Patents by Inventor Shou-Kang FAN

Shou-Kang FAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for detecting abnormal die
    Patent number: 11378620
    Abstract: A method for detecting an abnormal die includes providing a wafer, determining the surrounding dies in accordance with a position of a target die on the wafer, calculating a difference between a value of an electrical characteristic of each of the surrounding dies and a value of an electrical characteristic of the target die to obtain the electrical characteristic deviations, ranking the absolute values of the electrical characteristic deviations to generate a ranking result, and determining the characteristic-related dies from the surrounding dies in accordance with the ranking result, determining a target-related area in accordance with the position of the target die, determining the target-related die from the characteristic-related dies in accordance with the target-related area and determining whether the target die is qualified in accordance with the target-related die.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: July 5, 2022
    Assignee: INTEGRATED SILICON SOLUTION INC.
    Inventors: Shou-Kang Fan, Lien-Sheng Yang
  • METHOD AND SYSTEM FOR DETECTING ABNORMAL DIE
    Publication number: 20210349147
    Abstract: A method for detecting an abnormal die includes providing a wafer, determining the surrounding dies in accordance with a position of a target die on the wafer, calculating a difference between a value of an electrical characteristic of each of the surrounding dies and a value of an electrical characteristic of the target die to obtain the electrical characteristic deviations, ranking the absolute values of the electrical characteristic deviations to generate a ranking result, and determining the characteristic-related dies from the surrounding dies in accordance with the ranking result, determining a target-related area in accordance with the position of the target die, determining the target-related die from the characteristic-related dies in accordance with the target-related area and determining whether the target die is qualified in accordance with the target-related die.
    Type: Application
    Filed: July 31, 2020
    Publication date: November 11, 2021
    Inventors: Shou-Kang FAN, Lien-Sheng YANG