Abstract: A plate-like member mounting device 1 supports a front panel 14 with use of panel supporting portions 23 and a damper 12 of a base panel 11. The damper 12 is subjected to first-level deformation with a small thrust in the vertical direction, and after that, is subjected to second-level deformation with a large thrust. The damper 12 is deformed in the first direction with a thrust in a first direction, and supports the front panel 14 from a back surface side of the front panel 14 while the damper 12 is being subjected to the first-level deformation.

Abstract: A plate-like member mounting device 1 supports a front panel 14 with use of panel supporting portions 23 and a damper 12 of a base panel 11. The damper 12 is subjected to first-level deformation with a small thrust in the vertical direction, and after that, is subjected to second-level deformation with a large thrust. The damper 12 is deformed in the first direction with a thrust in a first direction, and supports the front panel 14 from a back surface side of the front panel 14 while the damper 12 is being subjected to the first-level deformation.

Abstract: A recessed overhead lighting device adapted to be encased in a mounting opening defined in a ceiling panel which is supported by ceiling joists. The lighting device includes a shade structure for supporting at least one tubular lamp and having a reflective surface and also having opposite side flanges. At least one pair of generally elongated mounting members, each having first and second end portions opposite to each other, are mounted on the shade structure. The mounting members are movable between release and set positions, but are held in the release position during insertion of the shade structure from below into the mounting opening.

Abstract: A probe card is electrically connected to a tester, electrically contacted and connected to circuits to be tested, and used to transmit test signals between the tester and the circuits. It includes a plate assembly having a printed board and an earth plate insulated from each other. Probe assemblies are supported by the plate assembly and are substantially vertically contacted at their foremost ends with pads of the circuits to be tested. Each probe assembly includes a center conductor having a sharpened tip contacted with the pad of the circuit to be tested. A holder conductor shrouds the center conductor while leaving the front end portion thereof not enclosed, and having electrical continuity with the center conductor. A dielectric shrouds the holder conductor, a peripheral conductor coaxially arranged around the holder conductor with the dielectric interposed between them, and a sheath enclosing the peripheral conductor.