Patents by Inventor Shinken Okamoto

Shinken Okamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10606481
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: August 10, 2018
    Date of Patent: March 31, 2020
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventor: Shinken Okamoto
  • Publication number: 20190004706
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: August 10, 2018
    Publication date: January 3, 2019
    Applicant: TOSHIBA MEMORY CORPORATION
    Inventor: Shinken OKAMOTO
  • Patent number: 10073624
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: January 10, 2017
    Date of Patent: September 11, 2018
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventor: Shinken Okamoto
  • Publication number: 20170123673
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: January 10, 2017
    Publication date: May 4, 2017
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Patent number: 9569111
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: April 22, 2016
    Date of Patent: February 14, 2017
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventor: Shinken Okamoto
  • Publication number: 20160239214
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: April 22, 2016
    Publication date: August 18, 2016
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Patent number: 9348699
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: April 2, 2015
    Date of Patent: May 24, 2016
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventor: Shinken Okamoto
  • Publication number: 20150212888
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: April 2, 2015
    Publication date: July 30, 2015
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Patent number: 9053016
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: June 9, 2015
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventor: Shinken Okamoto
  • Publication number: 20140297930
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: June 10, 2014
    Publication date: October 2, 2014
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Publication number: 20140059281
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: November 1, 2013
    Publication date: February 27, 2014
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Patent number: 8605504
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Grant
    Filed: September 20, 2010
    Date of Patent: December 10, 2013
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Shinken Okamoto
  • Publication number: 20110197045
    Abstract: According to the embodiments, a memory system includes a nonvolatile semiconductor memory and a writing-loop-count monitoring unit that monitors a loop count of an applied voltage to the nonvolatile semiconductor memory required for data writing of the nonvolatile semiconductor memory as a writing loop count. Moreover, the memory system includes a management table for managing the writing loop count in block unit that is a unit of data erasing and a life managing unit that determines a degraded state of the nonvolatile semiconductor memory based on the management table.
    Type: Application
    Filed: September 20, 2010
    Publication date: August 11, 2011
    Applicant: Kabushiki Kaisha Toshiba
    Inventor: Shinken OKAMOTO
  • Patent number: 6993690
    Abstract: A processing unit 12 that is provided in a memory unit 10 can transfer information that is stored in a corresponding address to a spare memory area and prohibit writing of information into the corresponding address when the number write operations to the respective addresses of flash memories 11-1 through 11-3 reaches a set number or when the error frequency in the information stored in the respective addresses reaches a set frequency. When the remaining capacity of a spare memory area reaches a set capacity, an indication lamp 14 may lit or a memory status signal may be transmitted to a processing unit 21 of a computer 20 and displayed on a display unit 30. The memory processing unit 12 may lit the indication lamp 14 when the number write operations to the respective addresses of flash memories 11-1 through 11-3 reaches a set number or when the error frequency in the information stored in the respective addresses reaches a set frequency.
    Type: Grant
    Filed: July 23, 1999
    Date of Patent: January 31, 2006
    Assignee: Hagiwara Sys-Com Co., Ltd.
    Inventor: Shinken Okamoto