Patents by Inventor Sigal Ishay

Sigal Ishay has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11847447
    Abstract: Quality indicators regarding a software project under development that has a plurality of functional areas are collected. Each quality indicator is normalized to a coverage of the functional area of the software project to which the quality indicator corresponds. The normalized quality indicators are correlated to previously identified anomalies of the software project, yielding an anomaly indicative value for each normalized quality indicator corresponding to a probability that the normalized quality indicator is revelatory of unidentified anomalies of the software project. A normal behavior for each normalized quality indicator is estimated. For each functional area of the software project, an anomaly score indicative of a likelihood of an unidentified anomaly within the functional area is calculated.
    Type: Grant
    Filed: June 30, 2021
    Date of Patent: December 19, 2023
    Assignee: Micro Focus LLC
    Inventors: Ilan Shufer, Tom Vaingart, Sigal Ishay
  • Publication number: 20230004383
    Abstract: Quality indicators regarding a software project under development that has a plurality of functional areas are collected. Each quality indicator is normalized to a coverage of the functional area of the software project to which the quality indicator corresponds. The normalized quality indicators are correlated to previously identified anomalies of the software project, yielding an anomaly indicative value for each normalized quality indicator corresponding to a probability that the normalized quality indicator is revelatory of unidentified anomalies of the software project. A normal behavior for each normalized quality indicator is estimated. For each functional area of the software project, an anomaly score indicative of a likelihood of an unidentified anomaly within the functional area is calculated.
    Type: Application
    Filed: June 30, 2021
    Publication date: January 5, 2023
    Inventors: Ilan Shufer, Tom Vaingart, Sigal Ishay
  • Patent number: 11256612
    Abstract: Automated test failures that result from automated testing of program code under development are windows to include just the automated test failures occurring for a first time and that are due to automated test code defects or program code defects. The automated test failures that remain after winnowing are clustered into automated test failure clusters that each individually corresponding to a different automated test code defect or a different program code defect. The automated test failure clusters are window to include just the automated test failure clusters that each individually correspond to a different program code defect. The automated test failure clusters that remain after winnowing are output.
    Type: Grant
    Filed: May 1, 2020
    Date of Patent: February 22, 2022
    Assignee: MICRO FOCUS LLC
    Inventors: Sigal Ishay, Ilan Shufer, Sharon Lin
  • Publication number: 20210342258
    Abstract: Automated test failures that result from automated testing of program code under development are windows to include just the automated test failures occurring for a first time and that are due to automated test code defects or program code defects. The automated test failures that remain after winnowing are clustered into automated test failure clusters that each individually corresponding to a different automated test code defect or a different program code defect. The automated test failure clusters are window to include just the automated test failure clusters that each individually correspond to a different program code defect. The automated test failure clusters that remain after winnowing are output.
    Type: Application
    Filed: May 1, 2020
    Publication date: November 4, 2021
    Inventors: Sigal Ishay, Ilan Shufer, Sharon Lin
  • Patent number: 10860464
    Abstract: Examples disclosed herein involve selecting tests for an application commit. In examples herein, a commit of an application code is detected based on a commit identifier in a request, the commit to update the application code, characteristics of the commit are determined from a repository of commit records; and tests for the commit are selected based on the characteristics of the application code to be executed to validate the updated application code.
    Type: Grant
    Filed: March 10, 2017
    Date of Patent: December 8, 2020
    Assignee: MICRO FOCUS LLC
    Inventors: Shaul Strachan, Sigal Ishay
  • Publication number: 20180260312
    Abstract: Examples disclosed herein involve selecting tests for an application commit. In examples herein, a commit of an application code is detected based on a commit identifier in a request, the commit to update the application code, characteristics of the commit are determined from a repository of commit records; and tests for the commit are selected based on the characteristics of the application code to be executed to validate the updated application code.
    Type: Application
    Filed: March 10, 2017
    Publication date: September 13, 2018
    Inventors: Shaul Strachan, Sigal Ishay