Abstract: A graphite substrate is processed to have surface unevenness in a range of 1 ?m to 8 ?m. Thereby, a semiconductor film to be laminated on the graphite substrate has a stable film quality, and thus adhesion of the graphite substrate and the semiconductor layer can be enhanced. When an electron blocking layer is interposed between the graphite substrate and the semiconductor layer, the electron blocking layer is thin and thus the surface unevenness of the graphite substrate is transferred onto the electron blocking layer. Consequently, the electron blocking layer also has surface unevenness approximately in such range. Thus, almost the same effect as a configuration in which the semiconductor layer is directly connected to the graphite substrate can be produced.

Abstract: Although Cl (chlorine) is no longer supplied in the course of a first process in which a detecting layer formed by a polycrystalline film or a polycrystalline lamination film by vapor deposition or sublimation is formed, an additional source (e.g., HCl of Cl-containing gas) other than a source is supplied at the start or in the course of the first process. Thus, the detecting layer as the polycrystalline film or the polycrystalline lamination film of CdTe, ZnTe, or CdZnTe can be doped with Cl uniformly in a thickness direction from the start until the end of the first process in film formation. As a result, uniform crystal particles and uniform detection characteristics can be achieved.

Abstract: According to a radiographic apparatus of this invention, parameters obtained on an assumption that an X-ray tube 2 is moved Wd×m, which is an integral multiple of pixel pitch Wd, in a B? direction opposite to B+ direction which is a direction of movement by Y-direction adjust screws of a moving mechanism, are corrected as parameters obtained when X-rays are emitted from the X-ray tube 2 in a state of a grid 6 having been moved Wd×m by the Y-direction adjust screws. This allows only the grid 6 to be moved without moving the X-ray tube 2. Therefore, parameters equivalent to the parameters which should be obtained when the X-ray tube 2 is moved are obtained by moving the grid 6, and position shifting can be reduced.

Abstract: A graphite substrate is accommodated into a chamber where vacuum drawing is performed via a pump. Thereafter, carbon is heated under vacuum, whereby impurities in the carbon are evaporated causing the carbon to be purified. The carbon in the graphite substrate is purified, achieving suppression of the impurities as donor/acceptor elements and also metallic elements in the semiconductor layer of 0.1 ppm or less, the impurities being contained in the carbon in the graphite substrate. As a result, occurrence of leak current or an abnormal leak point enables to be suppressed, and thus abnormal crystal growth in the semiconductor layer enables to be suppressed.

Abstract: A radiation grid comprises an absorber including absorbing foil strips extending in a direction of extension for absorbing radiation, the absorbing foil strips being arranged in a direction of arrangement perpendicular to the direction of extension; a first covering member for covering one planar surface of the absorber; a second covering member for covering a surface at the opposite side of the one surface of the absorber; first joint members each provided in an area of adjacence between the first covering member and one of the absorbing foil strips forming the absorber, for integrating the two parts; second joint members each provided in an area of adjacence between the second covering member and one of the absorbing foil strips forming the absorber, for integrating the two parts; and connecting members provided to connect ends in the direction of extension of the absorbing foil strips. The connecting members are disposed clear of a middle portion in the direction of extension of each absorbing foil strip.

Abstract: An estimation selecting unit is provided to select an estimating method based on a predetermined value. When variations due to a statistical error of each pixel concerned are enlarged by a greater extent than variations of other pixels, and hence a possibility of becoming conspicuous on the image, then the direct ray transmittance at the pixel concerned is considered less than the predetermined value, and estimated direct ray intensity is obtained for the pixel concerned by interpolating calculation of estimated direct ray intensities at pixels surrounding the pixel concerned.

Abstract: Although Cl (chlorine) is no longer supplied in the course of a first process in which a detecting layer formed by a polycrystalline film or a polycrystalline lamination film by vapor deposition or sublimation is formed, an additional source (e.g., HCl of Cl-containing gas) other than a source is supplied at the start or in the course of the first process. Thus, the detecting layer as the polycrystalline film or the polycrystalline lamination film of CdTe, ZnTe, or CdZnTe can be doped with Cl uniformly in a thickness direction from the start until the end of the first process in film formation. As a result, uniform crystal particles and uniform detection characteristics can be achieved.

Abstract: A graphite substrate is processed to have surface unevenness in a range of 1 ?m to 8 ?m. Thereby, a semiconductor film to be laminated on the graphite substrate has a stable film quality, and thus adhesion of the graphite substrate and the semiconductor layer can be enhanced. When an electron blocking layer is interposed between the graphite substrate and the semiconductor layer, the electron blocking layer is thin and thus the surface unevenness of the graphite substrate is transferred onto the electron blocking layer. Consequently, the electron blocking layer also has surface unevenness approximately in such range. Thus, almost the same effect as a configuration in which the semiconductor layer is directly connected to the graphite substrate can be produced.

Abstract: A radiography device that can be applied to even general-purpose scattered radiation removing means, capable of producing appropriate radiation images that are independently of the status of installation of scattered radiation removing means. A pixel specifying portion specifies particular pixels of the various pixels that comprise an x-ray image. An intensity estimating portion estimates the scattered x-ray intensities (scattered radiation intensities) at the particular pixels specified by the pixel specifying portion and/or the direct x-ray intensities (the direct radiation intensities) of the particular pixels. Consequently, it is possible to estimate appropriately the scattered x-ray intensities and/or direct x-ray intensities at the particular pixels in consideration of the status of installation of a grid (scattered radiation removing means).

Abstract: A drive controller varies a bias voltage applied from a bias supply to a conversion layer based on the presence or absence of binning, that is, for a case of carrying out binning where switching elements are driven on the basis of a plurality of rows at a time by a gate drive circuit, and for a case of carrying out no binning where the switching elements are driven on a row-by-row basis by the gate drive circuit. Therefore, in the case of a fluoroscopic mode for acquiring images with binning, a lowering of a dynamic range can be suppressed. In the case of a radiographic mode with no binning, spatial resolution can be made high. That is, a high dynamic range and high spatial resolution can be optimized according to modes of operation.

Abstract: According to a radiographic apparatus of this invention, parameters obtained on an assumption that an X-ray tube 2 is moved Wd×m, which is an integral multiple of pixel pitch Wd, in a B? direction opposite to B+ direction which is a direction of movement by Y-direction adjust screws of a moving mechanism, are corrected as parameters obtained when X-rays are emitted from the X-ray tube 2 in a state of a grid 6 having been moved Wd×m by the Y-direction adjust screws. This allows only the grid 6 to be moved without moving the X-ray tube 2. Therefore, parameters equivalent to the parameters which should be obtained when the X-ray tube 2 is moved are obtained by moving the grid 6, and position shifting can be reduced.

Abstract: A radiation grid comprises an absorber including absorbing foil strips extending in a direction of extension for absorbing radiation, the absorbing foil strips being arranged in a direction of arrangement perpendicular to the direction of extension; a first covering member for covering one planar surface of the absorber; a second covering member for covering a surface at the opposite side of the one surface of the absorber; first joint members each provided in an area of adjacence between the first covering member and one of the absorbing foil strips forming the absorber, for integrating the two parts; second joint members each provided in an area of adjacence between the second covering member and one of the absorbing foil strips forming the absorber, for integrating the two parts; and connecting members provided to connect ends in the direction of extension of the absorbing foil strips. The connecting members are disposed clear of a middle portion in the direction of extension of each absorbing foil strip.

Abstract: An estimation selecting unit is provided to select an estimating method based on a predetermined value. When variations due to a statistical error of each pixel concerned are enlarged by a greater extent than variations of other pixels, and hence a possibility of becoming conspicuous on the image, then the direct ray transmittance at the pixel concerned is considered less than the predetermined value, and estimated direct ray intensity is obtained for the pixel concerned by interpolating calculation of estimated direct ray intensities at pixels surrounding the pixel concerned.

Abstract: A radiography device that can be applied to even general-purpose scattered radiation removing means, capable of producing appropriate radiation images that are independently of the status of installation of scattered radiation removing means. A pixel specifying portion specifies particular pixels of the various pixels that comprise an x-ray image. An intensity estimating portion estimates the scattered x-ray intensities (scattered radiation intensities) at the particular pixels specified by the pixel specifying portion and/or the direct x-ray intensities (the direct radiation intensities) of the particular pixels. Consequently, it is possible to estimate appropriately the scattered x-ray intensities and/or direct x-ray intensities at the particular pixels in consideration of the status of installation of a grid (scattered radiation removing means).

Abstract: An X-ray that has passed through a target object 13 is detected by a two-dimensional X-ray detector 14 capable of energy discrimination, to determine an actual X-ray strength at a specific energy level. The target object 13 is rotationally scanned in predetermined angular steps around an axis perpendicular to the X-ray. The target object 13 is imaginarily divided into a large number of micro-sized unitary cubic cells, and each detection element 14a is considered to be receiving an X-ray that has passed through a plurality of unitary cubic cells. A data processor 6 creates a system of equations including a measured intensity ratio between the transmitted and direct X-rays and a theoretical X-ray intensity ratio calculated from the mass absorption coefficients, unknown weight ratios and density of the elements contained in each unitary cubic cell. The number of equations is equal to or larger than the total number of the elements having unknown weight ratios and the density.

Abstract: An X-ray that has passed through a target object 13 is detected by a two-dimensional X-ray detector 14 capable of energy discrimination, to determine an actual X-ray strength at a specific energy level. The target object 13 is rotationally scanned in predetermined angular steps around an axis perpendicular to the X-ray. The target object 13 is imaginarily divided into a large number of micro-sized unitary cubic cells, and each detection element 14a is considered to be receiving an X-ray that has passed through a plurality of unitary cubic cells. A data processor 6 creates a system of equations including a measured intensity ratio between the transmitted and direct X-rays and a theoretical X-ray intensity ratio calculated from the mass absorption coefficients, unknown weight ratios and density of the elements contained in each unitary cubic cell. The number of equations is equal to or larger than the total number of the elements having unknown weight ratios and the density.

Abstract: A qualitative analysis is carried out by first storing reference spectral line data of various elements in different compound forms, exciting a sample and spectroscopically analyzing signal light emitted from the sample to obtain measured spectral line data, determining whether these measured spectral line data include spectral lines of specified compound-forming elements, and comparing the reference spectral line data with the measured spectral line data, if the measured spectral line data are found to include spectral lines of any of the compound-forming elements, to thereby identify elements in the sample.

Abstract: An X-ray fluorescence spectrometer includes an X-ray tube, a collimator or capillary lens for irradiating a primary X-ray from the X-ray tube on a sample, and a detector for detecting an X-ray fluorescence from the sample. The detector is enclosed in a sealed chamber for preventing the X-ray fluorescence from being attenuated by the air. In addition, both ends of the collimator or capillary lens are sealed by thin films having high X-ray permeability for preventing the primary X-ray from being attenuated by the air.

Abstract: A fluorescent X-ray analyzing apparatus includes a secondary target device therein. The secondary target device includes a target main body, and an X-ray blocking member for preventing an irradiation of primary X-rays from a X-ray source to a sample. The target main body is formed of plural target members in which secondary target materials are formed on at least target surfaces facing a central axis, and the target members are arranged concentrically to have different distances from the central axis. Accordingly, the primary X-rays do not pass through a space between the target members, and are irradiated only at the target surfaces of the target members. The secondary X-rays from the target surfaces pass through the space between the target members, and reach the sample.

Abstract: A fluorescent x-ray analyzer has a sample table with a movable part such as a turret which can be moved such that a sample which is placed at a specified sample position thereon can be moved to a specified position for analysis, an x-ray source for emitting primary x-rays, a detector for detecting secondary x-rays emitted from the irradiated sample, and a correcting device for correcting the detection signal outputted from the detector for an error caused by the variation in the sample position, or the variations in the distance between the plane of measurement and the x-ray source and/or the detector.