by a support flange extending from the inner periphery wall toward a center of the opening. The frame is provided with a plurality of positioning threaded holes each extending from the outer periphery wall to the inner periphery wall in communication with the opening. Each positioning screw is threaded into one of the positioning threaded holes and has an end stopped at a lateral side of the substrate. By turning the positioning screws, the planimetric position of the substrate on an imaginary plane is adjustable.Type: GrantFiled: April 15, 2014Date of Patent: October 18, 2016Assignee: MPI CORPORATIONInventors: Tsung-Yi Chen, Chung-Tse Lee, Shih-Shin Chen
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Patent number: 9435856Abstract: A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation adjusting structure. The frame has a first surface, a second surface opposite to the first surface, and a first opening penetrating through the first and second surfaces. The probe head is coupled to the frame. The space transformer module is disposed in the first opening. The elevation adjusting structure is provided at the frame and has a plurality of spacers for adjusting a position of the frame relative to a reference surface in a vertical direction.Type: GrantFiled: April 15, 2014Date of Patent: September 6, 2016Assignee: MPI CORPORATIONInventors: Tsung-Yi Chen, Chung-Tse Lee, Shih-Shin Chen
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Publication number: 20140306729Abstract: A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation adjusting structure. The frame has a first surface, a second surface opposite to the first surface, and a first opening penetrating through the first and second surfaces. The probe head is coupled to the frame. The space transformer module is disposed in the first opening. The elevation adjusting structure is provided at the frame and has a plurality of spacers for adjusting a position of the frame relative to a reference surface in a vertical direction.Type: ApplicationFiled: April 15, 2014Publication date: October 16, 2014Applicant: MPI CORPORATIONInventors: Tsung-Yi CHEN, Chung-Tse LEE, Shih-Shin CHEN
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Publication number: 20140306730Abstract: An alignment adjusting mechanism for a probe card includes a frame, a substrate and positioning screws. The frame has an opening, an inner periphery wall surrounding around the opening, and an outer periphery wall corresponding to the inner periphery wall. The substrate is disposed in the opening and supported by a support flange extending from the inner periphery wall toward a center of the opening. The frame is provided with a plurality of positioning threaded holes each extending from the outer periphery wall to the inner periphery wall in communication with the opening. Each positioning screw is threaded into one of the positioning threaded holes and has an end stopped at a lateral side of the substrate. By turning the positioning screws, the planimetric position of the substrate on an imaginary plane is adjustable.Type: ApplicationFiled: April 15, 2014Publication date: October 16, 2014Applicant: MPI CORPORATIONInventors: Tsung-Yi CHEN, Chung-Tse LEE, Shih-Shin CHEN
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Publication number: 20070141916Abstract: An automatic-opening containing device includes a base casing, a fixing casing relative to the base casing, a movable casing arranged around the fixing casing, a set of control circuits, a motor arranged inside a control portion of the fixing casing and controlled by the set of control circuits to drive the movable casing, a lid covering the control portion, and a secure member connecting the motor, the fixing casing and the movable casing together. The fixing casing has a first opening formed thereof, and the movable casing has a second opening formed thereof and a three-dimensional configuration similar to that of the fixing casing. The fixing casing and movable casing are concentric in order to generate the largest possible opening when the first and second openings completely overlap. The fixing casing and the movable casing do not interfere with each other when the movable casing rotates.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Inventor: Shih-Shin Chen