Patents by Inventor Siwei Xie

Siwei Xie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for measuring photon information and photon measurement device
    Patent number: 11635531
    Abstract: An apparatus for measuring photon information and a photon measurement device are disclosed.
    Type: Grant
    Filed: August 26, 2019
    Date of Patent: April 25, 2023
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Zhixiang Zhao, Siwei Xie, Jingwu Yang, Rendong Zhang, Zheng Gong, Qiyu Peng
  • Detector and emission tomography device with the detector
    Patent number: 11262463
    Abstract: The present invention provides a detector and an emission tomography device including the detector. The detector comprises: a scintillation crystal array comprising a plurality of scintillation crystals; and a photo sensor array, coupled to an end surface of the scintillation crystal array and comprising multiple photo sensors. At least one of the multiple photo sensors is coupled to a plurality of the scintillation crystals respectively. Surfaces of the plurality of the scintillation crystals not coupled to the photo sensor array are each provided with a light-reflecting layer, and a light-transmitting window is disposed in the light-reflecting layer on a surface among the surfaces adjacent to a scintillation crystal coupled to an adjacent photo sensor. The detector has DOI decoding capability. No mutual interference occurs during DOI decoding, and decoding is more accurate.
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: March 1, 2022
    Assignee: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Siwei Xie, Xi Zhang, Fenghua Weng, Zhixiang Zhao, Yunlong Zan, Qiu Huang
  • APPARATUS FOR MEASURING PHOTON INFORMATION AND PHOTON MEASUREMENT DEVICE
    Publication number: 20210389479
    Abstract: An apparatus for measuring photon information and a photon measurement device are disclosed.
    Type: Application
    Filed: August 26, 2019
    Publication date: December 16, 2021
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Zhixiang Zhao, Siwei Xie, Jingwu Yang, Rendong Zhang, Zheng Gong, Qiyu Peng
  • DETECTOR AND EMISSION TOMOGRAPHY DEVICE WITH THE DETECTOR
    Publication number: 20200158893
    Abstract: The present invention provides a detector and an emission tomography device including the detector. The detector comprises: a scintillation crystal array comprising a plurality of scintillation crystals; and a photo sensor array, coupled to an end surface of the scintillation crystal array and comprising multiple photo sensors. At least one of the multiple photo sensors is coupled to a plurality of the scintillation crystals respectively. Surfaces of the plurality of the scintillation crystals not coupled to the photo sensor array are each provided with a light-reflecting layer, and a light-transmitting window is disposed in the light-reflecting layer on a surface among the surfaces adjacent to a scintillation crystal coupled to an adjacent photo sensor. The detector has DOI decoding capability. No mutual interference occurs during DOI decoding, and decoding is more accurate.
    Type: Application
    Filed: June 4, 2018
    Publication date: May 21, 2020
    Applicant: ZHONGPAI S&T (SHENZHEN) CO., LTD
    Inventors: Siwei Xie, Xi Zhang, Fenghua Weng, Zhixiang Zhao, Yunlong Zan, Qiu Fluang