Abstract: Such a device is disclosed that includes: redundancy circuits for replacing defective memory cells included in a memory cell array; an electrical fuse circuit that stores addresses of the defective memory cells; a data determination circuit that generates a determination signal by determining whether test data read from the memory cell array is correct or incorrect; and an analysis circuit that supplies, in a first operation mode, the electrical fuse circuit with an address signal supplied when the determination signal is activated, and supplies, in a second operation mode, the electrical fuse circuit with an address signal supplied when a data mask signal supplied from outside is activated irrespective of the determination signal.

Abstract: Such a device is disclosed that includes: redundancy circuits for replacing defective memory cells included in a memory cell array; an electrical fuse circuit that stores addresses of the defective memory cells; a data determination circuit that generates a determination signal by determining whether test data read from the memory cell array is correct or incorrect; and an analysis circuit that supplies, in a first operation mode, the electrical fuse circuit with an address signal supplied when the determination signal is activated, and supplies, in a second operation mode, the electrical fuse circuit with an address signal supplied when a data mask signal supplied from outside is activated irrespective of the determination signal.

Abstract: Such a device is disclosed that includes: redundancy circuits for replacing defective memory cells included in a memory cell array; an electrical fuse circuit that stores addresses of the defective memory cells; a data determination circuit that generates a determination signal by determining whether test data read from the memory cell array is correct or incorrect; and an analysis circuit that supplies, in a first operation mode, the electrical fuse circuit with an address signal supplied when the determination signal is activated, and supplies, in a second operation mode, the electrical fuse circuit with an address signal supplied when a data mask signal supplied from outside is activated irrespective of the determination signal.

Abstract: A recording medium has a program recorded to operate a testing apparatus for testing an electronic device. The program causes the testing apparatus to perform functions as a comparing unit for comparing an output signal from the electronic device with an expected value, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses, and a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in the fail memory, when executing a test for measuring the period of the output signal.

Abstract: A recording medium, on which a program is recorded to operate a testing apparatus for testing an electronic device, is provided, wherein the program makes the testing apparatus perform functions as a comparing unit for comparing the output signal from the electronic device with an expected value signal to be applied, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value signal, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value signal successively according to the rate signal to different addresses successively, and a period calculating unit for calculating the period of the output signal based on the comparison results stored successively in the fail memory, in case of executing a test for measuring the period of the output signal.