Patents by Inventor Shintaro Masuda

Shintaro Masuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11949210
    Abstract: The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser element and accurately controlling the temperature of the semiconductor laser element. The semiconductor laser device is used for optical analysis and includes: a semiconductor laser element; a temperature detecting element that detects the temperature of the semiconductor laser element; output terminals that output the output of the temperature detecting element to the outside; wires that electrically connect the temperature detecting element and the output terminals; and a heat capacity increasing part that is provided interposed between the temperature detecting element and output terminal, and the output terminal, and contacts with at least part of the wires to increase the heat capacity of the wires.
    Type: Grant
    Filed: March 6, 2020
    Date of Patent: April 2, 2024
    Assignee: Horiba, Ltd.
    Inventors: Makoto Matsuhama, Yusuke Awane, Kimihiko Arimoto, Hirotaka Iseki, Shintaro Masuda
  • Publication number: 20200287349
    Abstract: The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser element and accurately controlling the temperature of the semiconductor laser element. The semiconductor laser device is used for optical analysis and includes: a semiconductor laser element; a temperature detecting element that detects the temperature of the semiconductor laser element; output terminals that output the output of the temperature detecting element to the outside; wires that electrically connect the temperature detecting element and the output terminals; and a heat capacity increasing part that is provided interposed between the temperature detecting element and output terminal, and the output terminal, and contacts with at least part of the wires to increase the heat capacity of the wires.
    Type: Application
    Filed: March 6, 2020
    Publication date: September 10, 2020
    Applicant: HORIBA, LTD.
    Inventors: Makoto MATSUHAMA, Yusuke AWANE, Kimihiko ARIMOTO, Hirotaka ISEKI, Shintaro MASUDA
  • Publication number: 20150107330
    Abstract: This invention is an exhaust gas sampling device that samples an exhaust gas by the use of an open-type exhaust gas sampling part and that is for reducing leakage of the exhaust gas produced due to unevenness of flow velocity of a cooling wind around an exhaust gas pipe. The exhaust gas sampling device comprises the exhaust gas sampling part that has an exhaust gas sampling port arranged to face an exhaust gas discharging port of the exhaust gas pipe and that samples the exhaust gas emitted from the exhaust gas discharging port and an ambient gas surrounding the exhaust gas pipe, and the exhaust gas sampling part has an involvement decreasing structure that decreases the exhaust gas flowing out from the exhaust gas sampling port due to involvement of the exhaust gas by the ambient gas that flows in from the exhaust gas sampling port.
    Type: Application
    Filed: October 21, 2014
    Publication date: April 23, 2015
    Inventors: Hideya YOKOYAMA, Ippei HARA, Akira NODA, Hitoshi KOIKE, Sayaka YOSHIMURA, Shintaro MASUDA, Tatsuki KUMAGAI, Yoshinori OTSUKI
  • Patent number: D288935
    Type: Grant
    Filed: February 24, 1984
    Date of Patent: March 24, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Atuyuki Gotou, Masato Shibayama, Takeshi Abe, Takashi Kawakami, Shintaro Masuda
  • Patent number: D289406
    Type: Grant
    Filed: February 23, 1984
    Date of Patent: April 21, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Masato Shibayama, Takeshi Abe, Atuyuki Gotou, Takashi Kawakami, Shintaro Masuda
  • Patent number: D289407
    Type: Grant
    Filed: February 23, 1984
    Date of Patent: April 21, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Masato Shibayama, Takeshi Abe, Takashi Kawakami, Shintaro Masuda