Abstract: A contact for an electrical test comprises a first area to be bonded to a board, a second area extending in the right-left direction from the lower end portion of the first area, a third area projecting downward from the tip end portion of the second area, and a low light reflective film having lower light reflectance than that of the first area. The third area has a probe tip to be contacted an electrode of an electronic device. The low light reflective film is formed on a surface of at least the bonding part of the first area to the board and its proximity.

Abstract: A contact for an electrical test comprises a first area to be bonded to a board, a second area extending in the right-left direction from the lower end portion of the first area, a third area projecting downward from the tip end portion of the second area, and a low light reflective film having lower light reflectance than that of the first area. The third area has a probe tip to be contacted an electrode of an electronic device. The low light reflective film is formed on a surface of at least the bonding part of the first area to the board and its proximity.

Abstract: An imaging method of an X-ray computerized tomography (X-ray CT) comprising the steps of reconstructing a partial region including a region of interest from penetrating data of an object, extracting only shape information from the reconstructed image, setting a threshold function determined by resolution to the reconstructed image information which is equivalent to linear absorption coefficient distribution (density), extracting the reconstructed image information by making the information into bi-values or tri-values based on the threshold function or by differentiating the information, and extracting and imaging only a portion where the linear absorption coefficient distribution (density) changes stepwise.

Abstract: A CT system for cross-sectional imaging and a method using the same are involved. A second table for fine adjustment of an object is arranged on a conventional first table for the object. The center of gravity of a cross-sectional image of the object imaged in advance is determined, the object is finely moved by means of the second table such that the determined center of gravity coincides with the center or a corner of a mesh used for image formation, and cross-sectional imaging is again carried out. Through this, contrast at the edge of the object can be improved when the object is highly symmetrical as are many industrial products.

Abstract: An X-ray analysis apparatus has a charged particle beam generator, an X-ray generating target bombarded by the beam and a detector for X-rays from said target transmitted by a test piece. To improve the spatial resolution of the apparatus, the beam size is reduced at the target by locating the target outside a vacuum chamber of the beam generator by providing the target as a non-circular narrow track of X-ray generating material exposed at both surfaces of the target, and by providing the beam generator with a beam accelerator and means for reducing the beam diameter between the beam accelerator and the target.