Abstract: A backup power system according to the present disclosure includes a battery, a charging circuit, power storage, a first load, a second load, and a controller that controls the charging circuit. The controller causes an input current at the charging circuit to increase at a first rate of change in response to a start signal. When the controller detects an increase in a charging voltage at the power storage up to a first voltage at which driving of the first load is possible, the controller controls the charging circuit to cause the input current at the charging circuit to increase at a second rate of change lower than the first rate of change. The charging circuit is controlled by the controller to cause the input current to increase at the second rate of change, and the charging voltage at the power storage increases up to a second voltage at which driving of both the first load and the second load is possible.

Abstract: A backup power system according to the present disclosure includes a battery, a charging circuit, power storage, a first load, a second load, and a controller that controls the charging circuit. The controller causes an input current at the charging circuit to increase at a first rate of change in response to a start signal. When the controller detects an increase in a charging voltage at the power storage up to a first voltage at which driving of the first load is possible, the controller controls the charging circuit to cause the input current at the charging circuit to increase at a second rate of change lower than the first rate of change. The charging circuit is controlled by the controller to cause the input current to increase at the second rate of change, and the charging voltage at the power storage increases up to a second voltage at which driving of both the first load and the second load is possible.

Abstract: A device analyzer for analyzing power devices. An example device analyzer comprises a collector supply to generate supply signal pulses with selected voltage or current levels and a supply signal pulse width at a high current. The supply signal pulses are applied at a collector supply source terminal when DUT is connected to conduct current between the collector supply source terminal and a collector supply common terminal. A supply switch closes or opens the DUT current path in narrow pulses having a narrow pulse width narrower than the supply signal pulses to conduct the supply signal pulses as narrowed sweep signal pulses having the high current capacity of the collector supply current. The supply switch alternatively regulates the current in the current path at constant current levels. Other modules capable of high power test capabilities may also be added.

Abstract: A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.

Abstract: A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.

Abstract: A switching circuit includes at least two first semiconductor switches, each having a first input portion and a second input portion; range resistors that are provided between output portions of the first semiconductor switches and a device under test and that have different resistances from each other; a second semiconductor switch having an input portion connected to the output portions of the first semiconductor switches; and a differential amplifier having an input portion connected to the output portion of the second semiconductor switch and an input portion connected to ends of the range resistors, the ends being adjacent to the device under test. In accordance with a control signal, a desired one of the first semiconductor switches is connected to the first input portion and the second switch is connected to the output portion of the desired first semiconductor switch.

Abstract: A current measuring apparatus using a resistor comprised of a first resistive element: first electrodes disposed on the two ends of the first resistive element; an insulator arranged on the periphery of the first resistive element; a second resistive element arranged on the periphery of the insulator; and second electrodes disposed on the two ends of the second resistive element.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring unit for measuring a first electrical characteristic of a device under test, second measuring unit, switch for switching between the first measuring unit and the second measuring means such that one of the measuring unit is connected to the device under test, and controller for controlling the switching means. The switch includes switches that switch between a first wiring configuration for electrically connecting the first measuring unit to the device under test and a second wiring configuration for electrically connecting the second measuring unit to the device under test. The switch is electrically connected to the device under test at a position closer to the device under test than the first measuring unit and the second measuring unit.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.

Abstract: A switching circuit includes at least two first semiconductor switches, each having a first input portion and a second input portion; range resistors that are provided between output portions of the first semiconductor switches and a device under test and that have different resistances from each other; a second semiconductor switch having an input portion connected to the output portions of the first semiconductor switches; and a differential amplifier having an input portion connected to the output portion of the second semiconductor switch and an input portion connected to ends of the range resistors, the ends being adjacent to the device under test. In accordance with a control signal, a desired one of the first semiconductor switches is connected to the first input portion and the second switch is connected to the output portion of the desired first semiconductor switch.

Abstract: A semiconductor-device characteristic measurement apparatus includes first measuring means for measuring a first electrical characteristic of a device under test, second measuring means, switching means for switching between the first measuring means and the second measuring means such that one of the measuring means is connected to the device under test, and controlling means for controlling the switching means. The switching means includes switches that switch between a first wiring configuration for electrically connecting the first measuring means to the device under test and a second wiring configuration for electrically connecting the second measuring means to the device under test. The switching means is electrically connected to the device under test at a position closer to the device under test than the first measuring means and the second measuring means.

Abstract: In order to shorten the measuring time of an analog-digital converter for measuring very small currents with its resolution unchanged, a method of determining the measuring time for the analog-digital converter which comprises the steps of preliminarily measuring current to be measured, determining a voltage range and a current range used for measurement, and determining the measuring time for an analog-digital converter for current measurement on the basis of the determined voltage and current ranges, and the measured current value is provided.

Abstract: In order to shorten the measuring time of an analog-digital converter for measuring very small currents with its resolution unchanged, a method of determining the measuring time for the analog-digital converter which comprises the steps of preliminarily measuring current to be measured, determining a voltage range and a current range used for measurement, and determining the measuring time for an analog-digital converter for current measurement on the basis of the determined voltage and current ranges, and the measured current value is provided.

Abstract: A voltage/current measuring unit includes a signal generating source having a digital error detecting unit and a digital-to-analog converter (DAC) connected in series, a current measuring resistor having first and second terminals respectively connected to an output terminal of the signal generating source and a connection terminal, a voltage measuring circuit connected to the digital error detecting unit for measuring a voltage at said second terminal of the current measuring resistor and for providing a voltage feedback signal to the signal generating source, a current measuring circuit connected to the digital error detecting unit for measuring a voltage across the first and second terminals of the current measuring resistor, and for providing a current feedback signal to said signal generating source, the voltage measuring circuit and current measuring circuit both include analog-to-digital converters for respectively converting a voltage appearing at the second terminal of the current measuring resistor