Patents by Inventor Sivakumar Manickavasagam

Sivakumar Manickavasagam has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
    Patent number: 6721051
    Abstract: A non-intrusive method of characterizing particles through inverse analysis of experimental data based on measurements using elliptically polarized radiation is provided. A database of theoretical absorption and scattering data sets for particles is compiled. Optimum settings for an experimental test to gather an experimental absorption and scattering data set are determined and the experimental test is conducted. The experimental absorption and scattering data set is then compared to the theoretical absorption and scattering data sets of the database of theoretical absorption and scattering data sets in order to determine an absorption and scattering data set which differs the least from the experimental absorption and scattering data set in order to characterize the particles.
    Type: Grant
    Filed: September 19, 2001
    Date of Patent: April 13, 2004
    Assignee: Synergetic Technologies, Inc.
    Inventors: M. Pinar Mengüç, Sivakumar Manickavasagam
  • Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation
    Publication number: 20020057433
    Abstract: A non-intrusive method of characterizing particles through inverse analysis of experimental data based on measurements using elliptically polarized radiation is provided. A database of theoretical absorption and scattering data sets for particles is compiled. Optimum settings for an experimental test to gather an experimental absorption and scattering data set are determined and the experimental test is conducted. The experimental absorption and scattering data set is then compared to the theoretical absorption and scattering data sets of the database of theoretical absorption and scattering data sets in order to determine an absorption and scattering data set which differs the least from the experimental absorption and scattering data set in order to characterize the particles.
    Type: Application
    Filed: September 19, 2001
    Publication date: May 16, 2002
    Inventors: M. Pinar Menguc, Sivakumar Manickavasagam