Abstract: An information processing device, including an acquiring unit that acquires relationship information indicating a relationship between a plurality of first objects indicated by symbols input by a user, and a file control unit that generates display information related to display of second objects including position information indicating positions of the second objects corresponding to the first objects in a document file on the basis of the relationship information.

Abstract: [Object] To propose an information processing device, an information processing method, and a program which are novel and improved and capable of generating desired display information related to an object in a document file more efficiently. [Solution] Provided is an information processing device, including: an acquiring unit configured to acquire relationship information indicating a relationship between a plurality of first objects indicated by symbols input by a user; and a file control unit configured to generate display information related to display of second objects including position information indicating positions of the second objects corresponding to the first objects in a document file on the basis of the relationship information.

Abstract: A testing apparatus includes a vector memory unit storing original test vector data in which an input signal to be inputted to a circuit subjected to inspection is described, a vector generator generating generated test vector data from the original test vector data, an output part outputting test vector data to be inputted to the inspected circuit, a fault occurrence rate memory unit storing a fault occurrence rate of the input signal, a random number generator generating random number data, and a comparison part comparing the fault occurrence rate of the input signal with the random number data. The vector output part outputs the generated test vector data when the random number data is smaller than the fault occurrence rate of the input signal, and outputs the original test vector data when the random number data is larger than the fault occurrence rate of the input signal.

Abstract: A testing apparatus includes a vector memory unit storing original test vector data in which an input signal to be inputted to a circuit subjected to inspection is described, a vector generator generating generated test vector data from the original test vector data, an output part outputting test vector data to be inputted to the inspected circuit, a fault occurrence rate memory unit storing a fault occurrence rate of the input signal, a random number generator generating random number data, and a comparison part comparing the fault occurrence rate of the input signal with the random number data. The vector output part outputs the generated test vector data when the random number data is smaller than the fault occurrence rate of the input signal, and outputs the original test vector data when the random number data is larger than the fault occurrence rate of the input signal.