Abstract: Storage devices include a memory array comprised of a plurality of memory devices. These memory devices are programmed to store data and erased when data is invalidated. Traditional storage devices waited to erase memory devices until new data was ready to write to them in order to avoid baking in the erase state. However, the act of erasing adds time to the overall program cycle and is getting larger as storage device capacity and complexity increases. Because of newer configurations, the threat of baking in erase states is decreased, allowing memory devices within a memory array to be pre-erased prior to writing. This reduces write times and be dynamically implemented in response to one or more changing conditions. Pre-erasing can be accomplished by utilizing a pre-erase list that can indicate pre-erased memory devices and provide them in response to a write command prior to the use of non-erased memory devices.

Abstract: Storage devices include a memory array comprised of a plurality of memory devices arranged in word lines. The word lines are further arranged within memory blocks. When erasing memory blocks, various storage devices may utilize a stripe-erase process that alternates the erasure of word lines within the memory blocks. The stripe-erase process is often carried out in multiple steps. However, an ungraceful shutdown can interrupt the erasing processing between one of these stripe-erase steps. The status of each memory device associated with the aborted erasure needs to be known before operations can continue. Methods and systems described herein properly classify and process memory blocks after an aborted erase command by analyzing both even and odd word lines within each of the memory blocks. By properly categorizing each memory block, overprogramming and other negative effects can be avoided, increasing the overall lifespan of the storage device that utilizes a stripe-erase process.

Abstract: Storage devices include a memory array comprised of a plurality of memory devices arranged in word lines. The word lines are further arranged within memory blocks. When erasing memory blocks, various storage devices may utilize a stripe-erase process that alternates the erasure of word lines within the memory blocks. The stripe-erase process is often carried out in multiple steps. However, an ungraceful shutdown can interrupt the erasing processing between one of these stripe-erase steps. The status of each memory device associated with the aborted erasure needs to be known before operations can continue. Methods and systems described herein properly classify and process memory blocks after an aborted erase command by analyzing both even and odd word lines within each of the memory blocks. By properly categorizing each memory block, overprogramming and other negative effects can be avoided, increasing the overall lifespan of the storage device that utilizes a stripe-erase process.

Abstract: Storage devices include a memory array comprised of a plurality of memory devices. These memory devices are programmed to store data and erased when data is invalidated. Traditional storage devices waited to erase memory devices until new data was ready to write to them in order to avoid baking in the erase state. However, the act of erasing adds time to the overall program cycle and is getting larger as storage device capacity and complexity increases. Because of newer configurations, the threat of baking in erase states is decreased, allowing memory devices within a memory array to be pre-erased prior to writing. This reduces write times and be dynamically implemented in response to one or more changing conditions. Pre-erasing can be accomplished by utilizing a pre-erase list that can indicate pre-erased memory devices and provide them in response to a write command prior to the use of non-erased memory devices.