Patents by Inventor Shinya Nishimura
Shinya Nishimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10267361Abstract: A sliding contact surface-forming material includes a reinforcing base impregnated with a resol-type phenolic resin having polytetrafluoroethylene resin dispersed therein. The reinforcing base is composed of a woven fabric formed by using, respectively as the warp and the weft, a ply yarn which is formed by paralleling at least two strands of a single twist yarn spun from fluorine-containing resin fiber and a single twist yarn spun from polyphenylene sulfide fiber, and by twisting them in the direction opposite to the direction in which the single twist yarns were spun. Also, a multi-layered sliding contact component having the overall shape of a flat plate or a circular cylinder includes the sliding contact surface-forming material so as to configure at least the sliding-contact surface thereof.Type: GrantFiled: July 14, 2010Date of Patent: April 23, 2019Assignee: Oiles CorporationInventors: Hiroyuki Ogoe, Shinya Nishimura, Kentaro Okubo
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Publication number: 20190064091Abstract: An analyzing apparatus includes a memory unit that stores analysis conditions of each standards specifying analysis conditions for each analytical technique, a control unit, and an analysis unit that performs an analysis in accordance with a predetermined analytical technique. The control unit reads out the analysis conditions of the standard, and the control unit displays analysis conditions in time sequence, the displayed analysis conditions being necessary for the analysis and selected from out of the read-out analysis conditions, or the control unit prompts to input the analysis conditions in time sequence. When the analysis conditions are input, the control unit determines whether or not the input analysis conditions comply with the read-out analysis conditions, and in a case where a result of the determination is positive, the control unit displays a next analysis condition being necessary for the analysis, or the control unit prompts to input the next analysis condition.Type: ApplicationFiled: August 20, 2018Publication date: February 28, 2019Applicant: Hitachi High-Tech Science CorporationInventors: Takeshi Umemoto, Shinya Nishimura, Susumu Ito, Nobuaki Okubo
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Publication number: 20180335083Abstract: A sliding contact surface-forming material, and method of making the material are disclosed, the material having minimal swelling and excellent friction-proof and wear-proof characteristics when used in moist environments such as in water, and improved in the friction-proof and wear-proof characteristics under dry friction conditions such as in the open air, particularly under oscillation conditions for testing journal. The material includes a reinforcing base impregnated with a resol-type phenolic resin having polytetrafluoroethylene resin dispersed therein. The reinforcing base is composed of a woven fabric formed by using, as each of the warp and the weft, a ply yarn which is formed by paralleling at least two strands of a single twist yarn spun from fluorine-containing resin fiber and a single twist yarn spun from polyester fiber, and by twisting them in the direction opposite to the direction in which the single twist yarns were spun.Type: ApplicationFiled: July 31, 2018Publication date: November 22, 2018Inventors: Hiroyuki OGOE, Shinya NISHIMURA, Kentaro OKUBO
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Publication number: 20180335081Abstract: A sliding contact surface-forming material with improved friction-proof and wear-proof characteristics under dry friction conditions such as in the open air, while keeping the low swelling, friction-proof, and wear-proof characteristics under moist atmosphere typically under water unchanged, wherein the sliding contact surface-forming material includes a reinforcing base impregnated with a resol-type phenolic resin having polytetrafluoroethylene resin dispersed therein, the reinforcing base being composed of a woven fabric formed by using, respectively as the warp and the weft, a ply yarn which is formed by paralleling at least two strands of a single twist yarn spun from fluorine-containing resin fiber and a single twist yarn spun from polyphenylene sulfide fiber, and by twisting them in the direction opposite to the direction in which the single twist yarns were spun.Type: ApplicationFiled: July 31, 2018Publication date: November 22, 2018Inventors: Hiroyuki OGOE, Shinya NISHIMURA, Kentaro OKUBO
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Patent number: 10088402Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.Type: GrantFiled: December 4, 2014Date of Patent: October 2, 2018Assignee: Hitachi High-Tech Science CorporationInventors: Shinya Nishimura, Kentaro Yamada, Kanji Nagasawa, Ryoji Takasawa
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Patent number: 9922543Abstract: A security sensor system is provided which allows the stopping of the device due to the end of a battery life to be postponed by suppressing battery power consumption, which is caused due to an object detection operation of the security sensor system, after a low battery state is detected. The security sensor system is powered by a battery. When a low battery detector detects a reduction in the voltage of the battery, an object detection operation of the security sensor system is switched from a normal mode to a suppression mode. Consumption of the battery in the suppression mode is suppressed.Type: GrantFiled: December 24, 2014Date of Patent: March 20, 2018Assignee: OPTEX CO., LTD.Inventors: Takao Ujike, Katsutoshi Tatsuoka, Hiroshi Makino, Mitsugu Mihara, Shinya Nishimura
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Patent number: 9920050Abstract: A fused heterocyclic compound is provided represented by the following formula (1) or an N-oxide thereof, wherein A1 represents NR5, oxygen or sulfur, A2 and A3 represent a nitrogen atom or the like, R1 represents a C1 to C6 chain hydrocarbon group or the like, R2 represents a C1 to C6 chain hydrocarbon group or the like, R3 and R4 are the same or different and represent a C1 to C6 chain hydrocarbon group or the like, n represents 0, 1 or 2, and G represents any of the following formulae, wherein Q represents an oxygen or sulfur atom, p represents 0 or 1, and R10 to R24 are the same or different and represent a C1 to C6 chain hydrocarbon group or the like. The compound has an excellent control effect on pests.Type: GrantFiled: June 25, 2014Date of Patent: March 20, 2018Assignee: Sumitomo Chemical Company, LimitedInventors: Takamasa Tanabe, Hajime Mizuno, Ayaka Tanaka, Shinya Nishimura, Yoshihiko Nokura
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Patent number: 9899469Abstract: A semiconductor device includes a p-type semiconductor region in contact with a bottom face of a trench gate, wherein the p-type semiconductor region includes a first p-type semiconductor region containing a first type of p-type impurities and a second p-type semiconductor region containing a second type of p-type impurities. The first p-type semiconductor region is located between the trench gate and the second p-type semiconductor region. In a view along the depth direction, the second p-type semiconductor region is located within a part of the first p-type semiconductor region. A diffusion coefficient of the second type of p-type impurities is smaller than a diffusion coefficient of the first type of p-type impurities.Type: GrantFiled: December 11, 2015Date of Patent: February 20, 2018Assignees: Toyota Jidosha Kabushiki Kaisha, Denso CorporationInventors: Shinya Nishimura, Hirokazu Fujiwara, Narumasa Soejima, Yuichi Takeuchi
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Patent number: 9885645Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A gap jig is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.Type: GrantFiled: March 13, 2015Date of Patent: February 6, 2018Assignee: Hitachi High-Tech Science CorporationInventors: Shinya Nishimura, Hirohito Fujiwara
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Patent number: 9870699Abstract: A security sensor system is provided which allows the stopping of the device due to the end of a battery life to be postponed by suppressing battery power consumption, which is caused due to an object detection operation of the security sensor system, after a low battery state is detected. The security sensor system is powered by a battery. When a low battery detector detects a reduction in the voltage of the battery, an object detection operation of the security sensor system is switched from a normal mode to a suppression mode. Consumption of the battery in the suppression mode is suppressed.Type: GrantFiled: December 24, 2014Date of Patent: January 16, 2018Assignee: OPTEX CO., LTD.Inventors: Takao Ujike, Katsutoshi Tatsuoka, Hiroshi Makino, Mitsugu Mihara, Shinya Nishimura
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Publication number: 20170330990Abstract: A method for manufacturing a photovoltaic device capable of suppressing decreases in an open-circuit voltage and a fill factor or suppressing the occurrence of a current leak. The method for manufacturing a photovoltaic device includes: (a) forming a pyramidal texture on a first main surface of a silicon substrate; (b) forming a first silicate glass on the first main surface; (c) forming a second silicate glass on the first silicate glass; (d) diffusing the impurities of the first conductivity type contained in the first silicate glass to the first main surface of the silicon substrate; (e) forming a third silicate glass on the second silicate glass; and (f) diffusing impurities of a second conductivity type to a second main surface of the silicon substrate after (e).Type: ApplicationFiled: May 11, 2015Publication date: November 16, 2017Applicant: Mitsubishi Electric CorporationInventors: Takehiko SATO, Kunihiko NISHIMURA, Shinya NISHIMURA, Tatsuro WATAHIKI
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Publication number: 20170317162Abstract: A semiconductor device includes a p-type semiconductor region in contact with a bottom face of a trench gate, wherein the p-type semiconductor region includes a first p-type semiconductor region containing a first type of p-type impurities and a second p-type semiconductor region containing a second type of p-type impurities. The first p-type semiconductor region is located between the trench gate and the second p-type semiconductor region. In a view along the depth direction, the second p-type semiconductor region is located within a part of the first p-type semiconductor region. A diffusion coefficient of the second type of p-type impurities is smaller than a diffusion coefficient of the first type of p-type impurities.Type: ApplicationFiled: December 11, 2015Publication date: November 2, 2017Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, DENSO CORPORATIONInventors: Shinya NISHIMURA, Hirokazu FUJIWARA, Narumasa SOEJIMA, Yuichi TAKEUCHI
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Patent number: 9753509Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.Type: GrantFiled: January 27, 2015Date of Patent: September 5, 2017Assignee: Hitachi High-Tech Science CorporationInventors: Shinya Nishimura, Hirohito Fujiwara, Kentaro Yamada
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Patent number: 9640655Abstract: A semiconductor device is provided with: a first conductivity type contact region; a second conductivity type body region; a first conductivity type drift region of; a trench formed through the contact region and body region from a front surface of the semiconductor substrate, wherein a bottom of the trench is positioned in the drift region; an insulating film covering an inner surface of the trench; a gate electrode accommodated in the trench in a state covered with the insulating film; and a second conductivity type floating region formed at a position deeper than the bottom of the trench, and adjacent to the bottom of the trench. The floating region includes a first layer adjacent to the bottom of the trench and a second layer formed at a position deeper than the first layer, wherein a width of the first layer is broader than a width of the second layer.Type: GrantFiled: January 24, 2013Date of Patent: May 2, 2017Assignees: TOYOTA JIDOSHA KABUSHIKI KAISHA, DENSO CORPORATIONInventors: Shinya Nishimura, Narumasa Soejima, Kensaku Yamamoto
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Publication number: 20160368915Abstract: A fused heterocyclic compound is provided represented by the following formula (1) or an N-oxide thereof, wherein A1 represents NR5, oxygen or sulfur, A2 and A3 represent a nitrogen atom or the like, R1 represents a C1 to C6 chain hydrocarbon group or the like, R2 represents a C1 to C6 chain hydrocarbon group or the like, R3 and R4 are the same or different and represent a C1 to C6 chain hydrocarbon group or the like, n represents 0, 1 or 2, and G represents any of the following formulae, wherein Q represents an oxygen or sulfur atom, p represents 0 or 1, and R10 to R24 are the same or different and represent a C1 to C6 chain hydrocarbon group or the like. The compound has an excellent control effect on pests.Type: ApplicationFiled: June 25, 2014Publication date: December 22, 2016Inventors: Takamasa TANABE, Hajime MIZUNO, Ayaka TANAKA, Shinya NISHIMURA, Yoshihiko NOKURA
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Patent number: 9322085Abstract: A high-strength brass alloy for sliding members, consists of, by mass %, 17 to 28% of Zn, 5 to 10% of Al, 4 to 10% of Mn, 1 to 5% of Fe, 0.1 to 3% of Ni, 0.5 to 3% of Si, and the balance of Cu and inevitable impurities. The high-strength brass alloy has a structure that includes a matrix of a single phase structure of the ? phase and includes at least one of Fe—Mn—Si intermetallic compounds in the form of aciculae, spheres, or petals dispersed in the ? phase.Type: GrantFiled: January 6, 2010Date of Patent: April 26, 2016Assignee: OILES CORPORATIONInventors: Shinya Nishimura, Tomoyuki Yamane, Takeshi Kondo
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Publication number: 20160005861Abstract: A semiconductor device is provided with: a first conductivity type contact region; a second conductivity type body region; a first conductivity type drift region of; a trench formed through the contact region and body region from a front surface of the semiconductor substrate, wherein a bottom of the trench is positioned in the drift region; an insulating film covering an inner surface of the trench; a gate electrode accommodated in the trench in a state covered with the insulating film; and a second conductivity type floating region formed at a position deeper than the bottom of the trench, and adjacent to the bottom of the trench. The floating region includes a first layer adjacent to the bottom of the trench and a second layer formed at a position deeper than the first layer, wherein a width of the first layer is broader than a width of the second layer.Type: ApplicationFiled: January 24, 2013Publication date: January 7, 2016Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, DENSO CORPORATIONInventors: Shinya NISHIMURA, Narumasa SOEJIMA, Kensaku YAMAMOTO
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Publication number: 20150260665Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.Type: ApplicationFiled: March 13, 2015Publication date: September 17, 2015Applicant: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Shinya Nishimura, Hirohito Fujiwara
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Publication number: 20150264277Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.Type: ApplicationFiled: January 27, 2015Publication date: September 17, 2015Applicant: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Shinya Nishimura, Hirohito Fujiwara, Kentaro Yamada
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Patent number: D836013Type: GrantFiled: November 21, 2016Date of Patent: December 18, 2018Assignee: OPTEX CO., LTD.Inventors: Shun Onishi, Chihiro Morita, Hiroyuki Ikeda, Michinori Noguchi, Shinya Nishimura, Hirofumi Shimada, Takashi Kondo, Takeo Hyodo, Yu Kawashima