Patents by Inventor Shunichiro Uchimura

Shunichiro Uchimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020048726
    Abstract: A polyimide precursor having repeating units of the formula: 1
    Type: Application
    Filed: September 19, 2001
    Publication date: April 25, 2002
    Applicant: Hitachi Chemical Company, Ltd.
    Inventors: Haruhiko Kikkawa, Fumio Kataoka, Issei Takemoto, Jun Tanaka, Keiko Isoda, Shunichiro Uchimura, Makoto Kaji, Minoru Sugiura
  • Patent number: 6319656
    Abstract: A polyimide precursor having repeating units of the formula: wherein R1 is a tetravalent organic group having 4 or more carbon atoms; R2 is a trivalent or tetravalent organic group having one or more aromatic rings; R3 is a monovalent organic group; A is a monovalent group showing acidity; and n is an integer of 1 or 2, is effective for preparing a highly sensitive negative-working photosensitive material developable with an alkaline aqueous solution in a short time with high resolution.
    Type: Grant
    Filed: December 7, 1999
    Date of Patent: November 20, 2001
    Assignee: Hitachi Chemical Company, Ltd.
    Inventors: Haruhiko Kikkawa, Fumio Kataoka, Issei Takemoto, Jun Tanaka, Keiko Isoda, Shunichiro Uchimura, Makoto Kaji, Minoru Sugiura
  • Patent number: 6025113
    Abstract: A polyimide precursor having repeating units of the formula: ##STR1## wherein R.sup.1 is a tetravalent organic group having 4 or more carbon atoms; R.sup.2 is a trivalent or tetravalent organic group having one or more aromatic rings; R.sup.3 is a monovalent organic group; A is a monovalent group showing acidity; and n is an integer of 1 or 2, is effective for preparing a highly sensitive negative-working photosensitive material developable with an alkaline aqueous solution in a short time with high resolution.
    Type: Grant
    Filed: June 16, 1997
    Date of Patent: February 15, 2000
    Assignee: Hitachi Chemical Company, Ltd.
    Inventors: Haruhiko Kikkawa, Fumio Kataoka, Issei Takemoto, Jun Tanaka, Keiko Isoda, Shunichiro Uchimura, Makoto Kaji, Minoru Sugiura
  • Patent number: 5905117
    Abstract: A low dielectric resin composition comprising the following components (a) and (b), and the dielectric constant of a coating film formed by this composition being at most 3:(a) a resin having functional groups in its molecule and being soluble in a solvent; and(b) a partially hydrolyzed condensate of alkoxysilanes of the formula R.sup.1.sub.m R.sup.2.sub.n Si(OR.sup.3).sub.4-m-n, wherein each of R.sup.1 and R.sup.2 which may be the same or different, is a non-hydrolyzable group, R.sup.3 is an alkyl group, and m and n are integers of from 0 to 3 satisfying 0.ltoreq.m+n.ltoreq.3.
    Type: Grant
    Filed: September 19, 1996
    Date of Patent: May 18, 1999
    Assignees: Asahi Glass Company Ltd., Hitachi Chemical Co., Ltd.
    Inventors: Shunsuke Yokotsuka, Aya Serita, Ko Aosaki, Ikuo Matsukura, Takenori Narita, Hiroyuki Morishima, Shunichiro Uchimura
  • Patent number: 5132386
    Abstract: Insulating resin composition for a semiconductor device having a multilevel interconnection layers formed by the resin and having a superior planarizing capability relative to a lower interconnection layer is provided, which resin being a cured product of a polyamic acid ester oligomer obtained by reacting an aromatic diamine and/or a diaminosiloxane with an aromatic tetracarboxylic acid ester obtained by reacting an aromatic tetracarboxylic acid dianhydride with an alcohol or alcohol derivative.
    Type: Grant
    Filed: May 2, 1989
    Date of Patent: July 21, 1992
    Assignee: Hitachi Chemical Co., Ltd.
    Inventors: Hiroshi Suzuki, Shunichiro Uchimura, Hidetaka Sato
  • Patent number: 4497922
    Abstract: A composition of materials comprising a polyamide acid-silicone intermediate obtained by reacting (a) a diaminoamide compound of the formula: ##STR1## wherein Ar and Y are as defined in the specification, (b) a diaminosiloxane, (c) a diamine, and (d) an aromatic tetracarboxylic acid dianhydride can form a protective film used in a semiconductor device excellent in adhesive properties, heat resistance and preventing soft errors due to .alpha.-rays.
    Type: Grant
    Filed: June 6, 1983
    Date of Patent: February 5, 1985
    Assignee: Hitachi Chemical Company, Ltd.
    Inventors: Hidetaka Sato, Shunichiro Uchimura, Isao Uchigasaki, Daisuke Makino
  • Patent number: 4338426
    Abstract: A polyimide-isoindroquinazolinedione-silicone copolymer resin produced by reacting (a) a diaminoamide, (b) a diaminosiloxane, (c) a diamine, and (d) a tetracarboxylic acid dianhydride to give a polyamide acid-silicone intermediate, which is then subjected to dehydration and ring closure, is excellent particularly in adhesiveness, moisture resistance, wear resistance and heat resistance. The polyamide acid-silicone intermediate is stable in the form of a varnish and usuable commercially as a raw material for the polyimide-isoindroquinazolinedione-silicone copolymer resin.
    Type: Grant
    Filed: August 6, 1981
    Date of Patent: July 6, 1982
    Assignee: Hitachi Chemical Company, Ltd.
    Inventors: Hidetaka Sato, Shunichiro Uchimura, Hiroshi Suzuki, Daisuke Makino