Patents by Inventor Shintarou Hisatake

Shintarou Hisatake has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electromagnetic wave measurement apparatus and electromagnetic wave measurement method
    Patent number: 11054455
    Abstract: An electromagnetic wave measurement apparatus includes: a probe light generation unit configured to generate probe light of two wavelengths; and an electro-optic probe configured to receive the probe light generated by the probe light generation unit and a detection target electromagnetic wave, wherein the probe light generation unit performs a fluctuation operation to cause a frequency difference of the probe light to fluctuate, and the content of the fluctuation operation is set so as to conform to specifications regarding frequency fluctuation of the detection target electromagnetic wave.
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: July 6, 2021
    Assignee: Osaka University
    Inventor: Shintarou Hisatake
  • Electro-optic probe, electromagnetic wave measuring apparatus, and electromagnetic wave measuring method
    Patent number: 10761126
    Abstract: Provided is an electro-optic probe for detecting an electromagnetic wave, including: an electro-optic crystal; and an optical fiber optically coupled to the electro-optic crystal, wherein a direction of a unique axis of the electro-optic crystal and a polarization direction of light from the optical fiber that enters the electro-optic crystal are set to be in line with each other, or wherein a direction of a unique axis of the electro-optic crystal and a unique polarization direction of the optical fiber are set to be in line with each other.
    Type: Grant
    Filed: June 28, 2016
    Date of Patent: September 1, 2020
    Assignee: Osaka University
    Inventors: Shintarou Hisatake, Tadao Nagatsuma, Hirohisa Uchida
  • Electromagnetic Wave Measurement Apparatus and Electromagnetic Wave Measurement Method
    Publication number: 20200011913
    Abstract: An electromagnetic wave measurement apparatus includes: a probe light generation unit configured to generate probe light of two wavelengths; and an electro-optic probe configured to receive the probe light generated by the probe light generation unit and a detection target electromagnetic wave, wherein the probe light generation unit performs a fluctuation operation to cause a frequency difference of the probe light to fluctuate, and the content of the fluctuation operation is set so as to conform to specifications regarding frequency fluctuation of the detection target electromagnetic wave.
    Type: Application
    Filed: March 6, 2018
    Publication date: January 9, 2020
    Applicant: Osaka University
    Inventor: Shintarou Hisatake
  • Method for measuring electromagnetic field, electromagnetic field measurement device, and phase imaging device
    Patent number: 10451663
    Abstract: An electromagnetic field measurement device includes a first probe and a second probe arranged in a space to measure an electric field, a reference signal generator that generates a reference signal, a first multiplier that multiplies the reference signal by a signal obtained via the first probe, a second multiplier that multiplies a signal obtained via the second probe by the signal output from the first multiplier, and a synchronous detector that extracts a signal component that is synchronous with the reference signal from the signal output from the second multiplier.
    Type: Grant
    Filed: August 9, 2016
    Date of Patent: October 22, 2019
    Assignee: OSAKA UNIVERSITY
    Inventors: Shintarou Hisatake, Tadao Nagatsuma
  • METHOD FOR MEASURING ELECTROMAGNETIC FIELD, ELECTROMAGNETIC FIELD MEASUREMENT DEVICE, AND PHASE IMAGING DEVICE
    Publication number: 20180238948
    Abstract: An electromagnetic field measurement device includes a first probe and a second probe arranged in a space to measure an electric field, a reference signal generator that generates a reference signal, a first multiplier that multiplies the reference signal by a signal obtained via the first probe, a second multiplier that multiplies a signal obtained via the second probe by the signal output from the first multiplier, and a synchronous detector that extracts a signal component that is synchronous with the reference signal from the signal output from the second multiplier.
    Type: Application
    Filed: August 9, 2016
    Publication date: August 23, 2018
    Inventors: Shintarou HISATAKE, Tadao NAGATSUMA
  • Electro-Optic Probe, Electromagnetic Wave Measuring Apparatus, and Electromagnetic Wave Measuring Method
    Publication number: 20180188305
    Abstract: Provided is an electro-optic probe for detecting an electromagnetic wave, including: an electro-optic crystal; and an optical fiber optically coupled to the electro-optic crystal, wherein a direction of a unique axis of the electro-optic crystal and a polarization direction of light from the optical fiber that enters the electro-optic crystal are set to be in line with each other, or wherein a direction of a unique axis of the electro-optic crystal and a unique polarization direction of the optical fiber are set to be in line with each other.
    Type: Application
    Filed: June 28, 2016
    Publication date: July 5, 2018
    Applicant: OSAKA UNIVERSITY
    Inventors: Shintarou Hisatake, Tadao Nagatsuma, Hirohisa Uchida