Abstract: A memory cell has the read current from the bit lines isolated from the bistable storage latch in the cell. Internal nodes of the bistable storage latch control isolated gates of MOS read transistors which gate the read current from the bit lines to a local node within the memory cell. The read current is then switched to ground from the local node by a read switch transistor. The read switch transistor is gated by the read row line. The read current is isolated from the read row line because the read row line is only connected to the isolated gate of the read switch transistor. The read current is also isolated from the bistable storage latch since the read transistors are connected at their isolated MOS gates to the bistable's nodes. This isolation of the read current allows additional read ports to be added without disrupting the cell's stability or write performance.

Abstract: A static RAM memory is ideally suited for BiCMOS processes. As in standard CMOS memory cells, the cells have cross-coupled inverters that have more efficient n-channel transistors for the drive transistors, which pull a bit line low during a read operation. The weaker p-channel transistors are used for load transistors in the cross-coupled inverters, adding to cell stability while requiring no power. In contrast to prior-art cells, p-channel pass transistors are used. Common-emitter word-line drivers are also used that require a small input-voltage swing in comparison with the large word-line voltage swing. A low voltage on the word line selects a memory cell by causing p-channel pass transistors to conduct, coupling bit lines to the cross-coupled inverters in the memory cell. Power consumption is reduced since only one selected word line is at a low voltage, while the deselected word lines are at a high voltage.

Abstract: Improved integrated bipolar semiconductor structures and a method of fabricating same are disclosed. The logic circuit structures disclosed have enhanced density and speed power product. The teaching of the disclosed logic circuit structures includes utilization and extension of the known concepts of Current Hogging Injection Logic (CHIL) and Integrated Injection Logic (I.sup.2 L). The disclosed method of fabrication includes a minimum number of process steps, where each step is well within the state of the art and does not contain critical alignment problems.

Abstract: The invention relates to a circuit arrangement for operating the read/write cycles of an integrated semiconductor memory storage system whose storage cells consist of flip flops with bipolar switching transistors, Schottky diodes as read/write elements coupling the cell to the bit lines, and high-resistivity resistors, or transistors controlled as current sources, as load elements, in several phases.This is accomplished through coupling the storage cell to both read/write circuits and restore/recovery circuits via the bit lines and by selective pulsing of the cell with the read/write circuits and the restore/recovery circuits.This permits high speed, low operating current, large scale memory systems to be built.