Patents by Inventor Shingo Hashizume

Shingo Hashizume has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8593068
    Abstract: A two-wire AC switch suppressing heat from a bidirectional switch element inside the switch is provided. The two-wire AC switch 100a connected between an AC power supply 101 and a load 102 includes: a bidirectional switch element 103 which flows passing current bi-directionally, selects whether to flow or block the current, is connected in series with the AC power supply 101 and the load 102 to form a closed-loop circuit, and is made of a group-III nitride semiconductor; a full-wave rectifier 104 performing full-wave rectification on power supplied from the AC power supply 101; a power supply circuit 105 smoothing a voltage after the full-wave rectification to generate DC power; a first gate drive circuit 107 and a second gate drive circuit 108 each outputting a control signal to the bidirectional switch element 103; and a control circuit 106 controlling the first and second gate drive circuits 107 and 108.
    Type: Grant
    Filed: February 22, 2011
    Date of Patent: November 26, 2013
    Assignee: Panasonic Corporation
    Inventors: Shingo Hashizume, Ayanori Ikoshi, Hiroto Yamagiwa, Yasuhiro Uemoto, Manabu Yanagihara
  • Patent number: 8526207
    Abstract: A semiconductor device 101 in a bi-directional switch includes: a first electrode 109A, a second electrode 109B, a first gate electrode 112A, and a second gate electrode 112B. In a transition period: when the potential of the first electrode 109A is higher than the potential of the second electrode 109B, a voltage lower than the first threshold voltage is applied to the first gate electrode 112A and a voltage higher than the second threshold value voltage is applied to the second gate electrode 112B; and otherwise, a voltage higher than the first threshold value voltage is applied to the first gate electrode, and a voltage lower than the second threshold value voltage is applied to the second gate electrode.
    Type: Grant
    Filed: June 13, 2011
    Date of Patent: September 3, 2013
    Assignee: Panasonic Corporation
    Inventors: Hiroto Yamagiwa, Shingo Hashizume, Manabu Yanagihara, Ayanori Ikoshi
  • Patent number: 8497553
    Abstract: A semiconductor device includes a first transistor formed on a first element region, and a first protecting element including a second transistor formed on a second element region. A second protecting element ohmic electrode is connected to a first gate electrode, a first protecting element ohmic electrode is connected to a first ohmic electrode, and a first protecting element gate electrode is connected to at least one of the first protecting element ohmic electrode and the second protecting element ohmic electrode. The second element region is smaller in area than the first element region.
    Type: Grant
    Filed: October 15, 2010
    Date of Patent: July 30, 2013
    Assignee: Panasonic Corporation
    Inventors: Hiroto Yamagiwa, Shingo Hashizume, Ayanori Ikoshi, Manabu Yanagihara, Yasuhiro Uemoto
  • Patent number: 8148752
    Abstract: A field effect transistor includes a semiconductor stack formed on a substrate, and having a first nitride semiconductor layer and a second nitride semiconductor layer. A source electrode and a drain electrode are formed on the semiconductor stack so as to be separated from each other. A gate electrode is formed between the source electrode and the drain electrode so as to be separated from the source electrode and the drain electrode. A hole injection portion is formed near the drain electrode. The hole injection portion has a p-type third nitride semiconductor layer, and a hole injection electrode formed on the third nitride semiconductor layer. The hole injection electrode and the drain electrode have substantially the same potential.
    Type: Grant
    Filed: February 4, 2011
    Date of Patent: April 3, 2012
    Assignee: Panasonic Corporation
    Inventors: Ayanori Ikoshi, Shingo Hashizume, Masahiro Hikita, Hiroto Yamagiwa, Manabu Yanagihara
  • Publication number: 20110305054
    Abstract: A semiconductor device 101 in a bi-directional switch includes: a first electrode 109A, a second electrode 109B, a first gate electrode 112A, and a second gate electrode 112B. In a transition period: when the potential of the first electrode 109A is higher than the potential of the second electrode 109B, a voltage lower than the first threshold voltage is applied to the first gate electrode 112A and a voltage higher than the second threshold value voltage is applied to the second gate electrode 112B; and otherwise, a voltage higher than the first threshold value voltage is applied to the first gate electrode, and a voltage lower than the second threshold value voltage is applied to the second gate electrode.
    Type: Application
    Filed: June 13, 2011
    Publication date: December 15, 2011
    Inventors: Hiroto YAMAGIWA, Shingo Hashizume, Manabu Yanagihara, Ayanori Ikoshi
  • Publication number: 20110215746
    Abstract: A semiconductor device according to the present invention is a semiconductor device which includes: a semiconductor element; a gate drive circuit; and a connection terminal unit, wherein the semiconductor element includes: a gate electrode pad; and first and second ohmic electrode pads, the connection terminal includes: a first ohmic electrode terminal connected to the first ohmic electrode pad; a second ohmic electrode terminal connected to the second ohmic electrode pad; a gate drive terminal connected to the first ohmic electrode pad; and a gate terminal connected to the gate electrode pad, an input terminal of the gate drive circuit is connected to the gate drive terminal, an output terminal of the gate drive circuit is connected to the gate terminal, and a potential of the first ohmic electrode pad corresponds to a reference potential of the gate drive circuit.
    Type: Application
    Filed: February 28, 2011
    Publication date: September 8, 2011
    Applicant: PANASONIC CORPORATION
    Inventors: Ayanori IKOSHI, Hiroto YAMAGIWA, Shingo HASHIZUME, Manabu YANAGIHARA, Yasuhiro UEMOTO
  • Publication number: 20110215379
    Abstract: A field effect transistor includes a semiconductor stack formed on a substrate, and having a first nitride semiconductor layer and a second nitride semiconductor layer. A source electrode and a drain electrode are formed on the semiconductor stack so as to be separated from each other. A gate electrode is formed between the source electrode and the drain electrode so as to be separated from the source electrode and the drain electrode. A hole injection portion is formed near the drain electrode. The hole injection portion has a p-type third nitride semiconductor layer, and a hole injection electrode formed on the third nitride semiconductor layer. The hole injection electrode and the drain electrode have substantially the same potential.
    Type: Application
    Filed: February 4, 2011
    Publication date: September 8, 2011
    Inventors: Ayanori IKOSHI, Shingo HASHIZUME, Masahiro HIKITA, Hiroto YAMAGIWA, Manabu YANAGIHARA
  • Publication number: 20110204807
    Abstract: A two-wire AC switch suppressing heat from a bidirectional switch element inside the switch is provided. The two-wire AC switch 100a connected between an AC power supply 101 and a load 102 includes: a bidirectional switch element 103 which flows passing current bi-directionally, selects whether to flow or block the current, is connected in series with the AC power supply 101 and the load 102 to form a closed-loop circuit, and is made of a group-III nitride semiconductor; a full-wave rectifier 104 performing full-wave rectification on power supplied from the AC power supply 101; a power supply circuit 105 smoothing a voltage after the full-wave rectification to generate DC power; a first gate drive circuit 107 and a second gate drive circuit 108 each outputting a control signal to the bidirectional switch element 103; and a control circuit 106 controlling the first and second gate drive circuits 107 and 108.
    Type: Application
    Filed: February 22, 2011
    Publication date: August 25, 2011
    Inventors: Shingo HASHIZUME, Ayanori Ikoshi, Hiroto Yamagiwa, Yasuhiro Uemoto, Manabu Yanagihara
  • Publication number: 20110193171
    Abstract: A semiconductor device includes a first transistor formed on a first element region, and a first protecting element including a second transistor formed on a second element region. A second protecting element ohmic electrode is connected to a first gate electrode, a first protecting element ohmic electrode is connected to a first ohmic electrode, and a first protecting element gate electrode is connected to at least one of the first protecting element ohmic electrode and the second protecting element ohmic electrode. The second element region is smaller in area than the first element region.
    Type: Application
    Filed: October 15, 2010
    Publication date: August 11, 2011
    Inventors: Hiroto Yamagiwa, Shingo Hashizume, Ayanori Ikoshi, Manabu Yanagihara, Yasuhiro Uemoto
  • Publication number: 20070194350
    Abstract: A semiconductor device includes the following: a well layer formed in the surface region of a silicon layer; a source layer formed in the surface region of the well layer; a high-concentration well layer formed in the well layer so that its depth from the surface of the silicon layer is shallower than the well layer and deeper than the source layer; a gate electrode formed linearly across the silicon layer, the well layer, and the source layer; a first contact region connected electrically to the source layer; second contact regions arranged at predetermined intervals in the direction parallel to the gate electrode within the first contact region and connected electrically to the high-concentration well layer; and a source electrode connected electrically to the first and second contact regions. The source electrode is connected to either the first contact region or the second contact region in any cross section perpendicular to the longitudinal direction of the gate electrode.
    Type: Application
    Filed: September 14, 2006
    Publication date: August 23, 2007
    Applicant: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
    Inventors: Yasuo HIROOKA, Shingo HASHIZUME, Michiya OHTSUJI, Tomonari OOTA