Abstract: A positioning measurement device is provided. The device includes a light source, a grating, and plural light sensors. A periodic light field is generated by light emitted by the light source and passes through the grating to. The plural light sensors are periodically spaced. The light sensors are used to sense the periodic light field for generating a plurality of positioning measurement signals.

Abstract: A flatness measurement device includes a movement platform, a standard component, a first flatness measuring device, a second flatness measuring device and a processor. The movement platform is used for driving a to-be-measured object to move. The standard component and the movement platform move together. The first flatness measuring device is used for measuring a first flatness information of the to-be-measured object when the to-be-measured object moves. The second flatness measuring device is used for measuring a second flatness information of the standard component when the standard component moves. A flatness information of the to-be-measured object is obtained by deducting the second flatness information from the first flatness information by the processor.

Abstract: A positioning measurement device is provided. The device includes a light source, a grating, and plural light sensors. A periodic light field is generated by light emitted by the light source and passes through the grating to. The plural light sensors are periodically spaced. The light sensors are used to sense the periodic light field for generating a plurality of positioning measurement signals.

Abstract: A method of workflow monitoring and analysis includes: according to an image to generate at least one three-dimensional joint coordinate, and according to the three dimensional joint coordinate to generate at least one task posture information; according to a movement information to generate at least one three-dimensional track information, and according to the three dimensional track to generate at least one task track information; and according to a workpiece posture information, the task posture information, a workpiece movement information and the task track information to generate a task semanticist.

Abstract: A three-dimensional (3D) interactive device and an operation method thereof are provided. The 3D interactive device includes a projection unit, an image capturing unit, and an image processing unit. The projection unit projects an interactive pattern to a surface of a body, so that a user performs an interactive trigger operation on the interactive pattern by a gesture. The image capturing unit captures a depth image within an image capturing range. The image processing unit receives the depth image and determines whether the depth image includes a hand region of the user. If yes, the image processing unit performs hand geometric recognition on the hand region to obtain gesture interactive semantics. According to the gesture interactive semantics, the image processing unit controls the projection unit and the image capturing unit. Accordingly, the disclosure provides a portable, contact-free 3D interactive device.

Abstract: A three-dimensional (3D) interactive device and an operation method thereof are provided. The 3D interactive device includes a projection unit, an image capturing unit, and an image processing unit. The projection unit projects an interactive pattern to a surface of a body, so that a user performs an interactive trigger operation on the interactive pattern by a gesture. The image capturing unit captures a depth image within an image capturing range. The image processing unit receives the depth image and determines whether the depth image includes a hand region of the user. If yes, the image processing unit performs hand geometric recognition on the hand region to obtain gesture interactive semantics. According to the gesture interactive semantics, the image processing unit controls the projection unit and the image capturing unit. Accordingly, the disclosure provides a portable, contact-free 3D interactive device.

Abstract: A method of workflow monitoring and analysis includes: according to an image to generate at least one three-dimensional joint coordinate, and according to the three dimensional joint coordinate to generate at least one task posture information; according to a movement information to generate at least one three-dimensional track information, and according to the three dimensional track to generate at least one task track information; and according to a workpiece posture information, the task posture information, a workpiece movement information and the task track information to generate a task semanticist.

Abstract: Systems and methods for determining three-dimensional (3D) absolute coordinates of objects are disclosed. The system may include at least one light source providing illumination, a path altering unit to manipulate the path of the light from the light source, a plurality of sensors to sense the light reflected and diffused from objects, and a controller to determine the three-dimensional absolute coordinates of the objects based in part on the reflected light detected by the sensors.

Abstract: A system for alignment measurement for a rolling embossed double-sided optical film, the system comprising: a first roller with a first brightness enhancement film pattern and a first alignment pattern thereon, a second roller with a second brightness enhancement film pattern and a second alignment pattern thereon; a measuring unit for measuring diffraction patterns in the first alignment region and the second alignment region, respectively; and a control unit electrically connected to the first roller, the second roller and the measuring unit to adjust the relative position between the first roller and the second roller according to the diffraction patterns measured by the measuring unit.

Abstract: A virtual touch system including a head-mounted see-through display device, a micro-image display, at least two micro image-capturing devices, and an image processing unit is provided. The head-mounted see-through display device has a holder and an optical lens group that allows an image light of a real scene to directly pass through and reach an observing location. The micro-image display disposed on the holder of the head-mounted see-through display device casts a display image to the observing location through the optical lens group to generate a virtual image plane, wherein the virtual image plane contains a digital information. The micro image-capturing devices disposed at the holder capture images of the real scene and a touch indicator. The image processing unit coupled to the head-mounted see-through display device recognizes the touch indicator and calculates a relative location of the touch indicator on the virtual image plane for the micro-image display.

Abstract: The present invention provides a measurement device and a measurement method of double-sided optical films, wherein the device and the method make use of an illumination light source with well-designed bright fields and dark fields and a device with double-sided coincidence optics to obtain the variation information about the horizontal mismatch and the angular mismatch of double-sided optical films.

Abstract: A method and an apparatus are disclosed for scatterfield microscopical measurement. The method integrates a scatterometer and a bright-field microscope for enabling the measurement precision to be better than the optical diffraction limit. With the aforesaid method and apparatus, a detection beam is generated by performing a process on a uniform light using an LCoS (liquid crystal on silicon) or a DMD (digital micro-mirror device) which is to directed to image on the back focal plane of an object to be measured, and then scattered beams resulting from the detection beam on the object's surface are focused on a plane to form an optical signal which is to be detected by an array-type detection device. The detection beam can be oriented by the modulation device to illuminate on the object at a number of different angles, by which zero order or higher order diffraction intensities at different positions of the plane at different incident angles can be collected.

Abstract: A reflective scatterometer capable of measuring a sample is provided. The reflective scatterometer includes a paraboloid mirror, a light source, a first reflector, a second reflector and a detector. The paraboloid mirror has an optical axis and a parabolic surface, wherein the sample is disposed on the focal point of the parabolic surface and the normal direction of the sample is parallel with the optical axis. A collimated beam generated from the light source is reflected by the first reflector to the parabolic surface and then is reflected by the parabolic surface to the sample to form a first diffracted beam. The first diffracted beam is reflected by the parabolic surface to the second reflector and is then reflected by the second reflector to the detector.

Abstract: A system for alignment measurement for a rolling embossed double-sided optical film, the system comprising: a first roller with a first brightness enhancement film pattern and a first alignment pattern thereon, a second roller with a second brightness enhancement film pattern and a second alignment pattern thereon; a measuring unit for measuring diffraction patterns in the first alignment region and the second alignment region, respectively; and a control unit electrically connected to the first roller, the second roller and the measuring unit to adjust the relative position between the first roller and the second roller according to the diffraction patterns measured by the measuring unit.

Abstract: A reflective scatterometer capable of measuring a sample is provided. The reflective scatterometer includes a paraboloid mirror, a light source, a first reflector, a second reflector and a detector. The paraboloid mirror has an optical axis and a parabolic surface, wherein the sample is disposed on the focal point of the parabolic surface and the normal direction of the sample is parallel with the optical axis. A collimated beam generated from the light source is reflected by the first reflector to the parabolic surface and then is reflected by the parabolic surface to the sample to form a first diffracted beam. The first diffracted beam is reflected by the parabolic surface to the second reflector and is then reflected by the second reflector to the detector.

Abstract: A method and an apparatus are disclosed for scatterfield microscopical measurement. The method integrates a scatterometer and a bright-field microscope for enabling the measurement precision to be better than the optical diffraction limit. With the aforesaid method and apparatus, a detection beam is generated by performing a process on a uniform light using an LCoS (liquid crystal on silicon) or a DMD (digital micro-mirror device) which is to directed to image on the back focal plane of an object to be measured, and then scattered beams resulting from the detection beam on the object's surface are focused on a plane to form an optical signal which is to be detected by an array-type detection device. The detection beam can be oriented by the modulation device to illuminate on the object at a number of different angles, by which zero order or higher order diffraction intensities at different positions of the plane at different incident angles can be collected.