Patents by Inventor Shinji Takihi
Shinji Takihi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10393676Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: January 17, 2017Date of Patent: August 27, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20170184514Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 17, 2017Publication date: June 29, 2017Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Patent number: 9594031Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: January 23, 2015Date of Patent: March 14, 2017Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20150139387Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 23, 2015Publication date: May 21, 2015Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Patent number: 8964939Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: June 27, 2012Date of Patent: February 24, 2015Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 8600005Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.Type: GrantFiled: August 31, 2012Date of Patent: December 3, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 8552390Abstract: In an X-ray line sensor 1, a scintillator layer 24 that absorbs X-rays in a low-energy range and emits light and a scintillator layer 26 that absorbs X-rays in a high-energy range and emits light are brought in contact with each other, and further, the thickness of the scintillator layer 24 on the front side is thinner than that of the scintillator layer 26 on the rear side. These make the amount of mismatch small between a light emitting position P1 in the scintillator layer 24 and a light emitting position P2 in the scintillator layer 26 to X-rays in the low-energy range and X-rays in the high-energy range entered at the same angle from the front side, so that at this time, light emitted by the scintillator layer 24 and light emitted by the scintillator layer 26 are detected by a photo-detecting section 16 and a photo-detecting section 23 facing each other.Type: GrantFiled: November 21, 2012Date of Patent: October 8, 2013Assignee: Hamamatsu Photonics K. K.Inventor: Shinji Takihi
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Publication number: 20130044862Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.Type: ApplicationFiled: August 31, 2012Publication date: February 21, 2013Inventors: Toshiyasu SUYAMA, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20130016809Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: June 27, 2012Publication date: January 17, 2013Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Patent number: 8338789Abstract: In an X-ray line sensor 1, a scintillator layer 24 that absorbs X-rays in a low-energy range and emits light and a scintillator layer 26 that absorbs X-rays in a high-energy range and emits light are brought in contact with each other, and further, the thickness of the scintillator layer 24 on the front side is thinner than that of the scintillator layer 26 on the rear side. These make the amount of mismatch small between a light emitting position P1 in the scintillator layer 24 and a light emitting position P2 in the scintillator layer 26 to X-rays in the low-energy range and X-rays in the high-energy range entered at the same angle from the front side, so that at this time, light emitted by the scintillator layer 24 and light emitted by the scintillator layer 26 are detected by a photo-detecting section 16 and a photo-detecting section 23 facing each other.Type: GrantFiled: September 24, 2008Date of Patent: December 25, 2012Assignee: Hamamatsu Photonics K.K.Inventor: Shinji Takihi
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Patent number: 8280005Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.Type: GrantFiled: November 10, 2009Date of Patent: October 2, 2012Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 8223922Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.Type: GrantFiled: November 10, 2009Date of Patent: July 17, 2012Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20120025086Abstract: A radiation detection device includes a first radiation detector that is positioned on the upstream side of a radiation incident direction and detects radiation in a low-energy range, and a second radiation detector that is positioned on the downstream side and detects radiation in a high-energy range. In such a configuration, a pixel width p1 of pixels 13 in an imaging element 12 in the first radiation detector and a pixel width p2 of pixels 23 in an imaging element 22 in the second radiation detector are set to be different in width from each other by considering the distance ?d between the imaging elements, and the pluralities of pixels in the first and second imaging elements 12 and 22 are respectively divided into pluralities of pixel units, and a pixel unit width w2 in the second imaging element 22 is set to be larger than a pixel unit width w1 in the first imaging element 12.Type: ApplicationFiled: February 8, 2010Publication date: February 2, 2012Applicant: HAMAMATSU PHOTONICS K.K.Inventor: Shinji Takihi
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Publication number: 20110095191Abstract: In an X-ray line sensor 1, a scintillator layer 24 that absorbs X-rays in a low-energy range and emits light and a scintillator layer 26 that absorbs X-rays in a high-energy range and emits light are brought in contact with each other, and further, the thickness of the scintillator layer 24 on the front side is thinner than that of the scintillator layer 26 on the rear side. These make the amount of mismatch small between a light emitting position P1 in the scintillator layer 24 and a light emitting position P2 in the scintillator layer 26 to X-rays in the low-energy range and X-rays in the high-energy range entered at the same angle from the front side, so that at this time, light emitted by the scintillator layer 24 and light emitted by the scintillator layer 26 are detected by a photo-detecting section 16 and a photo-detecting section 23 facing each other.Type: ApplicationFiled: September 24, 2008Publication date: April 28, 2011Applicant: HAMAMATSU PHOTONICS K.K.Inventor: Shinji Takihi
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Publication number: 20100119040Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.Type: ApplicationFiled: November 10, 2009Publication date: May 13, 2010Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20100119038Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.Type: ApplicationFiled: November 10, 2009Publication date: May 13, 2010Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi