Patents by Inventor Shuen-Chen Shiue

Shuen-Chen Shiue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080062298
    Abstract: A document camera includes an image-shooting module and a detachable module. The detachable module is installed under the image-shooting module, wherein the detachable module or the image-shooting module includes a magnetic attraction generator to attract each other such that the detachable module can be attached to the image-shooting module.
    Type: Application
    Filed: September 7, 2007
    Publication date: March 13, 2008
    Applicant: AverMedia Technologies, Inc.
    Inventors: Christopher Yen, Ying-Ming Hwang, Shuen-Chen Shiue, Chun-Kai Hsu
  • Patent number: 6844935
    Abstract: A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
    Type: Grant
    Filed: January 20, 2004
    Date of Patent: January 18, 2005
    Assignee: National Taiwan University
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Publication number: 20040145748
    Abstract: A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
    Type: Application
    Filed: January 20, 2004
    Publication date: July 29, 2004
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Patent number: 6661520
    Abstract: A sensor system of a surface plasmon resonance (SPR) for analyzing a characteristic of a substance and the measuring method thereof are provided. The system includes an optical device for generating a first light beam and a second light beam in sequence; a sensor device for respectively generating a first plasmon wave and a second plasmon wave in response to an optical characteristic change of the first light beam and the second light beam with respective to the substance, in which a resonance is generated from the first plasmon wave and the second plasmon wave respectively generating a first reflective signal and a second reflective signal; and a measuring device for measuring spectra of the first reflective signal and the second reflective signal and obtaining the measured value which is substituted into an operational formula to calculate a reference value used for analyzing the characteristic of the substance.
    Type: Grant
    Filed: May 22, 2002
    Date of Patent: December 9, 2003
    Assignee: National Taiwan University
    Inventors: Chu-Wann Lin, Chi-Yu Huang, Jyh-Perng Chiu, Ying-Tsuen Liou, Shuen-Chen Shiue, Te-Son Kuo, Long-Sun Huang, Pei-Zen Chang, Lung-Jieh Yang, Chau-Chung Wu, Shiming Lin, Chih-Kung Lee
  • Patent number: 6590667
    Abstract: A method and apparatus is claimed for measuring the distance between a slider and a transparent disk with sub-nanometer resolution. The flying height is measured by applying ellipsometry. The measurement is done by: providing a sampling light beam with adjustable initial polarization state by phase modulation, and with variable incident angles relative to the air film and reflecting the sampling light off of the specimen at a detection site forming a reflected light beam that is then reflected at the detection site again and then guided to both detectors for detecting the intensity and phase change of the light beam to determine the gap's thickness as well as passing some light to a microscope used for observation of the detecting site on the specimen.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: July 8, 2003
    Assignee: National Science Council
    Inventors: Jau-Hu Lee, Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu
  • Publication number: 20030030817
    Abstract: A multi-functional opto-electronic system is mainly applied to the real-time metrologies of biomedical or biochemical reactions as well as the in-situ manufacturing measurements of biochips. The configuration of this system is built up by integration of at least four different near-field optical metrological principles, which share a part of common optical path design and allow to turn on several functions such as ellipsometer, Laser Doppler vibrometer or interferometer (LDV/I), surface plasmon resonance (SPR) for amplitude and phase detection, phase shifting interference microscope, photon tunneling microscope, optical coherence tomography (OCT) and imaging microscope by switching few components in the system. With the creation of a novel opto-mechanical design and its associated signal processing methodologies, both the signal detection of the biomedical reactions and biomedical imaging concerned for the future trend in the modern biomedical sciences are achieved with high resolutions.
    Type: Application
    Filed: August 10, 2001
    Publication date: February 13, 2003
    Inventors: Chih-Kung Lee, Shuen-Chen Shiue, Shu-Sheng Lee, Jiun-Yan Wu, Chii-Wann Lin, Shiming Lin
  • Patent number: 6483584
    Abstract: An ellipsometer for measuring the complex refractive index of a sample and thin film thickness according to the invention. The ellipsometer includes a linear polarized light source, a reference analyzer, a polarization analyzer and a light direction controller. The linear polarized light source used to generate a measuring beam for detecting the sample. The phase modulator used to control the phase of the measuring beam thereby to generate a sampling beam. The reference analyzer used to generate a reference beam according to part of the sampling beam thereby to adjust the intensity of the sampling beam. The polarization analyzer used to analyze the phase, polarization and intensity of the sampling beam after the sampling beam is reflected by the sample.
    Type: Grant
    Filed: April 14, 2000
    Date of Patent: November 19, 2002
    Assignee: National Science Council
    Inventors: Solomon J. H. Lee, Chih-Kung Lee, Shu-Sheng Lee, Yang Yun-Chang, Lin Chan-Ching, Shuen-Chen Shiue
  • Patent number: 6288841
    Abstract: An optical path overlapping type incident angle changeable optical mechanism according to the invention allows an incident light beam to be incident onto a measured range of a sample within a large incident angle range. The optical mechanism includes a reflecting prism reflecting the incident light beam to generate a reflected light beam having an angle of 90° with respect to the incident light beam; a concave parabolic cylindric mirror guiding the reflected light beam coming from the reflecting prism to a measured range of a detect-waiting sample to thereby be further reflected to generate a detect-waiting light beam; a concave cylindric mirror used to make the detect-waiting light beam incident onto/reflected by the reflecting prism so as to overlap with the incident light beam; and a light beam splitting means used to separate the detect-waiting light beam from the incident light beam.
    Type: Grant
    Filed: December 30, 1999
    Date of Patent: September 11, 2001
    Assignee: National Science Council
    Inventors: Solomon J. H. Lee, Chih-Kung Lee, Tony C. H. Lin, Shih-Jui Chen, Shu-Sheng Lee, Shuen-Chen Shiue