Patents by Inventor Simon E. Lappi

Simon E. Lappi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity
    Patent number: 7255835
    Abstract: Apparatus and method for acquiring an infrared spectrum of a sample having or suspected to have an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof. A representative method includes providing a sample; providing an internal reflecting element (IRE) with a functionalized tip; contacting the sample with the IRE to form a sample-IRE interface; directing a beam of infrared (IR) radiation through the IRE under conditions such that the IR radiation interacts with the sample-IRE interface once; recording a reflectance profile over a range of preselected frequencies, whereby an infrared spectrum of the of a sample having or suspected of having an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof, disposed in an aqueous solution is acquired.
    Type: Grant
    Filed: September 4, 2002
    Date of Patent: August 14, 2007
    Assignee: North Carolina State University
    Inventors: Stefan Franzen, Simon E. Lappi
  • Single pass attenuated total reflection fourier transform infrared microscopy apparatus and method for identifying protein secondary structure, surface charge and binding affinity
    Publication number: 20030157725
    Abstract: Apparatus and method for acquiring an infrared spectrum of a sample having or suspected to have an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof. A representative method includes providing a sample; providing an internal reflecting element (IRE) with a functionalized tip; contacting the sample with the IRE to form a sample-IRE interface; directing a beam of infrared (IR) radiation through the IRE under conditions such that the IR radiation interacts with the sample-IRE interface once; recording a reflectance profile over a range of preselected frequencies, whereby an infrared spectrum of the of a sample having or suspected of having an amide I band, an amide II band, an amide III band, an amide A band, an OH stretching region or a combination thereof, disposed in an aqueous solution is acquired.
    Type: Application
    Filed: September 4, 2002
    Publication date: August 21, 2003
    Applicant: North Carolina State University
    Inventors: Stefan Franzen, Simon E. Lappi